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Author Yasuda, K.; Hisatsune, K.; Udoh, K.; Tanaka, Y.; Van Tendeloo, G.; van Landuyt, J.
  Title Characteristic mosaic texture related to orderingin AuCu-9at.%Ag pseudobinary alloy Type A3 Journal article
  Year 1992 Publication Dentistry in Japan Abbreviated Journal
  Volume 29 Issue Pages 91-102
  Keywords A3 Journal article; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Tokyo Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0070-3737 ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved PHYSICS, APPLIED 28/145 Q1 #
  Call Number UA @ lucian @ c:irua:4105 Serial 313
Permanent link to this record
 

 
Author Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R.
  Title Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging Type P3 Proceeding
  Year 1991 Publication Abbreviated Journal
  Volume Issue Pages
  Keywords P3 Proceeding; Electron microscopy for materials research (EMAT); Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication St. Paul, Minn. Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved
  Call Number UA @ lucian @ c:irua:710 Serial 320
Permanent link to this record
 

 
Author Schryvers, D.; Goessens, C.; van Renterghem, W.; van Landuyt, J.; de Keyzer, R.
  Title Conventional and HREM study of structural defects in nanostructured silver halides Type P3 Proceeding
  Year 1998 Publication Abbreviated Journal
  Volume Issue Pages 1-6
  Keywords P3 Proceeding; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Antwerpen Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:29681 Serial 509
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Author van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R.
  Title Defects in AgCl and AgBr(100) tabular crystals studied by TEM Type P3 Proceeding
  Year 1998 Publication Abbreviated Journal
  Volume Issue Pages 6-11
  Keywords P3 Proceeding; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Antwerpen Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:29680 Serial 628
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Author Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S.
  Title Electron microscopy of fullerenes and fullerene related structures Type P3 Proceeding
  Year 1994 Publication Abbreviated Journal
  Volume Issue Pages 498-513
  Keywords P3 Proceeding; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Electrochemical Society Place of Publication s.l. Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:10009 Serial 960
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Author Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J.
  Title Electron microscopy of interfaces in new materials Type H3 Book chapter
  Year 1991 Publication Abbreviated Journal
  Volume Issue Pages 200-209
  Keywords H3 Book chapter; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication s.l. Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:48353 Serial 962
Permanent link to this record
 

 
Author Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G.
  Title Electron microscopy: principles and fundamentals Type ME1 Book as editor or co-editor
  Year 1997 Publication Abbreviated Journal
  Volume Issue Pages
  Keywords ME1 Book as editor or co-editor; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Vch Place of Publication Weinheim Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN 3-527-29479-1 Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:22089 Serial 967
Permanent link to this record
 

 
Author Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Kononenko, T.V.; Obraztsova, E.D.; Strelnitsky, V.E.
  Title Formation of diamond nanocrystals in laser-irradiated amorphous carbon films Type P3 Proceeding
  Year 1994 Publication International Conference on the New Diamond Science and Technology Abbreviated Journal
  Volume 4 Issue Pages 25-29
  Keywords P3 Proceeding; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:10059 Serial 1259
Permanent link to this record
 

 
Author Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.
  Title Graphene textures: tubules and whiskers related to fullerene crystallography Type A1 Journal article
  Year 1993 Publication Acta crystallographica: section A: foundations of crystallography Abbreviated Journal Acta Crystallogr A
  Volume 49 Issue Pages 355
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Copenhagen Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0108-7673 ISBN Additional Links UA library record
  Impact Factor 2.307 Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:6842 Serial 1378
Permanent link to this record
 

 
Author Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G.
  Title Handbook of microscopy: applications in materials science, solid-state physics and chemistry Type ME1 Book as editor or co-editor
  Year 1997 Publication Abbreviated Journal
  Volume Issue Pages
  Keywords ME1 Book as editor or co-editor; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Vch Place of Publication Weinheim Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN 3-527-29280-2 Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:21417 Serial 1407
Permanent link to this record
 

