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Absorption correction for X-ray-fluorescence analysis of aerosol loaded filters”. Adams FC, Van Grieken RE, Analytical chemistry 47, 1767 (1975). http://doi.org/10.1021/AC60361A040
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Filter absorption correction for X-ray fluorescence analysis of aerosol loaded filters”. Van Grieken R, Adams F, (1976)
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Folding of aerosol loaded filters during X-ray fluorescence analysis”. Van Grieken RE, Adams FC, X-ray spectrometry 5, 61 (1976). http://doi.org/10.1002/XRS.1300050204
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Effective sample weight from scatter peaks in energy-dispersive x-ray fluorescence”. van Espen P, Van 't dack L, Adams F, Van Grieken R, Analytical chemistry 51, 961 (1979). http://doi.org/10.1021/AC50043A042
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Laser microprobe mass spectrometry : 1 : basic principles and performance characteristics”. Denoyer E, Van Grieken R, Adams F, Ntausch DFS, Analytical chemistry 54, 26a (1982). http://doi.org/10.1021/AC00238A722
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Analytical electron microscopy of single particles”. Markowicz A, Raeymaekers B, Van Grieken R, Adams F page 173 (1986).
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Characterization of air particulate matter by X-ray, Raman and mass spectrometric techniques”. Van Grieken R, Adams F page 57 (1986).
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Inorganic mass spectrometry”. Adams F, Gijbels R, Van Grieken R Wiley, Chichester, page 404 p. (1988).
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The elemental composition of airborne particulate matter in the Atacama desert, Chile”. Rojas CM, Figueroa L, Janssens KH, Van Espen PE, Adams FC, Van Grieken RE, The science of the total environment 91, 251 (1990). http://doi.org/10.1016/0048-9697(90)90302-B
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Lead particles in an urban atmosphere : an individual particle approach”. Van Borman W, Wouters L, Van Grieken R, Adams F, The science of the total environment 90, 55 (1990). http://doi.org/10.1016/0048-9697(90)90185-W
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Analysis of individual microscopic particles by means of synchrotron radiation induced X-ray micro fluorescence”. Janssens K, Adams F, Rivers ML, Jones KW, Proceedings 27th MAS (1992)
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens KH, Adams FC, van Langevelde F, Vis RD, Jones KW, Rivers M, Sutton S, Advances in X-ray analysis 35, 1265 (1992)
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens K, van Langevelde F, Adams F, Vis R, Sutton S, Rivers M, Jones K, Bowen D, (1992)
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Prediction of the optical characteristics and analytical qualities of an X-ray fluorescence microprobe at the European Synchrotron Radiation Facility (Grenoble)”. van Langevelde F, Janssens KH, Adams FC, Vis RD, Nuclear instruments and methods in physics research : A: accelerators, spectrometers, detectors and associated equipment 317, 383 (1992). http://doi.org/10.1016/0168-9002(92)90632-E
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Introduction”. Vertes A, Gijbels R, Adams F Wiley, New York, page 1 (1993).
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Vertes A, Gijbels R, Adams F (1993) Laser ionization mass analysis. Wiley, New York
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Lasers in mass spectrometry: organic and inorganic instrumentation”. van Vaeck L, van Roy W, Gijbels R, Adams F Wiley, New York, page 7 (1993).
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Structural characterization of organic molecules by laser mass spectrometry”. van Vaeck L, van Roy W, Gijbels R, Adams F Wiley, New York, page 177 (1993).
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Adams F, Gijbels R, Van Grieken R, Dachang Z (1993) Inorganic mass spectrometry. Fudan University Press, Shanghai, 391 p
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A general Monte-Carlo simulation of energy-dispersive X-ray fluorescence spectrometers : 1 : unpolarized radiation, homogenious samples”. Vincze L, Janssens K, Adams F, Spectrochimica acta: part B : atomic spectroscopy 48, 553 (1993). http://doi.org/10.1016/0584-8547(93)80060-8
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Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers”. Janssens K, Vincze L, van Espen P, Adams F, X-ray spectrometry 22, 234 (1993). http://doi.org/10.1002/XRS.1300220412
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Surface microanalysis”. Adams F, Adriaens A, Berghmans P, Janssens K, Analytica chimica acta 283, 19 (1993). http://doi.org/10.1016/0003-2670(93)85207-Z
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Synchrotron radiation-induced X-ray microanalysis”. Janssens K, Vincze L, Adams F, Jones KW, Analytica chimica acta 283, 98 (1993). http://doi.org/10.1016/0003-2670(93)85213-4
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X-ray optics for synchrotron-radiation-induced X-ray micro fluorescence at the european synchrotron-radiation facility, Grenoble”. Vincze L, Janssens K, Adams F, Institute of physics conference series , 613 (1993)
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Analysis of X-ray spectra by iterative least squares (AXIL): new developments”. Vekemans B, Janssens K, Vincze L, Adams F, van Espen P, X-ray spectrometry 23, 278 (1994). http://doi.org/10.1002/XRS.1300230609
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Microscopic X-ray fluorescence analysis”. Janssens K, Vincze L, Rubio J, Bernasconi G, Adams F, Journal of analytical atomic spectrometry 9, 151 (1994). http://doi.org/10.1039/JA9940900151
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Optics for X-ray microfluorescence to be used at the European synchrotron radiation facility”. Vincze L, Janssens K, Adams F, Advances in X-ray analysis 37, 553 (1994)
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Classification of coal mine dust particles through fuzzy clustering of their energy-dispersive electron microprobe X-ray spectra”. Bondarenko I, van Espen P, Treiger B, Van Grieken R, Adams F, Microbeam analysis 3, 33 (1994)
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Classification of mineral particles by nonlinear mapping of electron microprobe energy-dispersive X-ray spectra”. Treiger B, Bondarenko I, van Espen P, Van Grieken R, Adams F, The analyst 119, 971 (1994). http://doi.org/10.1039/AN9941900971
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A mass spectrometric study of the dissolution behavior of sanidine”. Adriaens A, Van 't dack L, Adams F, Gijbels R, Microchimica acta 120, 139 (1995). http://doi.org/10.1007/BF01244427
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