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Recent developments of laboratory grazing emission X-ray fluorescence spectrometry”. Claes M, de Bokx P, Van Grieken R, , 103 (1999)
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Risk analysis for the protection of cultural heritage from industrial pollution”. Moropoulou A, Bisbikou K, Torfs K, Van Grieken R page 475 (1999).
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Single particle analysis of suspended matter in the Makasar Strait and Flores Sea with particular reference to tin-bearing particles”. Dekov VM, van Put A, Eisma D, Van Grieken R, Journal of sea research 41, 35 (1999). http://doi.org/10.1016/S1385-1101(98)00035-5
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Single particle analysis techniques”. de Bock LA, Van Grieken RE page 243 (1999).
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Single particle characterisation of inorganic and organic North Sea suspension”. Jambers W, Dekov V, Van Grieken R, Marine chemistry 67, 17 (1999). http://doi.org/10.1016/S0304-4203(99)00046-8
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Some new applications of auxiliary signals in X-ray fluorescence and electron microprobe analysis”. Kuczumow A, Vekemans B, Schalm O, Vincze L, Dorriné, W, Gysels K, Van Grieken R, , 197 (1999)
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Trend analysis of the published concentrations of heavy metals in aerosols above the North Sea and the English Channel for the period 1971-1994”. Hoornaert S, Treiger B, Van Grieken R, Laane R, Environmental reviews 7, 191 (1999)
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Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate”. Geuens P, Lebedev OI, van Dyck D, Van Tendeloo G s.l., page 1133 (2000).
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Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties”. Hervieu M, Martin C, Van Tendeloo G, Mercey B, Maignan A, Jirak Z, Raveau B s.l., page 179 (2000).
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Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, , 213 (2000)
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Einleitung zu den massenspektrometrischen Methoden”. Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 159 (2000).
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Electron microscopy and scanning microanalysis”. Oleshko V, Gijbels R, Amelinckx S Wiley, Chichester, page 9088 (2000).
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Electron microscopy of fullerenes and related materials”. Van Tendeloo G, Amelinckx S Wiley-VCH, Weinheim, page 353 (2000).
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Evolution of impurity clusters and photographic sensitivity”. Oleshko VP, Gijbels RH, Bilous VM, Jacob WA, Alfimov MV, Zhurnal nauchnoj prikladnoj fotografii i kinematografii 45, 1 (2000)
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An extended RF methane plasma 1D fluid model of interest in deposition of diamond-like carbon layers”. Herrebout D, Bogaerts A, Yan M, Goedheer W, Dekempeneer E, Gijbels R, , 399 (2000)
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Glow discharge mass spectrometry, methods”. Bogaerts A Academic Press, San Diego, Calif., page 669 (2000).
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Gold particles supported on TiO2”. Giorgio S, Henry CR, Pauwels B, Van Tendeloo G, , 369 (2000)
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Granular films assembled of CoN, CrM and mixtures of CoN and CrM clusters: structure and electron transport properties”. Kuhn LT, Vanhoutte F, Cannaerts M, Neukermans S, Verschoren G, Bouwen W, van Haesendonck C, Lievens P, Silverans RE, Pauwels B, Van Tendeloo G, (2000)
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Identification of new superconducting compounds by electron microscopy”. Van Tendeloo G, Krekels T Cambridge University Press, Cambridge, page 161 (2000).
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Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B s.l., page 199 (2000).
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Martensitic transformations studied on nano- and microscopic length scales”. Schryvers D, Boullay P, Potapov P, Satto C, Festkörperprobleme 40, 375 (2000)
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Modeling of radio-frequency and direct current glow discharges in argon”. Bogaerts A, Gijbels R, Journal of technical physics 41, 183 (2000)
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Multielementmassenspektrometrie (MMS)”. Jochum KP, Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 188 (2000).
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Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM”. Lebedev OI, Van Tendeloo G, Amelinckx S s.l., page 201 (2000).
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Structural changes in fluorinated T{'} and T* phases”. Hadermann J, Abakumov AM, Lebedev OI, Antipov EV, Van Tendeloo G, , 193 (2000)
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Structural properties of Au clusters on MgO”. Pauwels B, Van Tendeloo G, Bouwen W, Kuhn LT, Lievens P, , 383 (2000)
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Study of oxynitrides with dual beam TOF-SIMS”. de Witte H, Conard T, Vandervorst W, Gijbels R, , 611 (2000)
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TEM of phase transitions in tridymite and cristobalite based materials”. Van Tendeloo G, Microscoy and microanalysis 6 (2000)
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TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates”. Lenaerts J, Verlinden G, van Vaeck L, Gijbels R, Geuens I, , 115 (2000)
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XPS study of ion induced oxidation of silicon with and without oxygen flooding”. de Witte H, Conard T, Sporken R, Gouttebaron R, Magnee R, Vandervorst W, Caudano R, Gijbels R, , 73 (2000)
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