 
Author van Landuyt, J.; Vanhellemont, J.
  Title High-resolution electron microscopy for semiconducting materials science Type H3 Book chapter
  Year 1994 Publication Abbreviated Journal
  Volume Issue Pages 1109-1147
  Keywords H3 Book chapter; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Elsevier Place of Publication Amsterdam Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:10008 Serial 1449
Permanent link to this record
 

 
Author De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.
  Title How to interpret short-range order HREM images Type P3 Proceeding
  Year 1996 Publication Abbreviated Journal
  Volume Issue Pages
  Keywords P3 Proceeding; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Dublin Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:110168 Serial 1493
Permanent link to this record
 

 
Author van Landuyt, J.; Van Tendeloo, G.
  Title HREM for characterisation of nanoscale microstructures Type P3 Proceeding
  Year 1998 Publication Abbreviated Journal
  Volume Issue Pages 15-18
  Keywords P3 Proceeding; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Kyoto Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:25687 Serial 1499
Permanent link to this record
 

 
Author Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Tanner, L.E.
  Title HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys Type A3 Journal article
  Year 1994 Publication Icem Abbreviated Journal
  Volume 13 Issue Pages 659-662
  Keywords A3 Journal article; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:10051 Serial 1501
Permanent link to this record
 

 
Author Bernaerts, D.; Zhang, X.B.; Zhang, X.F.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S.
  Title HREM study of Rb6C60 and helical carbon nanotubules Type A3 Journal article
  Year 1994 Publication Icem Abbreviated Journal
  Volume 13 Issue Pages 305-306
  Keywords A3 Journal article; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved COMPUTER SCIENCE, INTERDISCIPLINARY 11/104 Q1 # PHYSICS, MATHEMATICAL 1/53 Q1 #
  Call Number UA @ lucian @ c:irua:10056 Serial 1514
Permanent link to this record
 

 
Author Goessens, C.; Schryvers, D.; de Keyzer, R.; van Landuyt, J.
  Title In situ HREM study of electron irradiation effects in AgCl microcrystals Type H3 Book chapter
  Year 1992 Publication Abbreviated Journal
  Volume Issue Pages 646-650
  Keywords H3 Book chapter; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Eurem 92 Place of Publication Granada Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:4100 Serial 1580
Permanent link to this record
 

 
Author Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.
  Title Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation Type H3 Book chapter
  Year 1997 Publication Abbreviated Journal
  Volume Issue Pages 63-92
  Keywords H3 Book chapter; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Kluwer Academic Place of Publication s.l. Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:21412 Serial 1718
Permanent link to this record
 

 
Author Frangis, N.; Nejim, A.; Hemment, P.L.F.; Stoemenos, J.; van Landuyt, J.
  Title Ion beam synthesis of β-SiC at 9500C and structural characterization Type A3 Journal article
  Year 1996 Publication Nuclear instruments and methods in physics research Abbreviated Journal
  Volume B112 Issue Pages 325-329
  Keywords A3 Journal article; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Amsterdam Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0167-5087 ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:15454 Serial 1740
Permanent link to this record
 

 
Author van Landuyt, J.; Kuypers, S.; van Heurck, C.; Van Tendeloo, G.; Amelinckx, S.
  Title Methods of structural analysis of modulated structures and quasicrystals Type H3 Book chapter
  Year 1993 Publication Abbreviated Journal
  Volume Issue Pages 205-224
  Keywords H3 Book chapter; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication s.l. Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:6781 Serial 2018
Permanent link to this record
 

 
Author Amelinckx, S.; Bernaerts, D.; Van Tendeloo, G.; van Landuyt, J.; Lucas, A.A.; Mathot, M.; Lambin, P.
  Title The morphology, structure and texture of carbon nanotubes: an electron microscopy study Type P3 Proceeding
  Year 1995 Publication Abbreviated Journal
  Volume Issue Pages 515-541
  Keywords P3 Proceeding; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher World Scientific Place of Publication Singapore Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:13294 Serial 2207
Permanent link to this record
 

