Author |
Title |
Year ![sorted by Year field, ascending order (up)](img/sort_asc.gif) |
Publication |
Volume |
Times cited |
Additional Links |
Poulain, R.; Lumbeeck, G.; Hunka, J.; Proost, J.; Savolainen, H.; Idrissi, H.; Schryvers, D.; Gauquelin, N.; Klein, A. |
Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism |
2022 |
ACS applied electronic materials |
4 |
|
UA library record; WoS full record; WoS citing articles |
Birkholzer, Y.A.; Sotthewes, K.; Gauquelin, N.; Riekehr, L.; Jannis, D.; van der Minne, E.; Bu, Y.; Verbeeck, J.; Zandvliet, H.J.W.; Koster, G.; Rijnders, G. |
High-strain-induced local modification of the electronic properties of VO₂ thin films |
2022 |
ACS applied electronic materials |
4 |
2 |
UA library record; WoS full record |
Rakesh Roshan, S.C.; Yedukondalu, N.; Pandey, T.; Kunduru, L.; Muthaiah, R.; Rajaboina, R.K.; Ehm, L.; Parise, J.B. |
Effect of atomic mass contrast on lattice thermal conductivity : a case study for alkali halides and alkaline-earth chalcogenides |
2023 |
ACS applied electronic materials |
5 |
|
UA library record; WoS full record |