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Transmission electron microscopy on interface engineered superconducting thin films”. Bals S, Van Tendeloo G, Rijnders G, Huijben M, Leca V, Blank DHA, IEEE transactions on applied superconductivity 13, 2834 (2003). http://doi.org/10.1109/TASC.2003.812023
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Modulation-free phase in heavily Pb-doped (Bi,Pb)2212 crystals”. Musolino N, Bals S, Van Tendeloo G, Clayton N, Walker E, Flükiger R, Physica: C : superconductivity 399, 1 (2003). http://doi.org/10.1016/S0921-4534(03)01324-8
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Investigation of (Bi,Pb)2212 crystals : observation of modulation-free phase”. Musolino N, Bals S, Van Tendeloo G, Clayton N, Walker E, Flukiger R, Physica: C : superconductivity 401, 270 (2004). http://doi.org/10.1016/j.physc.2003.09.052
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Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Bals S, Erni R, van Dyck D, Van Tendeloo G, Microscopy and microanalysis 15, 464 (2009). http://doi.org/10.1017/S1431927609093957
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Annular dark field imaging in a TEM”. Bals S, Kabius B, Haider M, Radmilovic V, Kisielowski C, Solid state communications 130, 675 (2004). http://doi.org/10.1016/j.ssc.2004.03.035
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Comparison of As- and P-based metamorphic buffers for high performance InP heterojunction bipolar transistor and high electron mobility transistor applications”. Lubyshev D, Fastenau JM, Fang X-M, Wu Y, Doss C, Snyder A, Liu WK, Lamb MSM, Bals S, Song C, Journal of vacuum science &, technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena 22, 1565 (2004). http://doi.org/10.1116/1.1691412
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Quantitative electron microscopy of (Bi,Pb)2Sr2Ca2Cu3O10+\delta/Ag multifilament tapes during initial stages of annealing”. Bals S, Verbeeck J, Van Tendeloo G, Liu Y-L, Grivel J-C, Journal of the American Ceramic Society 88, 431 (2005). http://doi.org/10.1111/j.1551-2916.2005.00094.x
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Interplay of doping and structural modulation in superconducting Bi2Sr2-xLaxCuO6+\delta thin films”. Li ZZ, Raffy H, Bals S, Van Tendeloo G, Megtert S, Physical review : B : condensed matter and materials physics 71, 174503 (2005). http://doi.org/10.1103/PhysRevB.71.174503
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Nonlinear imaging using annular dark field TEM”. Bals S, Kilaas R, Kisielowski C, Ultramicroscopy 104, 281 (2005). http://doi.org/10.1016/j.ultramic.2005.05.004
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Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range”. Bals S, Van Aert S, Van Tendeloo G, Avila-Brande D, Physical review letters 96, 096106 (2006). http://doi.org/10.1103/PhysRevLett.96.096106
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A new approach for electron tomography: annular dark-field transmission electron microscopy”. Bals S, Van Tendeloo G, Kisielowski C, Advanced materials 18, 892 (2006). http://doi.org/10.1002/adma.200502201
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A new Bi4Mn1/3W2/3O8Cl Sillén-Aurivillius intergrowth: synthesis and structural characterisation by quantitative transmission electron microscopy”. Avila-Brande D, Otero-Díaz LC, Landa-Cánovas AR, Bals S, Van Tendeloo G, European journal of inorganic chemistry , 1853 (2006). http://doi.org/10.1002/ejic.200501021
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Electronically coupled complementary interfaces between perovskite band insulators”. Huijben M, Rijnders G, Blank DHA, Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Brinkman A, Hilgenkamp H, Nature materials 5, 556 (2006). http://doi.org/10.1038/nmat1675
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Mixed (Sr1-xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques”. Lebedev OI, Bals S, Van Tendeloo G, Snoeck GE, Retoux R, Boudin S, Hervieu M, International journal of materials research 97, 978 (2006). http://doi.org/10.3139/146.101328
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Superconducting single-phase Sr1-xLaxCuO2 thin films with improved crystallinity grown by pulsed laser deposition”. Leca V, Blank DHA, Rijnders G, Bals S, Van Tendeloo G, Applied physics letters 89 (2006). http://doi.org/10.1063/1.2339840
