|
|
“From VO2(B) to VO2(R): theoretical structures of VO2 polymorphs and in situ electron microscopy”. Leroux C, Nihoul G, Van Tendeloo G, Physical review : B : condensed matter and materials physics 57, 5111 (1998). http://doi.org/10.1103/PhysRevB.57.5111
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 122
DOI: 10.1103/PhysRevB.57.5111
|
|
|
|
“Hetero-epitaxial growth of CoSi2 thin films on Si(100) : template effects and epitaxial orientations”. Buschmann V, Rodewald M, Fuess H, Van Tendeloo G, Schaffer C, Journal of crystal growth 191, 430 (1998). http://doi.org/10.1016/S0022-0248(98)00167-5
Abstract: This HREM investigation focuses on the influence of point defects on the final epitaxial relation and atomic interface configuration in a CoSi2/Si(1 0 0) heterostructure. A two-step SPE-MBE grown CoSi2/Si(1 0 0) system is used and, by altering the number of deposited Co monolayers in the template layer, the point defect behavior is studied. We propose a film growth model in which the knowledge about the reconstructed (2 x 1) : Si(1 0 0) surface, the point defect behavior in the presence of an interface, especially a silicide interface, the migration of point defects through a lattice by formation of [1 0 0]-split interstitial (dumbbell) atomic configurations, and a new type of extended defect configurations in diamond type materials will all amalgamate. (C) 1998 Published by Elsevier Science B.V. All rights reserved.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.751
Times cited: 6
DOI: 10.1016/S0022-0248(98)00167-5
|
|
|
|
“High resolution electron microscopy and X-ray photoelectron spectroscopy studies of heteroepitaxial SixGe1-x alloys produced through laser induced processing”. Frangis N, van Landuyt J, Lartiprete R, Martelli S, Borsella E, Chiussi S, Castro J, Leon B, Applied physics letters 72, 2877 (1998). http://doi.org/10.1063/1.121487
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.411
Times cited: 16
DOI: 10.1063/1.121487
|
|
|
|
“High resolution electron microscopy in materials research”. Van Tendeloo G, Journal of materials chemistry 8, 797 (1998). http://doi.org/10.1039/a708240a
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 8
DOI: 10.1039/a708240a
|
|
|
|
“High resolution transmission electron microscopy study of nanoscale Ni-rich Ni-Al films evaporated onto NaCl and KCl”. Yandouzi M, Toth L, Schryvers D, Nanostructured materials 10, 99 (1998). http://doi.org/10.1016/S0965-9773(98)00025-7
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 2
DOI: 10.1016/S0965-9773(98)00025-7
|
|
|
|
“HREM for characterisation of nanoscale microstructures”. van Landuyt J, Van Tendeloo G, , 15 (1998)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“HREM investigation of La(1-x)Ca(x)MnO3-delta thin films”. Lebedev O, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier HU, , 517 (1998)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“HREM investigation of La1-xCaxMnO3- thin films”. Lebedev OI, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier H-U, Electron microscopy: vol. 2 , 517 (1998)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
|
|
|
|
“HREM of defects in cubic boron nitride single crystals”. Nistor LC, van Landuyt J, Dincã, G, , 695 (1998)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Laser thermotreatment of the SnO2layers”. Rembeza SI, Loginov VA, Svistova TV, Podkopaeva OI, Rembeza ES, van Landuyt J, Eurosensors XII, vols 1 and 2 , 481 (1998)
Abstract: The optical and electrical properties and pi ase composition of magnetron sputtered antimony-doped SnOx thin films are investigated before and after laser thermotreatment The temperature dependencies on mobility and concentration of free charges are measured by Van der Pauw method. The gas sensitivity of SnOx has been measured before and after laser thermotreatment.
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Layered structures accomodating stoichiometry in M2X2O7 systems, as seen by diffraction and HREM”. Nihoul G, Leroux C, Cesari C, Van Tendeloo G, Electron microscopy: vol. 2 , 295 (1998)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
|
|
|
|
“Microstructural investigation of a La1.9Sr0.1CuO4 thin film grown by MBE under a large compressive strain”. Seo JW, Perret J, Fompeyrine J, Loquet J-P, Van Tendeloo G, Electron microscopy: vol. 2 , 287 (1998)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
|
|
|
|
“Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE”. Seo JW, Perret J, Fompeyrine J, Van Tendeloo G, Loquet J-P s.l., page 300 (1998).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
|
|
|
|
“Microstructure of artificial [100] 45 degrees twist grain boundaries in YBa2Cu3O7-delta”. Verbist K, Tafuri F, Granozio FM, Di Chiara S, Van Tendeloo G, Electron Microscopy 1998, Vol 2: Materials Science 1 , 593 (1998)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Microstructure of artificial [100] 45°, twist grain boundaries in YBa2Cu3O7-”. Verbist K, Tafuri F, Miletto Granozio F, di Chiara S, Van Tendeloo G, Electron microscopy: vol. 2 , 593 (1998)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
|
|
|
|
“Microstructure of YBa2Cu3O7-\delta Josephson junctions in relation to their properties”. Verbist K, Lebedev OI, Verhoeven MAJ, Winchern R, Rijnders AJHM, Blank DHA, Tafuri F, Bender H, Van Tendeloo G, Superconductor science and technology 11, 13 (1998). http://doi.org/10.1088/0953-2048/11/1/004
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.878
DOI: 10.1088/0953-2048/11/1/004
|
|
|
|
“Modulated structures in KAISi3O8: a study by high resolution electron microscopy and 29Si MAS-NMR spectroscopy”. Sanchez-Munoz L, Nistor L, Van Tendeloo G, Sanz J, Journal of electron microscopy 47, 17 (1998). http://doi.org/10.1093/oxfordjournals.jmicro.a023555
