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“Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE”. Seo JW, Perret J, Fompeyrine J, Van Tendeloo G, Loquet J-P s.l., page 300 (1998).
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“Scanning microanalysis”. Gijbels R, Oleshko V s.l., page 427 (1998).
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“Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques”. Oleshko VP, Gijbels RH, Jacob WA, van Daele AJ Antwerp, page 317 (1998).
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“Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R Antwerp, page 528 (1998).
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“Evaluation of polycapillary lenses as focussing elements in sub-mm XRF analysis of artistic objects”. Vekemans B, Janssens K, Adams F, Andong L, He Y, Yiming Y page 278 (1998).
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“Samenstelling van 15de- tot 17de-eeuwse glazen voorwerpen opgegraven in Antwerpen”. de Raedt I, Janssens K, Veeckman J, Adams F page 89 (1998).
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“Chemical composition of suspended matter and sediments from the Indian sub-continent: a fifteen-year research survey”. Dekov VM, Subramanian V, Van Grieken R page 81 (1998).
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“Dispersion of heavy metals”. Van Grieken R page 319 (1998).
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“Inorganic compounds of atmospheric aerosols”. Claes M, Gysels K, Van Grieken R, Harrison RM page 95 (1998).
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“State-of-the-art and research needs for trace metals”. Playford K, Colin JL, Pacyna JM, Pirrone N, Schulz M, Van Grieken R, Wrembel Z page 7 (1998).
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“Structural heterogeneity within airborne particles”. Injuk J, de Bock L, Van Grieken R page 173 (1998).
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“Hybrid magnetic-semiconductor nanostructures”. Peeters FM, de Boeck J Academic Press, New York, page 345 (1999).
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“Modelling of radio frequency capacitively coupled plasma at intermediate pressures”. Berezhnoi S, Kaganovich I, Bogaerts A, Gijbels R Kluwer Academic, Dordrecht, page 525 (1999).
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“Orientational disorder and order in C60-fullerite and in MC60-alkali metal fullerides”. Nikolaev AV, Michel KH, Copley JRD Plenum Press, New York, page 183 (1999).
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“Feasibility of (trace-level) micro-XANES at Beamline L”. Janssens K, Vincze L, Wei F, Proost K, Vekemans B, Vittiglio G, Yan Y, Falkenberg G (1999).
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“Trace-level micro-XANES by means of bending magnets radiation focused with a polycapillary lens”. Vincze L, Janssens K, Wei F, Proost K, Vekemans B, Vittiglio G, Yan Y, Falkenberg G (1999).
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“The use of synchrotron micro-XRF for characterisation of the micro-heterogeneity of low-Z reference materials containing heavy metals”. Kempenaers L, Vincze L, Janssens K (1999).
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“X-ray fluorescence microtomography: experiment and reconstruction”. Simionovici AS, Chukalina M, Drakopoulos M, Snigireva I, Snigirev A, Schroer C, Lengeler B, Janssens K, Adams F page 304 (1999).
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“Atmospheric aerosol and stone conservation”. Van Grieken R, Delalieux F, Cardell Fernandez C page 111 (1999).
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“Current applications of XRF and micro-XRF techniques in environmental and industrial fields”. Van Grieken R, Injuk J page 29 (1999).
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“Risk analysis for the protection of cultural heritage from industrial pollution”. Moropoulou A, Bisbikou K, Torfs K, Van Grieken R page 475 (1999).
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“Single particle analysis techniques”. de Bock LA, Van Grieken RE page 243 (1999).
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“Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate”. Geuens P, Lebedev OI, van Dyck D, Van Tendeloo G s.l., page 1133 (2000).
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“Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties”. Hervieu M, Martin C, Van Tendeloo G, Mercey B, Maignan A, Jirak Z, Raveau B s.l., page 179 (2000).
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“Einleitung zu den massenspektrometrischen Methoden”. Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 159 (2000).
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“Electron microscopy and scanning microanalysis”. Oleshko V, Gijbels R, Amelinckx S Wiley, Chichester, page 9088 (2000).
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“Electron microscopy of fullerenes and related materials”. Van Tendeloo G, Amelinckx S Wiley-VCH, Weinheim, page 353 (2000).
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“Glow discharge mass spectrometry, methods”. Bogaerts A Academic Press, San Diego, Calif., page 669 (2000).
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“Identification of new superconducting compounds by electron microscopy”. Van Tendeloo G, Krekels T Cambridge University Press, Cambridge, page 161 (2000).
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“Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B s.l., page 199 (2000).
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