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“TEM of ultra-thin DyBa2Cu3O7-x films deposited on TiO2 terminated SrTiO3”. Bals S, Rijnders G, Blank DHA, Van Tendeloo G, Physica: C : superconductivity 355, 225 (2001). http://doi.org/10.1016/S0921-4534(01)00034-X
Abstract: Using pulsed laser deposition ultra-thin DyBa2Cu3O7-x films were deposited on a single terminated (0 0 1) SrTiOr(3) substrate. The initial growth was studied by high-resolution electron microscopy. Two different types of interface arrangements occur and were determined as: bulk-SrO-TiO2-BaO-CuO-BaO-CuO2-Dy-CuO2-BaO bulk and bulk-SrO-TiO2-BaO-CuO2-Dy-CuO2-BaO-CuO-BaO-bulk This variable growth sequence causes structural shifts, resulting in antiphase boundaries with displacement vector R = [0 0 1/3]. as well as local chemical variations. (C) 2001 Elsevier Science B.V. All rights reserved.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.404
Times cited: 26
DOI: 10.1016/S0921-4534(01)00034-X
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“A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals”. van Renterghem W, Schryvers D, van Landuyt J, Bollen D, van Roost C, de Keyzer R, The journal of imaging science and technology 45, 83 (2001)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.348
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“The fine structure of YCuO2+x delafossite determined by synchrotron powder diffraction and electron microscopy”. Van Tendeloo G, Garlea O, Darie C, Bougerol-Chaillout C, Bordet P, Journal of solid state chemistry 156, 428 (2001). http://doi.org/10.1006/jssc.2000.9018
Abstract: YCuO2 delafossite crystallizes into two stacking variants; hexagonal 2H or rhombohedral 3R, depending on the preparation conditions. The structure of the fully oxygenated material YCuO2.50 has been determined as orthorhombic (a(O) = 6.1961 Angstrom; b(O) = 11.2158 Angstrom; c(O) = 7.1505 Angstrom; space group Pnma). The structure is based on the hexagonal 2H structure (a(O) = a(H)root3; b(O) = c(H); c(O) = 2a(H)). Upon incomplete oxidation, a different YCuOZ phase with ideal composition YCuO2.33 and lattice parameters a(H root)3, a(H)root3, c(H) is also formed. Diffraction patterns are often very complex because of the presence of planar defects and intergrowth of both phases. Under electron beam irradiation, oxygen is released from the structure and one phase gradually transforms into the other. (C) 2001 Academic Press.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.299
Times cited: 33
DOI: 10.1006/jssc.2000.9018
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“The influence of the h-BN morphology and structure on the c-BN growth”. Nistor L, Teodorescu V, Ghica C, van Landuyt J, Dinca G, Georgeoni P, Diamond and related materials
T2 –, 11th European Conference on Diamond, Diamond-like Materials, Carbon, Nanotubes, Nitrides and Silicon Carbide (Diamond 2000), SEP 03-08, 2000, OPORTO, PORTUGAL 10, 1352 (2001). http://doi.org/10.1016/S0925-9635(00)00377-0
Abstract: The morphology and structure of hexagonal graphitic BN (h-BN) powders with graphitization indices GI <5, used as precursors for the synthesis of cubic BN (c-BN) crystals, has been investigated by transmission electron microscopy in diffraction contrast and high resolution. We show that besides the GI, which is a general parameter for controlling the structural quality of h-EN ponders, some other microstructural features strongly influence the synthesis of c-BN. In our opinion, the high reactivity of some h-BN powders results from the presence of some nucleation centers for c-BN, observed at the edges of the h-BN particles. They are formed by a rearrangement of the graphitic (0002) planes by bending back, joining in pairs and forming locally nanoarches (half nanotubes). In these particular places, the nature of bonding locally turns towards sp(3), as in the case of c-BN, (C) 2001 Elsevier Science B.V. All rights reserved.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.561
Times cited: 17
DOI: 10.1016/S0925-9635(00)00377-0
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“The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures”. Stuer C, van Landuyt J, Bender H, Rooyackers R, Badenes G, Materials science in semiconductor processing 4, 117 (2001). http://doi.org/10.1016/S1369-8001(00)00110-4
Abstract: Shallow trench isolation (STI) is a promising technology for the isolation structures of the new generation of ULSI devices with dimensions below 0.18 mum. The various processing steps cause stress fields in STI structures, which can lead to defect formation in the silicon substrate. In their turn, stress fields affect the electrical parameters and the reliability of devices. Convergent beam electron diffraction (CBED) is used in this study to examine the influence of a wet and a dry pre-gate oxidation on the stress distribution around STI structures. The measurements are performed on STI structures with different width and spacing. CBED analysis is compared with bright-field TEM images. Defects are observed in high-strain areas of small isolated structures. (C) 2001 Elsevier Science Ltd. All rights reserved.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 2.359
Times cited: 6
DOI: 10.1016/S1369-8001(00)00110-4
