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Author | Verbeeck, J.; Van Aert, S. | ||||
Title | Model based quantification of EELS spectra | Type | A1 Journal article | ||
Year | 2004 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
Volume | 101 | Issue | 2/4 | Pages | 207-224 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | Recent advances in model based quantification of electron energy loss spectra (EELS) are reported. The maximum likelihood method for the estimation of physical parameters describing an EELS spectrum, the validation of the model used in this estimation procedure, and the computation of the attainable precision, that is, the theoretical lower bound on the variance of these estimates, are discussed. Experimental examples on An and GaAs samples show the power of the maximum likelihood method and show that the theoretical prediction of the attainable precision can be closely approached even for spectra with overlapping edges where conventional EELS quantification fails. To provide end-users with a low threshold alternative to conventional quantification, a user friendly program was developed which is freely available under a GNU public license. (C) 2004 Elsevier B.V. All rights reserved. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000224046100016 | Publication Date | 2004-07-23 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.843 | Times cited | 147 | Open Access | |
Notes | Fwo; Iuap P5/01 | Approved | Most recent IF: 2.843; 2004 IF: 2.215 | ||
Call Number | UA @ lucian @ c:irua:57130UA @ admin @ c:irua:57130 | Serial | 2101 | ||
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