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.9
Times cited: 10
DOI: 10.1093/oxfordjournals.jmicro.a023555
|
|
|
|
“'Natural' and 'man-made' platelets in type-la diamonds”. Kiflawi I, Bruley J, Luyten W, Van Tendeloo G, Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 78, 299 (1998). http://doi.org/10.1080/13642819808205733
Abstract: 'Natural' platelets are planar defects in {001} planes found in natural type-IaA/B diamonds. 'Man-made' platelets are platelets formed in the laboratory by annealing type-IaA diamonds at temperatures over 2500 degrees C. Careful study shows that the infrared (IR) spectra of the 'man-made' platelets are different from the IR spectra of 'natural' platelets. High-temperature (T greater than or equal to 2000 degrees C) annealing of platelets containing type-IaA/B diamonds modifies the IR absorption spectrum owing to the 'natural' platelets and makes it similar to the IR spectrum of the 'man-made' platelets. It is suggested that such high-temperature annealing changes the structure of the 'natural' platelets. The changes are too subtle to be detected by electron microscopy techniques. Topographic electron-energy-loss spectroscopy shows that platelets contain nitrogen at an average density of 0.7 atoms per a(0)(2); however, high-temperature annealing does not seem to affect the concentration of the nitrogen in the platelets.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 13
DOI: 10.1080/13642819808205733
|
|
|
|
“Natural titanite and malayite: structural investigations and the 500K anomaly”. Meyer HW, Bismayer U, Adiwidjaja G, Zhang M, Nistor L, Van Tendeloo G, Phase transitions 67, 27 (1998). http://doi.org/10.1080/01411599808219187
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.06
Times cited: 9
DOI: 10.1080/01411599808219187
|
|
|
|
“Needle twins and right-angled twins in minerals: comparison between experiment and theory”. Salje EKH, Buckley A, Van Tendeloo G, Ishibashi Y, Nord GL, The American mineralogist 83, 811 (1998)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.021
Times cited: 43
|
|
|
|
“A new model for the (2x1) reconstructed CoSi2-Si(100) interface”. Buschmann V, Fedina L, Rodewald M, Van Tendeloo G, Philosophical magazine letters 77, 147 (1998). http://doi.org/10.1080/095008398178589
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.941
Times cited: 10
DOI: 10.1080/095008398178589
|
|
|
|
“On the mechanism of {111}-defect formation in silicon studies by in situ electrin irradiation in a high resolution electron microscope”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 77, 423 (1998)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 23
|
|
|
|
“The origin of diffuse intensity in electron diffraction patterns”. Van Tendeloo G, Amelinckx S, Phase transitions 67, 101 (1998). http://doi.org/10.1080/01411599808219190
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.06
Times cited: 17
DOI: 10.1080/01411599808219190
|
|
|
|
“Phase boundaries of superconducting mesoscopic square loops”. Fomin VM, Misko VR, Devreese JT, Moshchalkov VV, 249/251, 476 (1998)
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
|
|
|
|
“Precipitation behavior in Cu-Co alloy”. Takeda M, Shinohara G, Yamada H, Yoshida S, van Landuyt J, Hashimoto H, , 205 (1998)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Preparation and characterization of melt textured NdBa2Cu3O7- bulk superconducting ceramics”. Tancret F, Monot I, Laffez P, Van Tendeloo G, Desgardin G, European physical journal: applied physics 1, 185 (1998). http://doi.org/10.1051/epjap:1998135
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.684
Times cited: 2
DOI: 10.1051/epjap:1998135
|
|
|
|
“Preparation of nanocrystalline titania powder by aerosol pyrolysis of titanium alkoxide”. Ahonen PP, Kauppinen EI, Deschanvres JL, Joubert JC, Van Tendeloo G, Materials Research Society symposium proceedings 520, 109 (1998)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
Times cited: 2
|
|
|
|
“Purification of catalytically produced multi-wall nanotubes”. Colomer J-F, Piedigrosso P, Willems I, Journet C, Bernier P, Van Tendeloo G, Fonseca A, Nagy JB, Journal of the Chemical Society : Faraday transactions: physical chemistry and chemical physics 94, 3753 (1998). http://doi.org/10.1039/a806804f
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 92
DOI: 10.1039/a806804f
|
|
|
|
“Recrystallization and grain growth in a B2 iron aluminide alloy”. Samajdar I, Ratchev P, Verlinden B, Schryvers D, Intermetallics 6, 419 (1998). http://doi.org/10.1016/S0966-9795(97)00092-7
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.14
Times cited: 17
DOI: 10.1016/S0966-9795(97)00092-7
|
|
|
|
“Reduced dimensionality in different forms of carbon”. Van Tendeloo G, Bernaerts D, Amelinckx S, Fullerenes and carbon based materials , 487 (1998)
Abstract: Several TEM techniques are used to characterise the local structure of low dimensional forms of carbon. HREM is particularly useful to describe the defect structure of thin films of diamond or fullerenes and C-60-C-70 nanoclusters. A columnar form of graphite is analysed, mainly by electron diffraction which allowed us to propose a growth mechanism. Diffraction contrast dark field microscopy, in combination with electron diffraction, allows a detailed characterisation of carbon nanotubes; e.g. the chirality distribution of tubes in ropes of single wall tubes is studied by selected area electron diffraction. (C) 1998 Elsevier Science Ltd. All rights reserved.
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
|
|
