| Home | << 1 >> |
|
| Record | |||||
|---|---|---|---|---|---|
| Author | Montoya, E.; Bals, S.; Van Tendeloo, G. | ||||
| Title | Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam | Type | A1 Journal article | ||
| Year | 2008 | Publication | Journal of microscopy | Abbreviated Journal | J Microsc-Oxford |
| Volume | 231 | Issue | 3 | Pages | 359-363 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Oxford | Editor | ||
| Language | Wos  |
000259611000001 | Publication Date | 2008-08-28 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0022-2720;1365-2818; | ISBN | Additional Links | UA library record; WoS full record | |
| Impact Factor | 1.692 | Times cited | Open Access | ||
| Notes | The authors are grateful to M. Huijben and G. Rijnders of the MESA+ group at the University of Twente (NI) for the growth of the multilayers. This work has been performed under the Interuniversity Attraction Poles programme – Belgian State Belgian Science Policy. The authors acknowledge financial support from the European Union under the framework 6 program under a contract for an Integrated Infrastructure initiative. Part of this work was performed with financial support from the European Union under the framework 6 programme, under a contract for an Integrated Infrastructure Initiative (Reference No. 02601.9 ESTEEM). | Approved | Most recent IF: 1.692; 2008 IF: 1.409 | ||
| Call Number | UA @ lucian @ c:irua:76522 | Serial | 2849 | ||
| Permanent link to this record | |||||