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Author
Title
Year
Publication
Volume
Times cited
Additional Links
Lenaerts, J.
;
Gijbels, R.
;
van Vaeck, L.
;
Verlinden, G.
;
Geuens, I.
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals
2003
Applied surface science
203/204
7
UA library record
;
WoS full record
;
WoS citing articles
de Witte, H.
;
Conard, T.
;
Vandervorst, W.
;
Gijbels, R.
Ion-bombardment artifact in TOF-SIMS analysis of ZrO
2
/SiO
2
/Si stacks
2003
Applied surface science
203
15
UA library record
;
WoS full record
;
WoS citing articles
