| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
DART explained: how to carry out a discrete tomography reconstruction |
2008 |
|
|
|
UA library record |
| Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. |
Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples |
2014 |
|
|
|
UA library record |
| Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. |
Ultra-high resolution electron tomography for materials science : a roadmap |
2011 |
Microscopy and microanalysis |
17 |
|
UA library record |
