|
|
“First evidence of synthetic polygonal serpentines”. Devouard B, Baronnet A, Van Tendeloo G, Amelinckx S, European journal of mineralogy 9, 539 (1997)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.362
Times cited: 15
|
|
|
|
“The modulated structure in the melilite CA2ZnGe2O7”. van Heurck C, Van Tendeloo G, Amelinckx S, Physics and chemistry of minerals 8, 441 (1992). http://doi.org/10.1007/BF00200967
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.538
Times cited: 19
DOI: 10.1007/BF00200967
|
|
|
|
“Effect of the substitution Ba\leftrightarrow Sr on the Ga-1222 superstructure : an electron diffraction study”. Milat O, Van Tendeloo G, Amelinckx S, Wright AJ, Greaves C, Chemistry of materials 7, 1709 (1995). http://doi.org/10.1021/cm00057a021
Abstract: The superstructure of the RE(2)(Sr0.85-xBaxNd0.15)(2)GaCU2O9 compound is found to change significantly with increasing substitution of Ba for Sr. Most of the changes take place in the (Sr0.85-xBaxNd0.15)O-GaO-(Sr0.85-xBaxNd0.15)O lamella, the rest of the basic structure being hardly affected. The structural changes for O less than or equal to x less than or equal to 0.65 are studied by electron diffraction. The arrangement of the chains of GaO4 tetrahedra in the Ba-free compound becomes disordered at x > 0.25. At x similar to 0.65 a rearrangement of the chains in the GaO layers takes place; they form a meandering arrangement, which can be described on a 4a(p) x 2a(p) x c(p) superlattice. This rearrangement is accompanied by ordering of Ba and Sr atoms in the adjacent (ST0.85-xBaxNd0.15)O layers. A simple scheme is proposed to explain the influence of the substitution of Ba for Sr on the linking of the GaO4 tetrahedra and on the geometry of the ''chains'' in the GaO layer.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 8.354
DOI: 10.1021/cm00057a021
|
|
|
|
“Structural studies on superconducting materials and fullerites by electron microscopy”. Van Tendeloo G, Amelinckx S, Advanced materials 5, 620 (1993). http://doi.org/10.1002/adma.19930050904
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 17.493
Times cited: 2
DOI: 10.1002/adma.19930050904
|
|
|
|
“The study of high Tc-superconducting materials by electron microscopy and electron diffraction”. Amelinckx S, Van Tendeloo G, van Landuyt J, Superconductor science and technology
T2 –, SATELLITE CONF TO THE 19TH INTERNATIONAL CONF ON LOW TEMPERATURE PHYSICS : HIGH TEMPERATURE SUPERCONDUCTIVITY, AUG 13-15, 1990, QUEENS COLL, CAMBRIDGE, ENGLAND 4, S19 (1991). http://doi.org/10.1088/0953-2048/4/1S/003
Abstract: A survey is given of the application of different electron microscopic techniques to the study of structural features of high T(c)-superconducting materials. Emphasis is laid in this contribution on those structural aspects for the study of which electron microscopy has been essential or has contributed to a significant extent.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.325
Times cited: 2
DOI: 10.1088/0953-2048/4/1S/003
|
|
|
|
“Misfit accommodation of epitaxial La1-xAxMnO3 (A=Ca, Sr) thin films”. Lebedev OI, Van Tendeloo G, Amelinckx S, International journal of inorganic materials 3, 1331 (2001). http://doi.org/10.1016/S1466-6049(01)00155-6
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 2
DOI: 10.1016/S1466-6049(01)00155-6
|
|
|
|
“Ordering principles for tetrahedral chains in Ga- and Co-substituted YBCO intergrowths”. Milat O, Krekels T, Van Tendeloo G, Amelinckx S, Journal de physique: 1: physique générale, physique statistique, matière condensée, domaines interdisciplinaires 3, 1219 (1993)
Abstract: A model for superstructure ordering in the <<chain>> layers of Ga (Co) substituted YBCO intergrowths with general formula (REO2)NSr2MCu2O5 (M = Co, Ga; n = 1, 2, ...) is proposed. By Ga or Co substitution for Cu, the structure of the <<chain>> layer changes : instead of the CuO4 planar squares, the chains consist of MO4 tetrahedra (M = Ga, Co) running along the [110] perovskite direction. The existing model for the Ga substituted <<123>> implies that all the chains are the same. Our new model is based on the results of Electron diffraction and High-resolution electron microscopy investigations. The model reveals the occurrence of two types of chains as a consequence of <<opposite>> ordering between neighbouring tetrahedra. The comer linked tetrahedra in each chain appear as alternatingly rotated in opposite sense, and a chain itself, as being displaced with respect to the underlying structure in one of two senses ; either forth (right) or back (left) along the chain direction. The regular alternation of chains of opposite type doubles the periodicity within a layer and induces the possibility for intrinsic disorder in the chain layer stacking sequence. The planar superstructure and a staggered stacking of the tetrahedral chain layers is found irrespective of the rest of the intergrowth structure. Superstructure ordering in the case of Co substitution is more perfect than for the Ga substitution.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 16
|
|
|
|
“Aerosol synthesis of nanostructured, ultrafine fullerene particles”. Joutsensaari J, Ahonen PP, Tapper U, Kauppinen EI, Pauwels B, Amelinckx S, Van Tendeloo G, (1999)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Atomic resolution of interfaces in ceramic-superconductors”. Van Tendeloo G, Krekels T, Amelinckx S, Hervieu M, Raveau B, Greaves C, , 35 (1995)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging”. Goessens C, Schryvers D, van Landuyt J, Amelinckx S, Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, (1991)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT); Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
|
|
|
|
“Crystallization of fullerene nanopraticles in an aerosol flow reactor”. Joutsensaari J, Ahonen PP, Tapper U, Kauppinen EI, Pauwels B, Amelinckx S, Van Tendeloo G, (1999)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Electron microscopic study of long period ordering in complex oxides”. Amelinckx S, Nistor LC, Van Tendeloo G s.l., page 1 (1994).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
|
|
|
|
“Electron microscopy and scanning microanalysis”. Oleshko V, Gijbels R, Amelinckx S Wiley, Chichester, page 9088 (2000).
