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“Awards for best referees of X-ray Spectrometry”. Van Grieken R, X-ray spectrometry 43, 68 (2014). http://doi.org/10.1002/XRS.2530
Keywords: Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.2530
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“Energy-dispersive X-ray fluorescence analysis of geological materials in borax beads using Tertian's binary coefficient approach combined with internal standard addition”. Muia LM, Van Grieken R, X-ray spectrometry 20, 179 (1991)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“New Chinese members of the Advisory Board of X-Ray Spectrometry”. Van Grieken R, X-ray spectrometry 35, 205 (2006)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Progress in laboratory grazing emission X-ray fluorescence spectrometry”. Claes M, de Bokx P, Van Grieken R, X-ray spectrometry 28, 224 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<224::AID-XRS337>3.3.CO;2-W
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/(SICI)1097-4539(199907/08)28:4<224::AID-XRS337>3.3.CO;2-W
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“Application of auxiliary signals in X-ray fluorescence and electron microprobe analysis for density evaluation”. Kuczumov A, Vekemans B, Schalm O, Vincze L, Dorriné, W, Gysels K, Van Grieken R, X-ray spectrometry 28, 282 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<282::AID-XRS352>3.0.CO;2-H
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/(SICI)1097-4539(199907/08)28:4<282::AID-XRS352>3.0.CO;2-H
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“Use of microscopic XRF for non-destructive analysis in art an archaeometry”. Janssens K, Vittiglio G, Deraedt I, Aerts A, Vekemans B, Vincze L, Wei F, de Ryck I, Schalm O, Adams F, Rindby A, Knöchel A, Simionovici AS, Snigirev A, X-ray spectrometry 29, 73 (2000). http://doi.org/10.1002/(SICI)1097-4539(200001/02)29:1<73::AID-XRS416>3.3.CO;2-D
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
DOI: 10.1002/(SICI)1097-4539(200001/02)29:1<73::AID-XRS416>3.3.CO;2-D
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“Component selection for a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Gibson D, Hoffmann P, Ortner HM, X-ray spectrometry 30, 8 (2001). http://doi.org/10.1002/XRS.457
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 33
DOI: 10.1002/XRS.457
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“Efficiency calibartion of energy-dispersive detectors for application in quantitative x- and γ-ray spectrometry”. Szalóki I, Szegedi S, Varga K, Braun M, Osán J, Van Grieken R, X-ray spectrometry 30, 49 (2001). http://doi.org/10.1002/XRS.467
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.467
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“Optimization of experimental conditions of thin-window EPMA for ligh-element analysis of individual environmental particles”. Szalóki I, Osán J, Worobiec A, de Hoog J, Van Grieken R, X-ray spectrometry 30, 143 (2001). http://doi.org/10.1002/XRS.473.ABS
Keywords: A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.473.ABS
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“ID18F: a new micro-X-ray fluorescence end-station at the European Synchrotron Radiation Facility (ESRF): preliminary results”. Somogyi A, Drakopoulos M, Vincze L, Vekemans B, Camerani C, Janssens K, Snigirev A, Adams F, X-ray spectrometry 30, 242 (2001). http://doi.org/10.1002/XRS.494.ABS
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 76
DOI: 10.1002/XRS.494.ABS
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“Individual particle characterization of Siberian aerosols by micro-PIXE and backscattering spectrometry”. van Malderen H, Hoornaert S, Injuk J, Przybylowicz WJ, Pineda CA, Prozesky VM, Van Grieken R, X-ray spectrometry 30, 320 (2001). http://doi.org/10.1002/XRS.505
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.505
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“Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles”. Osán J, de Hoog J, van Espen P, Szalóki I, Ro C-U, Van Grieken R, X-ray spectrometry 30, 419 (2001). http://doi.org/10.1002/XRS.523
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
DOI: 10.1002/XRS.523
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“Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
DOI: 10.1002/XRS.551
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“Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 12
DOI: 10.1002/XRS.563
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“Literature trends in x-ray emission spectrometry in the period 1990-2000: a review”. Injuk J, Van Grieken R, X-ray spectrometry 32, 35 (2003). http://doi.org/10.1002/XRS.606
