Number of records found: 980
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Citations
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Structure and phase transitions in C60 and C70 fullerites”. Van Tendeloo G, Muto S, van Heurck C, Amelinckx S, , 476 (1992)
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A temperature study of mixed AgBr-AgBrI tabular crystals”. Goessens C, Schryvers D, van Landuyt J, Geuens I, Gijbels R, Jacob W, de Keyzer R, , 36 (1992)
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Trace element geochemistry of the system rock-thermal water –, suspended matter –, deposits in a granitic environment”. Pentcheva EN, Veldeman E, Van 't dack L, Gijbels R, , 1321 (1992)
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens K, van Langevelde F, Adams F, Vis R, Sutton S, Rivers M, Jones K, Bowen D, (1992)
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Spectrum evaluation”. van Espen P, Janssens K (1992).
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Automated EPXMA of individual environmental particles”. Van Grieken R, Artaxo P, Xhoffer C, (1992)
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Characterization of individual environmental particles by beam techniques”. Xhoffer C, Wouters L, Artaxo P, van Put A, Van Grieken R page 107 (1992).
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Electron energy-loss spectroscopy and its application to individual particle analysis”. Xhoffer C, Jacob W, Van Grieken R, Broekaert JAC, Buseck P, (1992)
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Fluxes and sources of heavy metal inputs into the Southern Bight of the North Sea”. Van Grieken R, Injuk J, Otten P, Rojas C, van Malderen H, Laane R page 184 (1992).
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Individual particle analysis of sediments from the Gulf of Lions, suspensions from the Rhône river and dust of Saharan origin: preliminary results”. Wegrzynek D, Eisma D, Van Grieken R, (1992)
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Modern micro-analytical techniques for the elucidation of causes and mechanisms of material deterioration”. Van Grieken R, Dewolfs R, (1992)
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Prediction of Mα/L&alpha, intensity ratios and the use in the spectra evaluation”. Trincavelli J, Montoro S, Van Grieken R, van Espen P, (1992)
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Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AM, Van Grieken RE page 339 (1992).
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Sample preparation for XRF”. Injuk J, Van Grieken RE page 657 (1992).
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Weathering of bare and treated limestones under ambient conditions using runoff water analysis and microanalysis”. Vleugels G, Van Grieken R, (1992)
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The chemical characterization of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, , 251 (1993)
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Electron microscopy of C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S Springer, Berlin, page 182 (1993).
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Fundamental aspects of an analytical glow discharge”. van Straaten M, Gijbels R Royal Society of Chemistry, Cambridge, page 130 (1993).
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Introduction”. Vertes A, Gijbels R, Adams F Wiley, New York, page 1 (1993).
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Vertes A, Gijbels R, Adams F (1993) Laser ionization mass analysis. Wiley, New York
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Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis”. Struyf H, van Roy W, van Vaeck L, Gijbels R, Caravatti P San Francisco Press, San Francisco, Calif., page 595 (1993).
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Lasers in mass spectrometry: organic and inorganic instrumentation”. van Vaeck L, van Roy W, Gijbels R, Adams F Wiley, New York, page 7 (1993).
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Magneto-optics of shallow impurities in superlattices”. Peeters FM, Shi JM, Devreese JT Kluwer, Dordrecht, page 221 (1993).
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Magneto-polaron effect on shallow donors in 3D en Q2S systems”. Devreese JT, Shi JM, Peeters FM Kluwer, Dordrecht, page 173 (1993).
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Methods of structural analysis of modulated structures and quasicrystals”. van Landuyt J, Kuypers S, van Heurck C, Van Tendeloo G, Amelinckx S s.l., page 205 (1993).
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Methods using low and medium laser irradiance: laser-induced thermal desorption and matrix-assisted methods”. Vertes A, Gijbels R Wiley, New York, page 127 (1993).
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Polaron cyclotron resonance spectrum with interface optical phonon modes in GaAs/AlAs quantum wells”. Hai GQ, Peeters FM, Devreese JT Kluwer, Dordrecht, page 243 (1993).
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Structural characterization of organic molecules by laser mass spectrometry”. van Vaeck L, van Roy W, Gijbels R, Adams F Wiley, New York, page 177 (1993).
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Adams F, Gijbels R, Van Grieken R, Dachang Z (1993) Inorganic mass spectrometry. Fudan University Press, Shanghai, 391 p
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Environmental aerosol characterization by single particle analysis techniques”. Xhoffer C, Van Grieken R page 207 (1993).
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