Number of records found: 980
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Citations
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Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods”. Verlinden G, Gijbels R, Geuens I, , 995 (1998)
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Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe”. Janssens G, Geuens I, de Keyzer R, van Espen P, Gijbels R, Hubin A, Terryn H, Vereecken J Wiley, Chichester, page 161 (1996).
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Quantum oscillations in the Hall effect of thin Sc1-xErxAs epitaxial layers burried in GaAs”. Bogaerts R, de Keyser A, Herlach F, Peeters FM, DeRosa F, Palmstrøm CJ, Brehmer D, Allen SJ, , 596 (1995)
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Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
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Recent trends in solids mass spectrometry, with special emphasis on glow discharge mass spectrometry”. Gijbels R, Bogaerts A, , 71 (1996)
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Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques”. Oleshko VP, Gijbels RH, Jacob WA, , 657 (1998)
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Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples”. Van Eyndhoven G, Batenburg KJ, van Oers C, Kurttepeli M, Bals S, Cool P, Sijbers J, (2014)
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Resonant magnetopolaron effects in GaAs/AlGaAs MQWs at high magnetic fields”. Wang YJ, Nickel HA, McCombe BD, Peeters FM, Hai GQ, Shi JM, Devreese JT, Wu XG, , 797 (1997)
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Scanning microanalysis”. Gijbels R, Oleshko V s.l., page 427 (1998).
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Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1997).
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Scanning microanalysis”. Oleshko V, Gijbels R Wiley-VCH, Weinheim, page 427 (1997).
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Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1996).
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The selective imaging of “substructures&rdquo, in the mixed layer compounds Ca0.85CuO2 and (Ca,Sr)14Cu24O41”. Amelinckx S, Milat O, Van Tendeloo G, , 240 (1992)
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A self-consistent mathematical model of a hollow cathode glow discharge”. Baguer N, Bogaerts A, Gijbels R, , 157 (1999)
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Self-consistent g* factor and spin-split Landau levels in strong magnetic fields and at low temperatures”. Xu W, Vasilopoulos P, Das MP, Peeters FM, , 743 (1995)
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Semiconductor”. Peeters FM McGraw-Hill, New York, page 350 (1997).
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SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification”. Gijbels R, Verlinden G, Geuens I London Institute of Physics, Bristol, page 331 (2000).
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Simulation of plasma processes in plasma assisted CVD reactors”. Herrebout D, Bogaerts A, Goedheer W, Dekempeneer E, Gijbels R, , 213 (1999)
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Sputtering of Si(001) and SiC(001) by grazing ion bombardment”. Elmonov AA, Yusupov MS, Dzhurakhalov AA, Bogaerts A, , 209 (2008)
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Statistical experimental design for quantitative atomic resolution transmission electron microscopy”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D Academic Press, San Diego, Calif., page 1 (2004).
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Statistical parameter estimation theory : a tool for quantitative electron microscopy”. Van Aert S Wiley-VCH, Weinheim, page 281 (2012).
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Egoavil R (2014) STEM investigation of complex oxides at the atomic scale. Antwerpen
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Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM”. Lebedev OI, Van Tendeloo G, Amelinckx S s.l., page 201 (2000).
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Stress analysis with convergent beam electron diffraction around NMOS transistors”. Stuer G, Bender H, van Landuyt J, Eyben P, , 359 (2001)
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Nasr Esfahani D (2014) Strongly correlated electronic systems : influence of electric field and doping. Antwerpen
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Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques”. Oleshko VP, Gijbels RH, Jacob WA, van Daele AJ Antwerp, page 317 (1998).
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Structural aspects of carbon nanotubes”. Bernaerts D, Amelinckx S, Zhang XB, Van Tendeloo G, van Landuyt J, , 551 (1995)
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Structural changes in fluorinated T{'} and T* phases”. Hadermann J, Abakumov AM, Lebedev OI, Antipov EV, Van Tendeloo G, , 193 (2000)
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Structural characterization of organic molecules by laser mass spectrometry”. van Vaeck L, van Roy W, Gijbels R, Adams F Wiley, New York, page 177 (1993).
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Structural instabilities associated with phase transitions: an electron microscopy study”. Van Tendeloo G, Schryvers D, Tanner LE, , 107 (1992)
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