Number of records found: 159
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Citations
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Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
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Phase transition and magnetic anisotropy of (La,Sr)MnO3 thin films”. Wang Z-H, Kronmüller H, Lebedev OI, Gross GM, Razavi FS, Habermeier HU, Shen BG, Physical review : B : condensed matter and materials physics 65, 054411 (2002). http://doi.org/10.1103/PhysRevB.65.054411
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HREM study of compounds in the Bi-rich part of the Ba-Bi-O system”. Nikolaichik VI, Amelinckx S, Klinkova LA, Barkovskii NV, Lebedev OI, Van Tendeloo G, Journal of solid state chemistry 163, 44 (2002). http://doi.org/10.1006/jssc.2001.9362
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Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques”. Gryse OD, Clauws P, van Landuyt J, Lebedev O, Claeys C, Simoen E, Vanhellemont J, Journal of applied physics 91, 2493 (2002). http://doi.org/10.1063/1.1429800
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Comparison of modeling calculations with experimental results for rf glow discharge optical emission spectrometry”. Bogaerts A, Wilken L, Hoffmann V, Gijbels R, Wetzig K, Spectrochimica acta: part B : atomic spectroscopy 57, 109 (2002). http://doi.org/10.1016/S0584-8547(01)00357-3
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Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B, Journal of alloys and compounds 333, 13 (2002). http://doi.org/10.1016/S0925-8388(01)01691-7
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The microstructure of ordered Ba(Mg1/3Ta2/3)O3”. Lei CH, Van Tendeloo G, Amelinckx S, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 82, 349 (2002). http://doi.org/10.1080/01418610110068076
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Local and fast relaxation phenomena after laser-induced photodetachment in a strongly electronegative rf discharge”. Yan M, Bogaerts A, Gijbels R, Goedheer WJ, Physical review : E : statistical, nonlinear, and soft matter physics 65, 016408 (2002). http://doi.org/10.1103/PhysRevE.65.016408
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Superconducting properties of mesoscopic cylinders with enhanced surface superconductivity”. Baelus BJ, Yampolskii SV, Peeters FM, Montevecchi E, Indekeu JO, Physical review : B : condensed matter and materials physics 65, 024510 (2002). http://doi.org/10.1103/PhysRevB.65.024510
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Catalyst traces and other impurities in chemically purified carbon nanotubes grown by CVD”. Biró, LP, Khanh NQ, Vértesy Z, Horváth ZE, Osváth Z, Koós A, Gyulai J, Kocsonya A, Kónya Z, Zhang XB, Van Tendeloo G, Fonseca A, Nagy JB;, Materials science and engineering: part C: biomimetic materials T2 –, EMRS Spring Meeting, JUN 05-08, 2001, STRASBOURG, FRANCE 19, 9 (2002). http://doi.org/10.1016/S0928-4931(01)00407-6
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Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy”. De Gryse O, Clauws P, Vanhellemont J, Lebedev O, van Landuyt J, Simoen E, Claeys C, , 183 (2002)
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Equations of state of tantalum and plutonium in a spherical cell approximation and at extremely high pressures”. Leys FE, March NH, Lamoen D, van Doren VE, 22, 217 (2002). http://doi.org/10.1080/08957950290011482
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Geometry induced defects in a confined Wigner lattice”. Peeters FM, Kong M, Partoens B, , 192 (2002)
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Modeling of magnetron and glow discharges”. Bogaerts A, Kolev I, Le vide: science, technique et applications 57, 296 (2002)
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Molecular terms and optical transitions of C60n+/- molecular ions”. Nikolaev AV, Michel KH, AIP conference proceedings T2 –, 16th International Winterschool on Electronic Properties of Novel, Materials, MAR 02-09, 2002, KIRCHBERG, AUSTRIA , 417 (2002)
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Nanoscale morphology of a piece of ruby red Kunckel glass”. Fredrickx P, Schryvers D, Janssens K, Physics and chemistry of glasses 43, 176 (2002)
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Artificial atoms and molecules”. Partoens B, Peeters FM, Physicalia magazine 24, 29 (2002)
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The crystal structure of YSr2Cu3O6+x determined by HREM”. Lebedev O, Van Tendeloo G, Marezio M, Licci F, Gilioli E, Gauzzi A, Prodi A s.l., page 877 (2002).
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Enhancement of critical magnetic field in superconducting nanostructures”. Fomin VM, Devreese JT, Misko VR, 1, 134 (2002)
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La microscopie électronique à, transmission (MET) et son utilisation dans l'étude d'inclusions nano-cristallines dans le verre”. Fredrickx P, Schryvers D, L'archéométrie au service des monuments et des oeuvres d'art 10, 131 (2002)
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Modeling network for argon glow discharge plasmas with copper cathode”. Bogaerts A, Gijbels R Nova, New York, page 1 (2002).
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Modelling of a dielectric barrier glow discharge at atmospheric pressure in nitrogen”. Madani M, Bogaerts A, Gijbels R, Vangeneugden D, , 130 (2002)
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Single and coupled type II quantum dots in magnetic and electric fields”. Janssens KL, Partoens B, Peeters FM, Physicalia magazine 24, 211 (2002)
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Structural phase transition in (La0.67Ca0.33MnO3)1-x: (MgO)x composite film”. Lebedev O, Verbeeck J, Van Tendeloo G, Shapoval O, Belenchuk A, Moshnyaga V, Damaschke B, Samwer K s.l., page 1013 (2002).
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Art 2002 : 7th International Conference on Non-destructive Testing and Microanalysisfor the Diagnostics and Conservation of the Cultural and Environmental Heritage, 2-6 June 2002, Congress Centre Elzenveld, Antwerp, Belgium”. Van Grieken R, Janssens K, Van 't dack L, Meersman G page 780 p. (2002).
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ID18F: a new X-ray microprobe end station”. Somogyi A, Drakopoulos M, Vincze L, Vekemans B, Camerani C, Janssens K, Snigirev A, Adams F, ESRF highlights 2001 , 96 (2002)
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On the distinction between 16th and 17th century Venetian glass and façon-de-Venise glass”. de Raedt I, Janssens K, Veeckman J page 95 (2002).
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Radioactive particle characterisation by means of synchrotron radiation-based X-ray micro beam techniques”. Lind OC, Salbu B, Janssens K, Simionovici AS, (2002)
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SR-based X-ray microbeam techniques utilised for solid-state speciation of U in fuel particles”. Salbu B, Janssens K, Lind OC, Simionovici AS, Trekling T, Drakopoulos M, Snigireva I, Snigirev A, (2002)
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Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis”. Ro C-U, Hoornaert S, Van Grieken R page 17 (2002).
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