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Author
Title
Year
Publication
Volume
Times cited
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De Gryse, O.
;
Clauws, P.
;
Vanhellemont, J.
;
Lebedev, O.
;
van Landuyt, J.
;
Simoen, E.
;
Claeys, C.
Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy
2002
UA library record
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WoS full record
;