 
Author Takeda, M.; Shinohara, G.; Yamada, H.; Yoshida, S.; van Landuyt, J.; Hashimoto, H.
  Title Precipitation behavior in Cu-Co alloy Type P3 Proceeding
  Year 1998 Publication Abbreviated Journal
  Volume Issue Pages 205-206
  Keywords P3 Proceeding; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Kyoto Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:29682 Serial 2689
Permanent link to this record
 

 
Author Bernaerts, D.; Amelinckx, S.; Zhang, X.B.; Van Tendeloo, G.; van Landuyt, J.
  Title Structural aspects of carbon nanotubes Type P3 Proceeding
  Year 1995 Publication Abbreviated Journal
  Volume Issue Pages 551-555
  Keywords P3 Proceeding; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher World Scientific Place of Publication Singapore Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved
  Call Number UA @ lucian @ c:irua:13295 Serial 3206
Permanent link to this record
 

 
Author Milat, O.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S.
  Title Superlattice variants in Sr2CuO2(CO3): an electron microscopy study Type A1 Journal article
  Year 1993 Publication Acta crystallographica: section A: foundations of crystallography Abbreviated Journal Acta Crystallogr A
  Volume 49 Issue Pages 357
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Copenhagen Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0108-7673 ISBN Additional Links UA library record
  Impact Factor 2.307 Times cited Open Access
  Notes Approved PHYSICS, APPLIED 28/145 Q1 #
  Call Number UA @ lucian @ c:irua:6841 Serial 3379
Permanent link to this record
 

 
Author van Landuyt, J.
  Title Een tempel voor elektronenmicroscopie “kijken naar atomen” Type A3 Journal article
  Year 1998 Publication Fonds informatief Abbreviated Journal
  Volume 38 Issue Pages 13-17
  Keywords A3 Journal article; Electron microscopy for materials research (EMAT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Antwerpen Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0776-8133 ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:29673 Serial 3495
Permanent link to this record
 

 
Author Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R.
  Title A temperature study of mixed AgBr-AgBrI tabular crystals Type P3 Proceeding
  Year 1992 Publication Abbreviated Journal
  Volume Issue Pages 36-39
  Keywords P3 Proceeding; Electron microscopy for materials research (EMAT); Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Hawaii Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved PHYSICS, APPLIED 47/145 Q2 #
  Call Number UA @ lucian @ c:irua:4201 Serial 3502
Permanent link to this record
 

 
Author Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K.
  Title Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation Type A1 Journal article
  Year 2001 Publication Institute of physics conference series Abbreviated Journal
  Volume Issue 169 Pages 481-484
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
  Abstract With further down-scaling below 0.25mum technologies, CoSi2 is replacing TiSi2 because of its superior formation chemistry on narrow lines and favourable stress behaviour. Shallow trench isolation (STI) is used as the isolation technique in these technologies. In this study, convergent beam electron diffraction (CBED) measurements and finite element modelling (FEM) are performed to evaluate the local stress components in the silicon substrate, induced in STI structures with a 45 nm or a 85 nm CoSi2 silicidation. High compressive stresses in the active area and tensile stress around the trench corners are observed.
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0-7503-0818-4 ISBN Additional Links UA library record; WoS full record;
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:95163 Serial 311
Permanent link to this record
 

