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“The classical electron gas in artificial structures”. Peeters FM, Partoens B, Kong M, , 235 (2004)
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“The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES”. Shimizu K, Habazaki H, Bender H, Gijbels R, Engineering materials 52, 97 (2004)
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“High electron mobility in AlGaN/GaN HEMT grown on sapphire: strain modification by means of AIN interlayers”. Germain M, Leys M, Boeykens S, Degroote S, Wang W, Schreurs D, Ruythooren W, Choi K-H, van Daele B, Van Tendeloo G, Borghs G, Materials Research Society symposium proceedings 798, Y10.22 (2004)
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“Ionization density in hydrocarbon flames: numerical modelling”. Migoun A, Cenian A, Chernukho A, Bogaerts A, Gijbels R, Leys C, , 130 (2004)
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“Langmuir probe diagnostic of high pressure plasmas: study by PIC-MC modelling”. Cenian A, Chernukho A, Bogaerts A, Gijbels R, Leys C, , 61 (2004)
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“Modelleren van plasmas gebruikt voor de afzetting van dunne lagen”. Herrebout D, Bogaerts A, Gijbels R, Chemie magazine , 34 (2004)
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“Modelling of formation and transport of nanoparticles in silane discharges”. de Bleecker K, Bogaerts A, Goedheer WJ, Gijbels R, , 0 (2004)
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“Organische TOF-S-SIMS: gebruik van opgedampt Ag en Au voor de verhoging van secundaire ionenintensiteiten”. Adriaensen L, Vangaever F, Gijbels R, Chemie magazine , 10 (2004)
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“Parametric study by means of numerical modelling for a dielectric barrier discharge at atmospheric pressure in nitrogen”. Madani M, Bogaerts A, Gijbels R, Vangeneugden D, , 49 (2004)
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“Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs”. Jinschek JR, Bals S, Gopal V, Xus X, Kisielowski C, Microscopy and microanalysis 10, 294 (2004). http://doi.org/10.1017/S1431927604882813
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“TEM annular objective apertures fabricated by FIB”. Bals S, Radmilovic V, Kisielowski C, Microscopy and microanalysis 10, 1148 (2004). http://doi.org/10.1017/S1431927604881765
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“Vortex-antivortex ionic crystals in superconducting films with magnetic pinning arays”. Milošević, MV, Peeters FM, Physicalia magazine 26, 355 (2004)
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“An interactive curvature based rigid-body image registartion technique: an application of EFTEM”. Leemans A, Sijbers J, van den Broek W, Yang Z, (2004)
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“A compact μ-XRF spectrometer for (in-situ) analyses of cultural heritage and forensic materials”. Vittiglio G, Bichlmeier S, Klinger P, Heckel J, Fuzhong W, Vincze L, Janssens K, Engström P, Rindby A, Dietrich K, Jembrih-Simbürger D, Schreiner M, Denis D, Lakdar A, Lamotte A, Nuclear instruments and methods in physics research B 213, 693 (2004)
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“Cultural heritage research in “The Micro and Trace Analysis Center&rdquo, of the University of Antwerp”. Godoi RHM, Kontozova V, Godoi AFL, Bencs L, Spolnik Z, Janssens K, Van Grieken R, Coalition 7, 11 (2004)
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“Introduction and overview”. Janssens K, Van Grieken R page 1 (2004).
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Kempenaers L, Vincze L, Vekemans B, Janssens K, Adams F, Somogyi A, Drakopoulos M, Simionovici AS (2004) Micro-heterogeneity study of trace elements in reference materials. 132 p
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“Monte Carlo simulation for X-ray fluorescence spectroscopy”. Vincze L, Janssens K, Vekemans B, Adams F page 435 (2004).
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“Non-destructive micoranalysis of cultural heritage materials”. Janssens K, Van Grieken R page 800 p. (2004).
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“Polycapillary X-ray optics”. Gao N, Janssens K page 89 (2004).
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“Preface”. Janssens K, Van Grieken R page xxvii-xxviii (2004).
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“Provenance analysis of glass artefacts”. Gratuze B, Janssens K page 663 (2004).
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“X-ray based methods of analysis”. Janssens K page 129 (2004).
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“Damages caused to European monuments by air pollution: assessment and preventive measures”. Saiz-Jimenez C, Brimblecombe P, Camuffo D, Lefèvre R-A, Van Grieken R page 91 (2004).
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“Effects of air pollution and microclimate on stained glass windows: prliminary results in the Sainte Chapelle (Paris)”. Bernardi A, Becherini F, Kontozova V, Godoi RHM, Van Grieken R, Deutsch F page 133 (2004).
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“Introduction: considering the role of X-ray spectrometry in chemical analysis and outlining the volume”. Van Grieken R page 1 (2004).
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“Investigation of individual particles and gaseous air pollutants in showcases”. Godoi RHM, Kontozova V, Godoi AFL, Van Grieken R page 147 (2004).
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“Speciation and surface analysis of single particles using electron-excited X-ray emission spectrometry”. Szalóki I, Ro C-U, Osán J, de Hoog J, Van Grieken R page 569 (2004).
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“Synchrotron computed X-ray fluorescence tomography in environmental and earth sciences: radiation”. Vincze L, Vekemans B, Adams F, (2004)
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“Synchrotron radiation for microscopic X-ray fluorescence analysis”. Adams F, Vincze L, Vekemans B page 343 (2004).
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