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.606
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“Characterization of a polycapillary lens for use in micro-XANES experiments”. Proost K, Vincze L, Janssens K, Gao N, Bulska E, Schreiner M, Falkenberg G, X-ray spectrometry 32, 215 (2003). http://doi.org/10.1002/XRS.635
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 50
DOI: 10.1002/XRS.635
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“Reconstruction of the three-dimensional distribution of elements in fly-ash particles by micro-XRF spectroscopy”. Rindby A, Janssens K, Osán J, X-ray spectrometry 32, 248 (2003). http://doi.org/10.1002/XRS.647
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 8
DOI: 10.1002/XRS.647
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“Grazing-exit electron probe x-ray microanalysis of light elements in particles”. Spolnik Z, Tsuji K, Van Grieken R, X-ray spectrometry 33, 16 (2004). http://doi.org/10.1002/XRS.656
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.656
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“EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments”. Fredrickx P, de Ryck I, Janssens K, Schryvers D, Petit J-P, Döcking H, X-ray spectrometry 33, 326 (2004). http://doi.org/10.1002/xrs.734
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 13
DOI: 10.1002/xrs.734
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“Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses”. Padilla R, van Espen P, Abrahantes A, Janssens K, X-ray spectrometry 34, 19 (2005). http://doi.org/10.1002/XRS.781
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Impact Factor: 1.298
Times cited: 23
DOI: 10.1002/XRS.781
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“Ruthenium staining as an alternative preparation method for automated EPMA of individual biogenic and organic particles”. Worobiec A, Kaplinski A, Van Grieken R, X-ray spectrometry 34, 245 (2005). http://doi.org/10.1002/XRS.807
Keywords: A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.807
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“EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials”. Belikov KN, Mikhailova LI, Spolnik ZM, Van Grieken R, X-ray spectrometry 35, 112 (2006). http://doi.org/10.1002/XRS.874
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.874
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“High-energy polarized-beam EDXRF for trace metal analysis of vegetation samples in environmental studies”. Marguí, E, Padilla R, Hidalgo M, Queralt I, Van Grieken R, X-ray spectrometry 35, 169 (2006). http://doi.org/10.1002/XRS.890
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.890
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“Speciation of selected metals in aerosol samples by TXRF after sequential leaching”. Samek L, Ostachowicz B, Worobiec A, Spolnik Z, Van Grieken R, X-ray spectrometry 35, 226 (2006). http://doi.org/10.1002/XRS.905
Keywords: A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.905
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“Investigation on porosity changes of Lecce stone due to conservation treatments by means of x-ray nano- and improved micro-computed tomography: preliminary results”. Bugani S, Camaiti M, Morselli L, Van de Casteele E, Janssens K, X-ray spectrometry 36, 316 (2007). http://doi.org/10.1002/XRS.976
Keywords: A1 Journal article; Vision lab; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 28
DOI: 10.1002/XRS.976
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“Comprehensive microanalytical study of welding aerosols with x-ray and Raman based methods”. Worobiec A, Stefaniak EA, Kiro S, Oprya M, Bekshaev A, Spolnik Z, Potgieter-Vermaak SS, Ennan A, Van Grieken R, X-ray spectrometry 36, 328 (2007). http://doi.org/10.1002/XRS.979
Keywords: A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.979
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“Assessment of aerosol particles within the Rubens' House Museum in Antwerp, Belgium”. Godoi RHM, Potgieter-Vermaak S, Godoi AFL, Stranger M, Van Grieken R, X-ray spectrometry 37, 298 (2008). http://doi.org/10.1002/XRS.1049