 
Author De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C.
  Title Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy Type P1 Proceeding
  Year 2002 Publication Abbreviated Journal
  Volume Issue Pages 183-194
  Keywords P1 Proceeding; Electron microscopy for materials research (EMAT)
  Abstract Infrared absorption spectra of oxygen precipitates in boron doped silicon with a boron concentration between 10(17) and 10(19) cm(-3) are analyzed, applying the spectral function theory of the composite precipitates. The aspect ratio of the platelet precipitates has been determined by transmission electron microscopy measurements. Our analysis shows that in samples with moderate doping levels (<10(18) B cm(-3)) SiOgamma precipitates are formed with stoichiometry as in the lightly doped case. In the heavily (>10(18) cm(-3)) boron doped samples, however, the measured spectra of the precipitates are consistent with a mixture of SiO2 and B2O3. with a volume fraction of B2O3 as high as 0.41 in the most heavily doped case.
  Address
  Corporate Author Thesis
  Publisher Place of Publication S.l. Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 1-56677-344-X ISBN Additional Links UA library record; WoS full record;
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:94950 Serial 344
Permanent link to this record
 

 
Author Hens, S.; Bender, H.; Donaton, R.A.; Maex, K.; Vanhaelemeersch, S.; van Landuyt, J.
  Title EFTEM study of plasma etched low-k Si-O-C dielectrics Type A1 Journal article
  Year 2001 Publication Institute of physics conference series T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND Abbreviated Journal
  Volume Issue 169 Pages 415-418
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
  Abstract Materials with low dielectric constant ("low-k'') in combination with Cu metallization are replacing the oxide based dielectrics with Al metallization in future generations of micro-electronic devices. In this work, a carbon doped oxide low-k dielectric material is studied after different kinds of etch/strip steps in single damascene Cu. filled line structures. Interline capacitance measurements indicate a dependence of the dielectric constant on the strip conditions. EFTEM is used to study the composition of the dielectric material and the modification of the low-k material at the sidewall of the etched structures for the various treatment conditions.
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0-7503-0818-4; 0951-3248 ISBN Additional Links UA library record; WoS full record;
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:103432 Serial 877
Permanent link to this record
 

 
Author Nistor, L.; Bender, H.; van Landuyt, J.; Nemeth, S.; Boeve, H.; De Boeck, J.; Borghs, G.
  Title HREM investigation of a Fe/GaN/Fe tunnel junction Type A1 Journal article
  Year 2001 Publication Institute of physics conference series T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England Abbreviated Journal
  Volume Issue 169 Pages 53-56
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
  Abstract The structure of Fe/GaN/Fe ferromagnetic electrodes is studied by high resolution transmission electron microscopy. The layers grow epitaxially on the GaAs substrate with the top Fe layer 90degrees rotated compared to the bottom one. The interfaces are quite rough. There is an indication of the possible occurrence of Fe3GaAs formation on the GaAs interface.
  Address
  Corporate Author Thesis
  Publisher IOP Publishing Place of Publication Bristol Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0-7503-0818-4 ISBN Additional Links UA library record; WoS full record;
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:95715 Serial 1503
Permanent link to this record
 

 
Author van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R.
  Title The influence of crystal thickness on the image tone Type A1 Journal article
  Year 2003 Publication Journal of imaging science Abbreviated Journal J Imaging Sci Techn
  Volume 47 Issue 2 Pages 133-138
  Keywords A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
  Abstract It is known that the neutral image tone of a developed photographic film becomes brownish when the thickness of the original silver halide tabular crystals is reduced. We investigate by electron microscopy to what extent the silver filament structure has changed and how it induces the shift in image tone. Therefore, two samples of AgBr {111} tabular crystals with average thicknesses of 160 nm and 90 nm respectively, are compared. It is shown that the dimensions and defect structure of the filaments are comparable, but that the 90 nm crystals result in a more widely spaced structure, which explains the shift in image tone on a qualitative level. The influence of the addition of an image toner, i.e., phenylmercaptotetrazole, on the filament structure is also investigated. An even more open filament structure of longer, but smaller filaments was observed.
  Address
  Corporate Author Thesis
  Publisher Place of Publication Springfield, Va Editor
  Language Wos (up) Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 8750-9237; 1062-3701 ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor 0.348 Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:48384 Serial 1619
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