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Jaroszewicz, J.; de Nolf, W.; Janssens, K.; Claussen-Kjerre, L.; Lind, O.C.; Salbu, B.; Falkenberg, G. |
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Title |
Combined use of μ-XRF and μ-XRD for characterization of radioactive particle clusters released during the Chernobyl reactor incident |
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H3 Book chapter |
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Year |
2007 |
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H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:64599 |
Serial |
5523 |
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Author |
Jaroszewicz, J.; de Nolf, W.; Janssens, K.; Michalski, A.; Falkenberg, G. |
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Title |
Combined use of μ-XRF and μ-XRD to determine the heterogeneity, the chemical and phase composition of Ti-B-C ceramics prepared by the pulse plasma sintering (PPS) method |
Type |
H3 Book chapter |
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Year |
2007 |
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H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Call Number |
UA @ admin @ c:irua:64596 |
Serial |
5524 |
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Author |
Denecke, M.A.; Janssens, K.; Brendebach, B.; Falkenberg, G.; de Nolf, W.; Römer, J. |
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Title |
Confocal μ-XRF and μ-XAFS studies of fractured granite following a radiotracer migration experiment |
Type |
H3 Book chapter |
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Year |
2007 |
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H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:64600 |
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5550 |
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Author |
Denecke, M.A.; Janssens, K.; Brendebach, B.; Falkenberg, G.; Römer, J.; Simon, R.; Vekemans, B. |
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Title |
Confocal μ-XRF and μ-XAFS studies on fractured granite following a radiotracer migration experiment |
Type |
P3 Proceeding |
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Year |
2007 |
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Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:64602 |
Serial |
5551 |
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Author |
Alfeld, M.; Vekemans, B.; Janssens, K.; Falkenberg, G.; Broekaert, J.A.C.; Gao, N.; Gibson, D. |
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Title |
Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison |
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H3 Book chapter |
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Year |
2007 |
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H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:64598 |
Serial |
5572 |
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Author |
Janssens, K.; Vincze, L.; Wei, F.; Proost, K.; Vekemans, B.; Vittiglio, G.; Yan, Y.; Falkenberg, G. |
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Title |
Feasibility of (trace-level) micro-XANES at Beamline L |
Type |
H3 Book chapter |
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Year |
1999 |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:28442 |
Serial |
5622 |
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Author |
Dik, J.; Janssens, K.; van der Snickt, G.; Wallert, A.; Rickers, K.; Falkenberg, G. |
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Title |
High-E scanning m-XRF experiment on test paintings |
Type |
H3 Book chapter |
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Year |
2008 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1589-1590 |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:74469 |
Serial |
5638 |
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Author |
Terzano, R.; Spagnuolo, M.; Ruggiero, P.; Vekemans, B.; de Nolf, W.; Janssens, K.; Fiore, S.; Falkenberg, G. |
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Title |
Identification of the geochemical forms of CR, Zn, Ni, Pb, V, and Cu in an industrial polluted soil by combined μ-XRF/μ-XRD and μ-XANES |
Type |
H3 Book chapter |
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Year |
2008 |
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Abbreviated Journal |
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H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:64594 |
Serial |
5651 |
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Author |
de Nolf, W.; Vekemans, B.; Janssens, K.; van der Snickt, G.; Falkenberg, G. |
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Title |
Pigment identification by scanning μ-XRF/μ-XRD |
Type |
H3 Book chapter |
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Year |
2007 |
Publication |
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Abbreviated Journal |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:64595 |
Serial |
5773 |
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Author |
Terzano, R.; Spagnuolo, M.; Ruggiero, P.; Vekemans, B.; Scoonjans, T.; Vincze, L.; Janssens, K.; Tomasi, N.; Cesco, S.; Falkenberg, G. |
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Title |
Quantitative Fe determination inside tomato roots by confocal μ-XRF |
Type |
H3 Book chapter |
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Year |
2008 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1513-1514 |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:74468 |
Serial |
5794 |
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Permanent link to this record |
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Author |
Lind, O.-C.; Salbu, B.; de Nolf, W.; Jaroszewicz, J.; Janssens, K.; Falkenberg, G. |
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Title |
Reexamination of U and Pu in particles from Thule and Palomares by μ-XRD |
Type |
H3 Book chapter |
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Year |
2008 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1297-1298 |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:74474 |
Serial |
5810 |
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Permanent link to this record |
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Author |
de Nolf, W.; Janssens, K.; Rouchon, V.; Falkenberg, G. |
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Title |
Study of the degradation on historical documents induced by iron gall ink by means of scanning μ-XRF/μ-XRD |
Type |
H3 Book chapter |
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Year |
2007 |
Publication |
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Abbreviated Journal |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Additional Links |
UA library record |
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Open Access |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:64597 |
Serial |
5850 |
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Permanent link to this record |
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Author |
Vincze, L.; Janssens, K.; Wei, F.; Proost, K.; Vekemans, B.; Vittiglio, G.; Yan, Y.; Falkenberg, G. |
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Title |
Trace-level micro-XANES by means of bending magnets radiation focused with a polycapillary lens |
Type |
H3 Book chapter |
