Number of records found: 8874
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Citations
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Characterisation of wood combustion particles using electron probe microanalysis”. Osán J, Alföldy B, Török S, Van Grieken R, Atmospheric environment : an international journal 36, 2207 (2002). http://doi.org/10.1016/S1352-2310(02)00153-X
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Damage functions and mechanism equations derived from limestone weathering in field exposure”. Delalieux F, Cardell-Fernandez C, Torfs K, Vleugels G, Van Grieken RE, Water, air and soil pollution 139, 75 (2002). http://doi.org/10.1023/A:1015827031669
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Einfluss verschiedener Silbersalze auf die Farbintensität von Silbergelb : analytische Untersuchungen”. De Vis K, Jembrih-Simbürger D, Schalm O, Schreiner M, Caen J, Zeitschrift für Kunsttechnologie und Konservierung 16, 147 (2002)
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Van Grieken RE, Markowicz AA (2002) Handbook of X-ray spectrometry. 1016 p
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Material analysis methods applied to the study of ancient monuments, works of art and artefacts”. Delalieux F, Tsuji K, Wagatsuma K, Van Grieken R, Materials transactions 43, 2197 (2002). http://doi.org/10.2320/MATERTRANS.43.2197
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Microstructural criteria for the evaluation of stone susceptibility to sea-salt decay”. Moropoulou A, Koui M, Theoulakis P, Bakolas A, Roumpopoulos K, Michailidis P, Van Grieken R, Cardell-Fernandez C, (2002)
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Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
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The processes dominating Ca dissolution of limestone when exposed to ambient atmospheric conditions as determined by comparing dissolution models”. Cardell Fernandez C, Cardell-Fernandez C, Vleugels G, Torfs K, Van Grieken R, Environmental geology 43, 160 (2002). http://doi.org/10.1007/S00254-002-0640-X
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Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AA, Van Grieken RE page 407 (2002).
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Sample preparation for X-ray fluorescence”. Schmeling M, Van Grieken RE page 933 (2002).
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Sedimentation rate of the floodplain sediments of the Yamuna river basin (tributary of the river Ganges, India) by using <tex>210Pb</tex>, and <tex>137Cs</tex>, techniques”. Saxena DP, Joos P, Van Grieken R, Subramanian V, Journal of radioanalytical and nuclear chemistry 251, 399 (2002). http://doi.org/10.1023/A:1014821906600
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Single-particle characterization of urban aerosol particles collected in three Korean cities using low-Z electron probe x-ray microanalysis”. Ro C-U, Kim H, Oh K-Y, Yea SK, Lee CB, Jang M, Van Grieken R, Environmental science and technology 36, 4770 (2002). http://doi.org/10.1021/ES025697Y
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Sub-minute determination of BTEX in environmental samples using low pressure GC-ITMS”. Joos PE, Godoi AFL, de Jong R, de Zeeuw J, Van Grieken R, (2002)
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Substrates with a periodic surface structure in grazing-exit X-ray microanalysis”. Bekshaev A, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 57, 865 (2002). http://doi.org/10.1016/S0584-8547(02)00019-8
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X-ray analysis of riverbank sediment of the Tisza (Hungary): identification of particles from a mine pollution event”. Osán J, Kurunczi S, Török S, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 57, 413 (2002). http://doi.org/10.1016/S0584-8547(01)00405-0
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X-ray spectrometry”. Szalóki I, Török SB, Injuk J, Van Grieken RE, Analytical chemistry 74, 2895 (2002). http://doi.org/10.1021/AC020241K
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1D fluid model for an rf methane plasma of interest in deposition of diamond-like carbon layers”. Herrebout D, Bogaerts A, Yan M, Goedheer W, Dekempeneer E, Gijbels R, Journal of applied physics 90, 570 (2001). http://doi.org/10.1063/1.1378059
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Atomic scale characterization of supported and assembled nanoparticles”. Pauwels B, Yandouzi M, Schryvers D, Van Tendeloo G, Verschoren G, Lievens P, Hou M, van Swygenhoven H, , B8.3 (2001)
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Atomic scale modeling of supported and assembled nanoparticles”. Zhurkin E, Hou M, van Swygenhoven H, Pauwels B, Yandouzi M, Schryvers D, Van Tendeloo G, Lievens P, Verschoren G, Kuriplach J, van Peteghem S, Segers D, Dauwe C, , B8.2 (2001)
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Au particles supported on (110) anatase-TiO2”. Giorgio S, Henry CR, Pauwels B, Van Tendeloo G, Microstructure And Processing 297, 197 (2001). http://doi.org/10.1016/S0921-5093(00)01261-2
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Bending martensite needles in Ni65Al35 investigated by two-dimensional elasticity and high-resolution transmission electron microscopy”. Boullay P, Schryvers D, Kohn RV, Physical review : B : condensed matter and materials physics 64, 144105 (2001). http://doi.org/10.1103/PhysRevB.64.144105
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Bright to dark exciton transition in symmetric coupled quantum wells”. Chang K, Peeters FM, Physical review : B : condensed matter and materials physics 63 (2001). http://doi.org/10.1103/PhysRevB.63.153307
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Catalyst traces after chemical purification in CVD grown carbon nanotubes”. Biró, LP, Khanh NQ, Horváth ZE, Vértesy Z, Kocsonya A, Konya Z, Osváth Z, Koós A, Guylai J, Zhang XB, Van Tendeloo G, Fonseca A, Nagy JB, , 183 (2001)
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Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation”. Stuer C, Steegen A, van Landuyt J, Bender H, Maex K, Institute of physics conference series , 481 (2001)
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Characterization of single-wall carbon nanotubes produced by CCVD method”. Colomer J-F, Benoit J-M, Stephan C, Lefrant S, Van Tendeloo G, Nagy JB, Chemical physics letters 345, 11 (2001). http://doi.org/10.1016/S0009-2614(01)00841-7
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Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy”. Hens S, van Landuyt J, Bender H, Boullart W, Vanhaelemeersch S, Materials science in semiconductor processing 4, 109 (2001). http://doi.org/10.1016/S1369-8001(00)00147-5
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Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM”. de Gryse O, Clauws P, Lebedev O, van Landuyt J, Vanhellemont J, Claeys C, Simoen E, Physica: B : condensed matter T2 –, 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308, 294 (2001). http://doi.org/10.1016/S0921-4526(01)00801-8
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Comparison of modeling calculations with experimental results for direct current glow discharge optical emission spectrometry”. Bogaerts A, Wilken L, Hoffmann V, Gijbels R, Wetzig K, Spectrochimica acta: part B : atomic spectroscopy 56, 551 (2001). http://doi.org/10.1016/S0584-8547(01)00220-8
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Confined states in two-dimensional flat elliptic quantum dots and elliptic quantum wires”. van den Broek M, Peeters FM, Physica. E: Low-dimensional systems and nanostructures 11, 345 (2001). http://doi.org/10.1016/S1386-9477(01)00169-2
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Correlation between a remote electron and a two-dimensional electron gas in resonant tunneling devices”. Kato H, Peeters FM, , 843 (2001)
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