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An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images”. Croitoru MD, van Dyck D, Van Aert S, Bals S, Verbeeck J, Ultramicroscopy 106, 933 (2006). http://doi.org/10.1016/j.ultramic.2006.04.006
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Crystallographic shear structures as a route to anion-deficient perovskites”. Abakumov AM, Hadermann J, Bals S, Nikolaev IV, Antipov EV, Van Tendeloo G, Angewandte Chemie: international edition in English 45, 6697 (2006). http://doi.org/10.1002/anie.200602480
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High-quality sample preparation by low kV FIB thinning for analytical TEM measurements”. Bals S, Tirry W, Geurts R, Yang Z, Schryvers D, Microscopy and microanalysis 13, 80 (2007). http://doi.org/10.1017/S1431927607070018
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On the use of TEM in the characterization of nanocomposites”. Monticelli O, Musina Z, Russo S, Bals S, Materials letters 61, 3446 (2007). http://doi.org/10.1016/j.matlet.2006.11.086
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Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes”. Bals S, Batenburg J, Verbeeck J, Sijbers J, Van Tendeloo G, Nano letters 7, 3669 (2007). http://doi.org/10.1021/nl071899m
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Evaluation of top, angle, and side cleaned FIB samples for TEM analysis”. Montoya E, Bals S, Rossell MD, Schryvers D, Van Tendeloo G, Microscopy research and technique 70, 1060 (2007). http://doi.org/10.1002/jemt.20514
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Structural characterization of Er-doped Li2O-Al2O3-SiO2 glass ceramics”. Krsmanovic R, Bals S, Bertoni G, Van Tendeloo G, Optical materials 30, 1183 (2008). http://doi.org/10.1016/j.optmat.2007.05.045
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Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam”. Montoya E, Bals S, Van Tendeloo G, Journal of microscopy 231, 359 (2008). http://doi.org/10.1111/j.1365-2818.2008.02055.x
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End-to-end assembly of shape-controlled nanocrystals via a nanowelding approach mediated by gold domains”. Figuerola A, Franchini IR, Fiore A, Mastria R, Falqui A, Bertoni G, Bals S, Van Tendeloo G, Kudera S, Cingolani R, Manna L, Advanced materials 21, 550 (2009). http://doi.org/10.1002/adma.200801928
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Transport, magnetic, and structural properties of La0.7Ce0.3MnO3 thin films: evidence for hole-doping”. Werner R, Raisch C, Leca V, Ion V, Bals S, Van Tendeloo G, Chasse T, Kleiner R, Koelle D, Physical review : B : solid state 79, 054416 (2009). http://doi.org/10.1103/PhysRevB.79.054416
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Effect of amorphous layers on the interpretation of restored exit waves”. Van Aert S, Chang LY, Bals S, Kirkland AI, Van Tendeloo G, Ultramicroscopy 109, 237 (2009). http://doi.org/10.1016/j.ultramic.2008.10.024
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Quantitative three-dimensional modeling of zeotile through discrete electron tomography”. Bals S, Batenburg KJ, Liang D, Lebedev O, Van Tendeloo G, Aerts A, Martens JA, Kirschhock CE, Journal of the American Chemical Society 131, 4769 (2009). http://doi.org/10.1021/ja8089125
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3D imaging of nanomaterials by discrete tomography”. Batenburg KJ, Bals S, Sijbers J, Kübel C, Midgley PA, Hernandez JC, Kaiser U, Encina ER, Coronado EA, Van Tendeloo G, Ultramicroscopy 109, 730 (2009). http://doi.org/10.1016/j.ultramic.2009.01.009
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Combined TiO2/SiO2 mesoporous photocatalysts with location and phase controllable TiO2 nanoparticles”. Beyers E, Biermans E, Ribbens S, de Witte K, Mertens M, Meynen V, Bals S, Van Tendeloo G, Vansant EF, Cool P, Applied catalysis : B : environmental 88, 515 (2009). http://doi.org/10.1016/j.apcatb.2008.10.009
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The remarkable and intriguing resistance to oxidation of 2D ordered hcp Co nanocrystals: a new intrinsic property”. Lisiecki I, Turner S, Bals S, Pileni MP, Van Tendeloo G, Chemistry of materials 21, 2335 (2009). http://doi.org/10.1021/cm900284u
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