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“Transmission electron microscopy and Monte Carlo simulations of ordering in Au-Cu clusters produced in a laser vaporization source”. Pauwels B, Van Tendeloo G, Zhurkin E, Hou M, Verschoren G, Kuhn LT, Bouwen W, Lievens P, Physical review : B : condensed matter and materials physics 63, 165406 (2001). http://doi.org/10.1103/PhysRevB.63.165406
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 64
DOI: 10.1103/PhysRevB.63.165406
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“Transmission electron microscopy investigation of Bi-2223/Ag tapes”. Gottschalck Andersen L, Bals S, Van Tendeloo G, Poulsen HF, Liu YL, Physica: C : superconductivity 353, 251 (2001). http://doi.org/10.1016/S0921-4534(00)01755-X
Abstract: The microstructure of (Bi,Pb)2Sr2Ca2Cu3Ox (Bi-2223) tapes has been investigated by means of transmission electron microscopy (TEM) and high-resolution TEM. The emphasis has been placed on: (1) an examination of the grain morphology and size, (2) grain and colony boundary angles, which are formed during the tape processing, (3) a study of the grain boundaries on an atomic scale, including intergrowth investigations. Tapes with different process parameters have been compared with respect to the microstructure. A fully processed tape has on the average 50% thicker Bi-2223 grains than a tape after the first annealing. The angles of c-axis tilt grain boundaries are on average 14° and 26° for the fully processed tape and the tape after the first annealing, respectively. The intergrowth content (15%) and distribution are similar in these two tapes.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.404
Times cited: 13
DOI: 10.1016/S0921-4534(00)01755-X
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“Transport of magnetic edge states in a quantum wire exposed to a non-homogeneous magnetic field”. Badalyan SM, Peeters FM, Nanotechnology 12, 570 (2001). http://doi.org/10.1088/0957-4484/12/4/340
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 3.44
Times cited: 5
DOI: 10.1088/0957-4484/12/4/340
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“Trions in quantum wells”. Peeters FM, Riva C, Varga K, Physica: B : condensed matter 300, 139 (2001). http://doi.org/10.1016/S0921-4526(01)00577-4
Abstract: An overview is given of our investigation of the energy levels and of the correlation functions of the negatively and positively charged excitons (also called trions) in quantum wells in the presence of a perpendicular magnetic field, A detailed comparison is made with available experimental data in III-V and II-VI semiconductor quantum wells. (C) 2001 Elsevier Science B.V. All rights reserved.
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 1.386
Times cited: 31
DOI: 10.1016/S0921-4526(01)00577-4
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“Tunneling through a combined magnetic-potential barrier”. Papp G, Peeters FM, Physica status solidi: B: basic research 225, 433 (2001)
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 1.674
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“Two vertically coupled quantum dots in a magnetic field”. Partoens B, Peeters FM, Physica: B : condensed matter 298, 282 (2001). http://doi.org/10.1016/S0921-4526(01)00319-2
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 1.386
Times cited: 8
DOI: 10.1016/S0921-4526(01)00319-2
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“Vortex charge in mesoscopic superconductors”. Yampolskii SV, Baelus BJ, Peeters FM, Kolá·ek J, Physical review : B : condensed matter and materials physics 64, 144511 (2001). http://doi.org/10.1103/PhysRevB.64.144511
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 3.836
Times cited: 14
DOI: 10.1103/PhysRevB.64.144511
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“Why are sputter deposited Nd1+xBa2-xCu3O7-\delta thin films flatter than NdBa2Cu3O7-\delta films?”.Bals S, Van Tendeloo G, Salluzzo M, Maggio-Aprile I, Applied physics letters 79, 3660 (2001). http://doi.org/10.1063/1.1421622
Abstract: High-resolution electron microscopy and scanning tunneling microscopy have been used to compare the microstructure of NdBa2Cu3O7-delta and Nd1+xBa2-xCu3O7-delta thin films. Both films contain comparable amounts of Nd2CuO4 inclusions. Antiphase boundaries are induced by unit cell high steps at the substrate or by a different interface stacking. In Nd1+xBa2-xCu3O7-delta the antiphase boundaries tend to annihilate by the insertion of extra Nd layers. Stacking faults, which can be characterized as local Nd2Ba2Cu4O9 inclusions, also absorb the excess Nd. A correlation is made between the excess Nd and the absence of growth spirals at the surface of the Nd-rich films. (C) 2001 American Institute of Physics.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.411
Times cited: 13
DOI: 10.1063/1.1421622
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“Wigner crystallization in the two electron quantum dot”. Matulis A, Peeters FM, Solid state communications 117, 655 (2001). http://doi.org/10.1016/S0038-1098(01)00013-8
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 1.554
Times cited: 34
DOI: 10.1016/S0038-1098(01)00013-8
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“Component selection for a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Gibson D, Hoffmann P, Ortner HM, X-ray spectrometry 30, 8 (2001). http://doi.org/10.1002/XRS.457
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 33
DOI: 10.1002/XRS.457