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Year |
1999 |
Publication |
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Abbreviated Journal |
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Volume |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Additional Links |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:28440 |
Serial |
5880 |
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Permanent link to this record |
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Author |
Alfeld, M.; Janssens, K.; Sasov, A.; Liu, X.; Kostenko, A.; Rickers-Appel, K.; Falkenberg, G. |
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Title |
The use of full-field XRF for simultaneous elemental mapping |
Type |
P1 Proceeding |
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Year |
2010 |
Publication |
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Abbreviated Journal |
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Volume |
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Pages |
111-118 |
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Keywords |
P1 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
The characteristics of a Full-Field X-ray Fluorescence (FF-XRF) set-up for element-specific imaging, installed at the HASYLAB synchrotron radiation source, were determined. A lateral resolution of 10 μm and limits of detection in the percentage range were found. Further potential developments in CCDs available for FF-XRF are discussed and the use of polycapillary lenses as image transfer optics is illustrated in some explorative experiments. |
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Wos |
000278534600020 |
Publication Date |
2010-04-16 |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISSN |
978-0-7354-0764-0 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
8 |
Open Access |
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Notes |
; This research was supported by the Interuniversity Attraction Poles Programme – Belgian Science Policy (IUAP VI/16) and by GOA XANES meets EELS (Research Fund University of Antwerp, Belgium). M. Alfeld is supported by the Research Foundation – Flanders (FWO). The research leading to these results has received funding from the European Community's Seventh Framework Programme (FP7/ 2007-2013) under grant agreement no 226716. ; |
Approved |
Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:82179 |
Serial |
5891 |
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Permanent link to this record |
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Author |
Janssens, K.; Alfeld, M.; Van der Snickt, G.; De Nolf, W.; Vanmeert, F.; Monico, L.; Legrand, S.; Dik, J.; Cotte, M.; Falkenberg, G.; van der Loeff, L.; Leeuwestein, M.; Hendriks, E. |
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Title |
Examination of Vincent van Gogh's paintings and pigments by means of state-of-the-art analytical methods |
Type |
H2 Book chapter |
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Year |
2014 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
373-403
T2 - Science and art : the painted surface |
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Keywords |
H2 Book chapter; Art; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
Recent studies in which X-ray beams of macroscopic to (sub) microscopic dimensions were used for non-destructive analysis and characterization of pigments, paint micro samples and/or entire paintings by Vincent van Gogh are concisely reviewed. The overview presented encompasses the use of laboratory and synchrotron radiation-based instrumentation and deals with the use of several variants of X-ray fluorescence (XRF) as a method of elemental analysis and imaging as well as with the combined use of X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). Microscopic and macroscopic XRF are variants of the method that are well suited to visualize the elemental distribution of key elements, mostly metals, present in paint multi layers, either on the length scale from 1–100 μm inside micro samples taken from paintings or on the 1–100 cm length scale when the (subsurface) distribution of specific pigments in entire paintings is concerned. In the context of the characterization of van Gogh's pigments subject to natural degradation, the use of methods limited to elemental analysis or imaging usually is not sufficient to elucidate the chemical transformations that have taken place. However, at synchrotron facilities, combinations of μ-XRF with related methods such as μ-XAS and μ-XRD have proven themselves to be very suitable for such studies. Their use is often combined with microscopic Fourier transform infra-red (μ-FTIR) spectroscopy since this method delivers complementary information at more or less the same length scale as the X-ray microprobe techniques. Also in the context of macroscopic imaging of works of art, the complementary use of X-ray based and infra-red based imaging appears very promising; some recent developments are discussed. |
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Publication Date |
2020-02-24 |
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Abbreviated Series Title |
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ISBN |
978-1-84973-818-7 |
Additional Links |
UA library record |
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Open Access |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:190782 |
Serial |
7943 |
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Author |
Vincze, L.; Vekemans, B.; Szaloki, I.; Brenker, F.E.; Falkenberg, G.; Rickers, K.; Aerts, K.; Van Grieken, R.; Adams, F. |
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Title |
X-ray fluorescence microtomography and polycapillary based confocal imaging using synchrotron radiation |
Type |
P1 Proceeding |
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Year |
2004 |
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Pages |
220-231
T2 - 4th Conference on Developments in X-R |
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Keywords |
P1 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
Ibis work illustrates the development of X-ray fluorescence tomography and polycapillary based confocal imaging towards a three-dimensional (313), quantitative analytical method with lateral resolution levels down to the 2-20 mum scale. Detailed analytical characterization is given for polycapillary based confocal XRF imaging, which is a new variant of the 3D micro-XRF technique. Applications for 2D/3D micro-XR-F are illustrated for the analysis of biological (zooplankton) and geological samples (microscopic inclusions in natural diamonds and fluid inclusions in quartz). Based on confocal imaging, fully three-dimensional distributions of trace elements could be obtained, representing a significant generalization of the regular 2D scanning technique for micro-XRF spectroscopy. The experimental work described in this paper has been carried out at the ESRF ID18F microfluorescence end-station and at HASYLAB Beam Line L. |
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Wos |
000225665000023 |
Publication Date |
2004-11-02 |
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ISSN |
0-8194-5473-7 |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:94812 |
Serial |
8767 |
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Permanent link to this record |