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Author
Title
Year
Publication
Volume
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Van Eyndhoven, G.
;
Batenburg, K.J.
;
van Oers, C.
;
Kurttepeli, M.
;
Bals, S.
;
Cool, P.
;
Sijbers, J.
Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples
2014
UA library record