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Modeling of glow discharge ion sources for mass spectrometry: potentials and limitations”. Gijbels R, Bogaerts A, Spectroscopy 9, 8 (1997)
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A micro XRF spectrometer based on rotating anode generator and capillary optics”. Janssens K, Vekemans B, Vincze L, Adams F, Rindby A, Spectrochimica acta: part B : atomic spectroscopy 51, 1661 (1996)
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Special issue: Proceedings of the 15th International Congress on X-ray Optics and Microanalysis”. Janssens K, Journal of analytical atomic spectroscopy 14, 357 (1999)
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IDAS: a Windows based software package for cluster analysis”. Bondarenko I, Treiger B, Van Grieken R, van Espen P, Spectrochimica acta: part B : atomic spectroscopy 51, 441 (1996)
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Integrated analytical techniques for the characterisation of environmental particles”. Potgieter-Vermaak S, Van Grieken R, Potgieter JH, Spectroscopy Europe 22, 12 (2010)
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Spectroscopy and ion chromatography to study the effects of air pollution on historical buildings”. Van Grieken R, Roekens E, Sweevers H, Vleugels G, Spectroscopy 10, 70 (1989)
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What modeling reveals about the properties of an inductively coupled plasma”. Bogaerts A, Aghaei M, Spectroscopy 31, 52 (2016)
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Fundamental aspects and applications of glow discharge spectrometric techniques”. Bogaerts A, Gijbels R, Spectrochimica acta: part B : atomic spectroscopy 53, 1 (1998). http://doi.org/10.1016/S0584-8547(97)00122-5
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Comprehensive description of a Grimm-type glow discharge source used for optical emission spectrometry: a mathematical simulation”. Bogaerts A, Gijbels R, Spectrochimica acta: part B : atomic spectroscopy 53, 437 (1998). http://doi.org/10.1016/S0584-8547(97)00148-1
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Modeling of glow discharge optical emission spectrometry: calculation of the argon atomic optical emission spectrum”. Bogaerts A, Gijbels R, Vlcek J, Spectrochimica acta: part B : atomic spectroscopy 53, 1517 (1998). http://doi.org/10.1016/S0584-8547(98)00139-6
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Collisional-radiative model for the sputtered copper atoms and ions in a direct current argon glow discharge”. Bogaerts A, Gijbels R, Carman RJ, Spectrochimica acta: part B : atomic spectroscopy 53, 1679 (1998). http://doi.org/10.1016/S0584-8547(98)00201-8
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Analyses of petrified wood by electron, X-ray and optical microprobes”. Kuczumov A, Vekemans B, Schalm O, Dorriné, W, Chevallier P, Dillmann P, Ro C-U, Janssens K, Van Grieken R, Journal of analytical atomic spectroscopy 14, 435 (1999). http://doi.org/10.1039/A806748A
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Compositional distinctions between 16th century “Façon-de-Venise&rdquo, and Venetian glass vessels, excavated in Antwerp, Belgium”. Deraedt I, Janssens K, Veeckman J, Journal of analytical atomic spectroscopy 14, 483 (1999). http://doi.org/10.1039/A808385A
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Enhancement of electron-induced X-ray intensity for single particles under grazing-exit conditions”. Tsuji K, Spolnik Z, Wagatsuma K, Zhang J, Van Grieken RE, Spectrochimica acta: part B : atomic spectroscopy 54, 1243 (1999). http://doi.org/10.1016/S0584-8547(99)00073-7
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Correlation of microstructure and magnetotransport properties of epitaxially grown La-Ca-Mn-O3 thin films”. Habermeier HU, Razavi F, Lebedev O, Gross GM, Praus R, Zhang PX, Physica status solidi: B: basic research T2 –, International Conference on Solid State Spectroscopy –, (ICSSS), SEP 05-07, 1999, SCHWABISCH-GMUND, GERMANY 215, 679 (1999). http://doi.org/10.1002/(SICI)1521-3951(199909)215:1<679::AID-PSSB679>3.0.CO;2-H
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Comparison between a radio-frequency and direct current glow discharge in argon by a hybrid Monte Carlo-fluid model for electrons, argon ions and fast argon atoms”. Bogaerts A, Gijbels R, Goedheer W, Spectrochimica acta: part B : atomic spectroscopy 54, 1335 (1999). http://doi.org/10.1016/S0584-8547(99)00080-4
