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Author
Title
Year
Publication
Volume
Times cited
Additional Links
Yu, H.
;
Schaekers, M.
;
Chew, S.A.
;
Eyeraert, J.-L.
;
Dabral, A.
;
Pourtois, G.
;
Horiguchi, N.
;
Mocuta, D.
;
Collaert, N.
;
De Meyer, K.
Titanium (germano-)silicides featuring 10
-9
Ω.cm
2
contact resistivity and improved compatibility to advanced CMOS technology
2018
2018 18th International Workshop On Junction Technology (iwjt)
UA library record
;
WoS full record
Tiwari, S.
;
Van de Put, M.L.
;
Sorée, B.
;
Vandenberghe, W.G.
Carrier transport in a two-dimensional topological insulator nanoribbon in the presence of vacancy defects
2018
International Conference on Simulation of Semiconductor Processes and Devices : [proceedings] T2 – International Conference on Simulation of Semiconductor Processes and, Devices (SISPAD), SEP 24-26, 2018, Austin, TX
UA library record
;
WoS full record
;
WoS citing articles