Abstract: The majority of researchers, conservators and curators recognise that atmospheric pollution is one of the major threats to works of art. In principle, all atmospheric particles, when deposited onto art objects can be considered harmful because of their potential in causing deterioration. Moreover, under certain conditions, particulate matter can induce and intensify surface damage, particularly because of its potential to serve as centre for moisture condensation and adsorbent of gaseous pollutants. To investigate the potential harm that these particles can cause, comprehensive characterisation of the particulate matter is necessary. Particulate matter was collected at the Rubens' House Museum in Antwerp, Belgium, where a unique exhibit of the paintings and living quarters of Peter Paul Rubens (1577-1640) are seen. Size segregated aerosol samples were collected for analyses of bulk and single particle elemental and molecular compositions. They were analysed by electron probe micro-analysis, utilising facilities for low-Z element determination, and by energy-dispersive x-ray fluorescence, to investigate the elemental composition of individual particles and bulk samples, and by micro Raman spectrometry, to elucidate the molecular composition. Results are interpreted separately and as a whole with the specific aim of identifying compounds that could contribute to the chemical reactions taking place on the surfaces of artefacts and which could potentially cause degradation of the objects.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.1049
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“Editorial: Award for best XRS referee during 2007-2008”. Van Grieken R, X-ray spectrometry 37, 571 (2008). http://doi.org/10.1002/XRS.1107
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.1107
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“James Ensor's pigment use: artistic and material evolution studied by means of portable X-ray fluorescence spectrometry”. van der Snickt G, Janssens K, Schalm O, Aibéo C, Kloust H, Alfeld M, X-ray spectrometry 39, 103 (2010). http://doi.org/10.1002/XRS.1235
Abstract: In this paper, portable X-ray fluorescence spectrometry (PXRF) was employed as a screening tool for determining and comparing the pigment use in a large series of paintings by the Belgian artist James Ensor (1860-1949). Benefits and drawbacks of PXRF as a method, and the instrument employed, are discussed from a practical, conservation and instrumental perspective. Regardless of several restrictions due to the set-up and/or the analytical method, it appeared feasible to document the evolution with time in Ensor's use of inorganic pigments and to correlate this technical evolution with stylistic developments, Nevertheless, it became clear that a full identification of all materials present can only be done by means of the analysis of (cross-sectioned) samples.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 25
DOI: 10.1002/XRS.1235
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“Chemical analysis of 16th to 19th century Limoges School painted enamel objects in three museums of the Low Countries”. van der Linden V, Schalm O, Houbraken J, Thomas M, Meesdom E, Devos A, van Dooren R, Nieuwdorp H, Janssen E, Janssens K, X-ray spectrometry 39, 112 (2010). http://doi.org/10.1002/XRS.1207
Abstract: In this study, the results of analysing of a series of 16th-19th century painted enamel objects of the Limoges School currently in collections in three Dutch and Flemish museums by means of portable and micro x-ray fluorescence analysis (PXRF and µ-XRF) and electron probe micro analysis (EPMA) are presented. The aim of the investigation was the authentication of specific pieces. Therefore, the glass compositions as well as the (glass) colouring agents used by the Limoges' artists were studied as a function of the age of the objects. Due to the evolution of these properties, it is possible to approximately date these objects based on their chemical composition. The complete émail peint collection of the Museum Boijmans-Van Beuningen (Rotterdam, The Netherlands), consisting of 20 émail peint plaques, was analysed with µ-XRF. Quantitative information was obtained by EPMA analysis of 15 enamel fragments of objects from museum and private collections in the Low Countries. PXRF analyses were performed on the painted enamel collection of the Antwerp Vleeshuis Museum (13 objects) and the Mayer van den Bergh Museum (4 objects) and on a set of 18 plaques that were donated to the Boijmans-Van Beuningen Museum by a private collector. The results obtained by means of EPMA, µ-XRF and PXRF proved to be useful in the discrimination of 16th century painted enamel objects from those of the19th century. From a total of 70 objects examined, 2 objects (OM964A and OM993) featured a chemical signature that deviated from the published literature composition and pigment use consistent with its presumed period of manufacture.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 8
DOI: 10.1002/XRS.1207
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