Keywords: H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
|
|
|
|
“Electron-microscopy and the structural studies of superconducting materials and fullerites”. Van Tendeloo G, Amelinckx S, NATO Advanced Study Institutes series: series E : applied sciences
T2 –, NATO Advanced Study Institute on Materials and crystallographic Aspects, of HT(c)-Superconductivity, May 17-30, 1993, Erice, Italy , 521 (1994)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis”. Oleshko VP, Gijbels R, Amelinckx S Wiley, Chichester, page 1 (2013).
Keywords: H1 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
|
|
|
|
“Electron microscopy of fullerenes and fullerene related structures”. Van Tendeloo G, van Landuyt J, Amelinckx S, , 498 (1994)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Electron microscopy of fullerenes and related materials”. Van Tendeloo G, Amelinckx S Wiley-VCH, Weinheim, page 353 (2000).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
|
|
|
|
“Electron microscopy of C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S Springer, Berlin, page 182 (1993).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
|
|
|
|
Amelinckx S, van Dyck D, van Landuyt J, Van Tendeloo G (1997) Electron microscopy: principles and fundamentals. Vch, Weinheim
Keywords: ME1 Book as editor or co-editor; Electron microscopy for materials research (EMAT); Vision lab
|
|
|
|
Amelinckx S, van Dyck D, van Landuyt J, Van Tendeloo G (1997) Handbook of microscopy: applications in materials science, solid-state physics and chemistry. Vch, Weinheim
Keywords: ME1 Book as editor or co-editor; Electron microscopy for materials research (EMAT); Vision lab
|
|
|
|
“HREM investigation of La(1-x)Ca(x)MnO3-delta thin films”. Lebedev O, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier HU, , 517 (1998)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“HREM investigation of La1-xCaxMnO3- thin films”. Lebedev OI, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier H-U, Electron microscopy: vol. 2 , 517 (1998)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
|
|
|
|
“HREM study of Rb6C60 and helical shaped carbon nanotubules”. Bernaerts D, Zhang X, Zhang X, Van Tendeloo G, Vanlanduyt J, Amelinckx S, Sciences , 305 (1994)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Methods of structural analysis of modulated structures and quasicrystals”. van Landuyt J, Kuypers S, van Heurck C, Van Tendeloo G, Amelinckx S s.l., page 205 (1993).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
|
|
|
|
“Micro-structure of fullerites and high Tc superconductors”. Van Tendeloo G, Krekels T, Amelinckx S Granada, page 17 (1992).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
|
|
|
|
“The morphology, structure and texture of carbon nanotubes: an electron microscopy study”. Amelinckx S, Bernaerts D, Van Tendeloo G, van Landuyt J, Lucas AA, Mathot M, Lambin P, , 515 (1995)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Ordering and defects in BanTaxTiyO3n ternary oxides”. Nistor L, Van Tendeloo G, Amelinckx S, Shpanchenko RV, van Landuyt J, Electron Microscopy 1994, Vols 2a And 2b: Applications In Materials Sciences , 869 (1994)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Reduced dimensionality in different forms of carbon”. Van Tendeloo G, Bernaerts D, Amelinckx S, Fullerenes and carbon based materials , 487 (1998)
Abstract: Several TEM techniques are used to characterise the local structure of low dimensional forms of carbon. HREM is particularly useful to describe the defect structure of thin films of diamond or fullerenes and C-60-C-70 nanoclusters. A columnar form of graphite is analysed, mainly by electron diffraction which allowed us to propose a growth mechanism. Diffraction contrast dark field microscopy, in combination with electron diffraction, allows a detailed characterisation of carbon nanotubes; e.g. the chirality distribution of tubes in ropes of single wall tubes is studied by selected area electron diffraction. (C) 1998 Elsevier Science Ltd. All rights reserved.
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“The selective imaging of “substructures&rdquo, in the mixed layer compounds Ca0.85CuO2 and (Ca,Sr)14Cu24O41”. Amelinckx S, Milat O, Van Tendeloo G, , 240 (1992)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
|
“Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM”. Lebedev OI, Van Tendeloo G, Amelinckx S s.l., page 201 (2000).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
|
|
