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Author
Title
Year
Publication
Volume
Times cited
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Montoya, E.
;
Bals, S.
;
Van Tendeloo, G.
Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO
3
/SrTiO
3
multilayers prepared by focused ion beam
2008
Journal of microscopy
231
UA library record
;
WoS full record