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Structure and defect characterization of multiferroic <tex>ReMnO$3 films and multilayers by TEM”. Jehanathan N, Lebedev O, Gélard I, Dubourdieu C, Van Tendeloo G, Nanotechnology 21, 075705 (2010). http://doi.org/10.1088/0957-4484/21/7/075705
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