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Author
Title
Year
Publication
Volume
Times cited
Additional Links
Verlinden, G.
;
Gijbels, R.
;
Geuens, I.
Photographic materials
2001
UA library record
Verlinden, G.
;
Gijbels, R.
;
Geuens, I.
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS
2002
Microscopy and microanalysis
8
1
UA library record
;
WoS full record
;
WoS citing articles
Lenaerts, J.
;
Gijbels, R.
;
van Vaeck, L.
;
Verlinden, G.
;
Geuens, I.
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals
2003
Applied surface science
203/204
7
UA library record
;
WoS full record
;
WoS citing articles