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Determination of silicon in organic matrices with grazing-emission X-ray fluorescence spectrometry”. Claes M, van Dyck K, Deelstra H, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 54, 1517 (1999). http://doi.org/10.1016/S0584-8547(99)00098-1
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Quantification in grazing-emission X-ray fluorescence spectrometry”. Spolnik ZM, Claes M, Van Grieken RE, de Bokx PK, Urbach HP, Spectrochimica acta: part B : atomic spectroscopy 54, 1525 (1999). http://doi.org/10.1016/S0584-8547(99)00051-8
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Localised and non-destructive analysis of metallic artefacts from ancient Egypt by means of a compact μ-XRF instrument”. Vittiglio G, Janssens K, Adams F, Oost A, Spectrochimica acta: part B : atomic spectroscopy 54, 1697 (1999). http://doi.org/10.1016/S0584-8547(99)00100-7
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Monte Carlo simulation of X-ray fluorescence spectra: part 4: photon scattering at high X-ray energies”. Vincze L, Janssens K, Vekemans B, Adams F, Spectrochimica acta: part B : atomic spectroscopy , 1711 (1999). http://doi.org/10.1016/S0584-8547(99)00094-4
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Enhancement of X-ray fluorescence intensity from an ultra-thin sandwiched layer at grazing-emission angles”. Tsuji K, Takenaka H, Wagatsuma K, de Bokx PK, Van Grieken RE, Spectrochimica acta: part B : atomic spectroscopy 54, 1881 (1999). http://doi.org/10.1016/S0584-8547(99)00143-3
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Interpretation and use of inter-element correlation graphs obtained by scanning X-ray fluorescence micro-beam spectrometry from individual particles: part 1: theory”. Somogyi A, Janssens K, Vincze L, Vekemans B, Rindby A, Adams F, Spectrochimica acta: part B : atomic spectroscopy 55, 75 (2000). http://doi.org/10.1016/S0584-8547(99)00172-X
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Description of the argon-excited levels in a radio-frequency and direct current glow discharge”. Bogaerts A, Gijbels R, Spectrochimica acta: part B : atomic spectroscopy 55, 263 (2000). http://doi.org/10.1016/S0584-8547(00)00143-9
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Behavior of the sputtered copper atoms, ions and excited species in a radio-frequency and direct current glow discharge”. Bogaerts A, Gijbels R, Spectrochimica acta: part B : atomic spectroscopy 55, 279 (2000). http://doi.org/10.1016/S0584-8547(00)00142-7
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The use of synchrotron micro-XRF for characterisation of the micro-heterogeneity of low-Z reference materials”. Kempenaers L, Vincze L, Janssens K, Spectrochimica acta: part B : atomic spectroscopy 55, 651 (2000). http://doi.org/10.1016/S0584-8547(00)00207-X
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Comparison of grazing-exit particle-induced X-ray emission with other related methods”. Tsuji K, Huisman M, Spolnik Z, Wagatsuma K, Mori Y, Van Grieken RE, Vis RD, Spectrochimica acta: part B : atomic spectroscopy 55, 1009 (2000). http://doi.org/10.1016/S0584-8547(00)00148-8
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Quantitative characterization of individual aerosol particles by thin-window electron probe microanalysis combined with iterative simulation”. Szalóki I, Osán J, Ro C-U, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 55, 1017 (2000). http://doi.org/10.1016/S0584-8547(00)00174-9
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Application of energy dispersive X-ray spectrometry for quantitative evaluation of sorption phenomena at solid-liquid interfaces”. Szalóki I, Varga K, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 55, 1031 (2000). http://doi.org/10.1016/S0584-8547(00)00175-0
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Interpretation and use of inter-element correlation graphs obtained by scanning X-ray fluorescence micro-beam spectrometry from individual particles: part 2: application”. Somogyi A, Janssens K, Vincze L, Vekemans B, Rindby A, Adams F, Spectrochimica acta: part B : atomic spectroscopy 55, 1039 (2000). http://doi.org/10.1016/S0584-8547(00)00220-2
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Comparison of calculated and measured optical emission intensities in a direct current argon-copper glow discharge”. Bogaerts A, Donko Z, Kutasi K, Bano G, Pinhao N, Pinheiro M, Spectrochimica acta: part B : atomic spectroscopy 55, 1465 (2000). http://doi.org/10.1016/S0584-8547(00)00253-6
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