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“High energy X-ray microscopy for characterisation of fuel particles”. Salbu B, Krekling T, Lind OC, Oughton DH, Drakopoulos M, Simionovici AS, Snigireva I, Snigirev A, Weitkamp T, Adams F, Janssens K, Kashparov VA, Nuclear instruments and methods in physics research : A: accelerators, spectrometers, detectors and associated equipment 467, 1249 (2001). http://doi.org/10.1016/S0168-9002(01)00641-6
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.362
DOI: 10.1016/S0168-9002(01)00641-6
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“ID18F: a new micro-X-ray fluorescence end-station at the European Synchrotron Radiation Facility (ESRF): preliminary results”. Somogyi A, Drakopoulos M, Vincze L, Vekemans B, Camerani C, Janssens K, Snigirev A, Adams F, X-ray spectrometry 30, 242 (2001). http://doi.org/10.1002/XRS.494.ABS
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 76
DOI: 10.1002/XRS.494.ABS
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“Micro-heterogeneity study of trace elements in BCR CRM 680 by means of synchrotron micro-XRF”. Kempenaers L, de Koster C, van Borm W, Janssens K, Fresenius' journal of analytical chemistry 369, 733 (2001). http://doi.org/10.1007/S002160000679
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Times cited: 15
DOI: 10.1007/S002160000679
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“Trace analysis allows to distinguish between Venetian and facon-de-Venise glass vessels of the 16th and 17th century”. de Raedt I, Janssens K, Veeckman J, Vincze L, Vekemans B, Jeffries T, Journal of analytical atomic spectrometry 16, 1012 (2001). http://doi.org/10.1039/B102597J
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 3.379
Times cited: 49
DOI: 10.1039/B102597J
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“The use of LA-ICP-MS for the characterization of the micro-heterogeneity of heavy metals in BCR CRM 680”. Kempenaers L, Bings NH, Jeffries TE, Vekemans B, Janssens K, Journal of analytical atomic spectrometry 16, 1006 (2001). http://doi.org/10.1039/B102512K
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 3.379
Times cited: 23
DOI: 10.1039/B102512K
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“Analysis of speleothems by electron and X-ray microprobes”. Kuczumow A, Vekemans B, Schalm O, Gysels K, Ro C-U, Van Grieken R, Journal of analytical atomic spectrometry 16, 90 (2001). http://doi.org/10.1039/B007725I
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1039/B007725I
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“Application of chemometric methods for classification of atmospheric particles based on thin-window electron probe microanalysis data”. Osán J, de Hoog J, Worobiec A, Ro C-U, Oh K-Y, Szalóki I, Van Grieken R, Analytica chimica acta 446, 211 (2001)
Keywords: A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Chemical speciation of individual atmospheric particles using low-Z electron probe X-ray microanalysis characterizing “Asian Dust&rdquo, deposited with rainwater in Seoul, Korea”. Ro C-U, Oh K-Y, Kim HK, Chun Y, Osán J, de Hoog J, Van Grieken R, Atmospheric environment : an international journal 35, 4995 (2001). http://doi.org/10.1016/S1352-2310(01)00287-4
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S1352-2310(01)00287-4
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“Correlation between aerosols, deposits, and weathering crusts on ancient marbles”. Moropoulou A, Bisbikou K, Van Grieken R, Torfs K, Polikreti K, Environmental technology 22, 607 (2001). http://doi.org/10.1080/09593332208618236
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1080/09593332208618236
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“Efficiency calibartion of energy-dispersive detectors for application in quantitative x- and γ-ray spectrometry”. Szalóki I, Szegedi S, Varga K, Braun M, Osán J, Van Grieken R, X-ray spectrometry 30, 49 (2001). http://doi.org/10.1002/XRS.467
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.467
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“Elemental composition of mineral aerosol generated from Sudan Sahara sand”. Eltayeb MAH, Injuk J, Maenhaut W, Van Grieken RE, Journal of atmospheric chemistry 40, 247 (2001). http://doi.org/10.1023/A:1012272208129
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1023/A:1012272208129
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“Environmental conditions controlling the chemical weathering of the Madara Horseman monument, NE Bulgaria”. Delalieux F, Cardell C, Todorov V, Dekov V, Van Grieken R, Journal of cultural heritage 2, 43 (2001)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Environmental monitoring in four European museums”. Camuffo D, Van Grieken R, Busse H-J, Sturaro G, Valentino A, Bernardi A, Blades N, Shooter D, Gysels K, Deutsch F, Wieser M, Kim O, Ulrych U, Atmospheric environment : an international journal 35, S127 (2001)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles”. Osán J, de Hoog J, van Espen P, Szalóki I, Ro C-U, Van Grieken R, X-ray spectrometry 30, 419 (2001). http://doi.org/10.1002/XRS.523
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
DOI: 10.1002/XRS.523
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“Grazing-emission electron probe microanalysis of particles near the substrate edge”. Bekshaev A, de Hoog J, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 56, 2385 (2001). http://doi.org/10.1016/S0584-8547(01)00300-7
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0584-8547(01)00300-7
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