| Records |
| Author |
Buydens, L.; van Espen, P.; Rutan, S. |
| Title |
CAC-2010 : Twelfth international conference on chemometrics in analytical chemistry |
Type |
Editorial |
| Year |
2011 |
Publication |
Analytica chimica acta |
Abbreviated Journal |
|
Volume  |
705 |
Issue |
1/2 |
Pages |
1 |
| Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
000295993900001 |
Publication Date |
2011-08-14 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0003-2670; 1873-4324 |
ISBN |
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Additional Links |
UA library record; WoS full record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
no |
| Call Number |
UA @ admin @ c:irua:93573 |
Serial |
7570 |
| Permanent link to this record |
| |
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| |
| Author |
Guttmann, P.; Bittencourt, C.; Ke, X.; Van Tendeloo, G.; Umek, P.; Arcon, D.; Ewels, C.P.; Rehbein, S.; Heim, S.; Schneider, G. |
| Title |
TXM-NEXAFS of TiO2-based nanostructures |
Type |
P1 Proceeding |
| Year |
2011 |
Publication |
AIP conference proceedings |
Abbreviated Journal |
|
| Volume |
1365 |
Issue |
|
Pages |
437-440 |
| Keywords |
P1 Proceeding; Electron microscopy for materials research (EMAT) |
| Abstract |
In this work, electronic properties of individual TiOx-pristine nanoribbons (NR) prepared by hydrothermal treatment of anatase TiO(2) micro-particles were studied using the HZB transmission x-ray microscope (TXM) at the BESSY II undulator beamline U41-FSGM. NEXAFS is ideally suited to study TiO(2)-based materials because both the O K-edge and Ti L-edge features are very sensitive to the local bonding environment, providing diagnostic information about the crystal structures and oxidation states of various forms of titanium oxides and sub-oxides. TXM-NEXAFS combines full-field x-ray microscopy with spectroscopy, allowing the study of the electronic structure of individual nanostructures with spatial resolution better than 25 nm and a spectral resolution of up to E/Delta E = 10000. The typical image field in TXM-NEXAFS measurements is about 10 mu m. 10 mu m, which is large compared to the individual nanoparticle. Therefore, one image stack already contains statistically significant data. In addition, the directional electric field vector ((E) over bar) of the x-rays can be used as a “search tool” for the direction of chemical bonds of the atom selected by its absorption edge. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
New York |
Editor |
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| Language |
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Wos |
000298672400103 |
Publication Date |
2011-09-19 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
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ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
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Times cited |
2 |
Open Access |
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| Notes |
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Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:113071 |
Serial |
3789 |
| Permanent link to this record |
