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A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM”. Van den Broek W, Rosenauer A, Van Aert S, Sijbers J, van Dyck D, Ultramicroscopy 141, 22 (2014). http://doi.org/10.1016/j.ultramic.2014.03.008
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Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy”. Martinez GT, Rosenauer A, de Backer A, Verbeeck J, Van Aert S, Ultramicroscopy 137, 12 (2014). http://doi.org/10.1016/j.ultramic.2013.11.001
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Creating arrays of electron vortices”. Niermann T, Verbeeck J, Lehmann M, Ultramicroscopy 136, 165 (2014). http://doi.org/10.1016/j.ultramic.2013.10.002
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Dynamic scattering theory for dark-field electron holography of 3D strain fields”. Lubk A, Javon E, Cherkashin N, Reboh S, Gatel C, Hytch M, Ultramicroscopy 136, 42 (2014). http://doi.org/10.1016/j.ultramic.2013.07.007
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Is magnetic chiral dichroism feasible with electron vortices?”.Schattschneider P, Löffler S, Stöger-Pollach M, Verbeeck J, Ultramicroscopy 136, 81 (2014). http://doi.org/10.1016/j.ultramic.2013.07.012
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Quantitative electron tomography : the effect of the three-dimensional point spread function”. Heidari H, van den Broek W, Bals S, Ultramicroscopy 135, 1 (2013). http://doi.org/10.1016/j.ultramic.2013.06.005
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Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations”. de Backer A, Martinez GT, Rosenauer A, Van Aert S, Ultramicroscopy 134, 23 (2013). http://doi.org/10.1016/j.ultramic.2013.05.003
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Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits?”.den Dekker AJ, Gonnissen J, de Backer A, Sijbers J, Van Aert S, Ultramicroscopy 134, 34 (2013). http://doi.org/10.1016/j.ultramic.2013.05.017
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Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays”. Dunin-Borkowski RE, Lichte H, Tillmann K, Van Aert S, Van Tendeloo G, Ultramicroscopy 134, 1 (2013). http://doi.org/10.1016/j.ultramic.2013.07.013
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An alternative approach to determine attainable resolution directly from HREM images”. Wang A, Turner S, Van Aert S, van Dyck D, Ultramicroscopy 133, 50 (2013). http://doi.org/10.1016/j.ultramic.2013.05.008
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Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography”. Béché, A, Rouviere JL, Barnes JP, Cooper D, Ultramicroscopy 131, 10 (2013). http://doi.org/10.1016/j.ultramic.2013.03.014
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Advanced reconstruction algorithms for electron tomography : from comparison to combination”. Goris B, Roelandts T, Batenburg KJ, Heidari Mezerji H, Bals S, Ultramicroscopy 127, 40 (2013). http://doi.org/10.1016/j.ultramic.2012.07.003
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Statistical consequences of applying a PCA noise filter on EELS spectrum images”. Lichtert S, Verbeeck J, Ultramicroscopy 125, 35 (2013). http://doi.org/10.1016/j.ultramic.2012.10.001
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A holographic method to measure the source size broadening in STEM”. Verbeeck J, Béché, A, van den Broek W, Ultramicroscopy 120, 35 (2012). http://doi.org/10.1016/j.ultramic.2012.05.007
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Improved multislice calculations for including higher-order Laue zones effects”. Lobato I, van Dyck D, Ultramicroscopy 119, 63 (2012). http://doi.org/10.1016/j.ultramic.2012.01.003
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Correction of non-linear thickness effects in HAADF STEM electron tomography”. van den Broek W, Rosenauer A, Goris B, Martinez GT, Bals S, Van Aert S, van Dyck D, Ultramicroscopy 116, 8 (2012). http://doi.org/10.1016/j.ultramic.2012.03.005
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Direct structure inversion from exit waves : part 2 : a practical example”. Wang A, Chen FR, Van Aert S, van Dyck D, Ultramicroscopy 116, 77 (2012). http://doi.org/10.1016/j.ultramic.2012.03.011
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Oxidation state and chemical shift investigation in transition metal oxides by EELS”. Tan H, Verbeeck J, Abakumov A, Van Tendeloo G, Ultramicroscopy 116, 24 (2012). http://doi.org/10.1016/j.ultramic.2012.03.002
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Sub-nanometer free electrons with topological charge”. Schattschneider P, Stöger-Pollach M, Löffler S, Steiger-Thirsfeld A, Hell J, Verbeeck J, Ultramicroscopy 115, 21 (2012). http://doi.org/10.1016/j.ultramic.2012.01.010
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Accurate segmentation of dense nanoparticles by partially discrete electron tomography”. Roelandts T, Batenburg KJ, Biermans E, Kübel C, Bals S, Sijbers J, Ultramicroscopy 114, 96 (2012). http://doi.org/10.1016/j.ultramic.2011.12.003
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Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits?”.Wang A, Van Aert S, Goos P, van Dyck D, Ultramicroscopy 114, 20 (2012). http://doi.org/10.1016/j.ultramic.2011.12.002
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Electron tomography based on a total variation minimization reconstruction technique”. Goris B, van den Broek W, Batenburg KJ, Heidari Mezerji H, Bals S, Ultramicroscopy 113, 120 (2012). http://doi.org/10.1016/j.ultramic.2011.11.004
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A new way of producing electron vortex probes for STEM”. Verbeeck J, Tian H, Béché, A, Ultramicroscopy 113, 83 (2012). http://doi.org/10.1016/j.ultramic.2011.10.008
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Applying an information transmission approach to extract valence electron information from reconstructed exit waves”. Xu Q, Zandbergen HW, van Dyck D, Ultramicroscopy 111, 912 (2011). http://doi.org/10.1016/j.ultramic.2011.01.032
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Exploring different inelastic projection mechanisms for electron tomography”. Goris B, Bals S, van den Broek W, Verbeeck J, Van Tendeloo G, Ultramicroscopy 111, 1262 (2011). http://doi.org/10.1016/j.ultramic.2011.02.007
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High precision measurements of atom column positions using model-based exit wave reconstruction”. de Backer A, Van Aert S, van Dyck D, Ultramicroscopy 111, 1475 (2011). http://doi.org/10.1016/j.ultramic.2011.07.002
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A holographic biprism as a perfect energy filter?”.Verbeeck J, Bertoni G, Lichte H, Ultramicroscopy 111, 887 (2011). http://doi.org/10.1016/j.ultramic.2011.01.042
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A method to determine the local surface profile from reconstructed exit waves”. Wang A, Chen FR, Van Aert S, van Dyck D, Ultramicroscopy 111, 1352 (2011). http://doi.org/10.1016/j.ultramic.2011.04.005
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A practical method to determine the effective resolution in incoherent experimental electron tomography”. Heidari Mezerji H, van den Broek W, Bals S, Ultramicroscopy 111, 330 (2011). http://doi.org/10.1016/j.ultramic.2011.01.021
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Theory of free electron vortices”. Schattschneider P, Verbeeck J, Ultramicroscopy 111, 1461 (2011). http://doi.org/10.1016/j.ultramic.2011.07.004
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