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Author Title Year Publication Volume (down) Times cited Additional Links
Verbeeck, J. Interpretation of “Energy-filtered electron-diffracted beam holography” by R.A. Herring 2006 Ultramicroscopy 106 8 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Van Aert, S.; Bertoni, G. Model-based quantification of EELS spectra: including the fine structure 2006 Ultramicroscopy 106 38 UA library record; WoS full record; WoS citing articles
Bertoni, G.; Beyers, E.; Verbeeck, J.; Mertens, M.; Cool, P.; Vansant, E.F.; Van Tendeloo, G. Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy 2006 Ultramicroscopy 106 83 UA library record; WoS full record; WoS citing articles
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework 2005 Ultramicroscopy 104 70 UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example 2005 Ultramicroscopy 104 37 UA library record; WoS full record; WoS citing articles
Bals, S.; Kilaas, R.; Kisielowski, C. Nonlinear imaging using annular dark field TEM 2005 Ultramicroscopy 104 15 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. Plasmon holographic experiments: theoretical framework 2005 Ultramicroscopy 102 43 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Van Aert, S. Model based quantification of EELS spectra 2004 Ultramicroscopy 101 147 UA library record; WoS full record; WoS citing articles
Potapov, P.L.; Schryvers, D. Measuring the absolute position of EELS ionisation edges in a TEM 2004 Ultramicroscopy 99 29 UA library record; WoS full record; WoS citing articles
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? 2003 Ultramicroscopy 98 26 UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. Optimal experimental design of STEM measurement of atom column positions 2002 Ultramicroscopy 90 35 UA library record; WoS full record; WoS citing articles
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. Does a monochromator improve the precision in quantitative HRTEM? 2001 Ultramicroscopy 89 22 UA library record; WoS full record; WoS citing articles
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging 1997 Ultramicroscopy 69 11 UA library record; WoS full record; WoS citing articles
De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J. Dynamical electron diffraction in substitutionally disordered column structures 1995 Ultramicroscopy 60 14 UA library record; WoS full record; WoS citing articles
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. On the interpretation of HREM images of partially ordered alloys 1995 Ultramicroscopy 60 20 UA library record; WoS full record; WoS citing articles
Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H. A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60 1994 Ultramicroscopy 55 2 UA library record; WoS full record; WoS citing articles
Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects 1994 Ultramicroscopy 54 59 UA library record; WoS full record; WoS citing articles
Amelinckx, S.; Milat, O.; Van Tendeloo, G. Selective imaging of sublattices in complex structures 1993 Ultramicroscopy 51 8 UA library record; WoS full record; WoS citing articles
Van Tendeloo, G.; Amelinckx, S.; Muto, S.; Verheijen, M.A.; van Loosdrecht, P.H.M.; Meijer, G. Structures and phase transitions in C60 and C70 fullerites 1993 Ultramicroscopy 51 17 UA library record; WoS full record; WoS citing articles
Luyten, W.; Krekels, T.; Amelinckx, S.; Van Tendeloo, G.; van Dyck, D.; van Landuyt, J. Electron diffraction effects of conical, helically wound, graphite whiskers 1993 Ultramicroscopy 49 14 UA library record; WoS full record; WoS citing articles
Fanidis, C.; van Dyck, D.; van Landuyt, J. Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases 1993 Ultramicroscopy 48 6 UA library record; WoS full record; WoS citing articles
Fanidis, C.; van Dyck, D.; van Landuyt, J. Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework 1992 Ultramicroscopy 41 17 UA library record; WoS full record; WoS citing articles
Milat, O.; Van Tendeloo, G.; Amelinckx, S. Selective imaging of the “substructures” in incommensurately modulated intergrowth crystal structures 1992 Ultramicroscopy 41 5 UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. In situ HREM study of electron irradiation effects in AgCl microcrystals 1992 Ultramicroscopy 40 10 UA library record; WoS full record; WoS citing articles
van Landuyt, J. The evolution of HVEM application in antwerp 1991 Ultramicroscopy T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan 39 UA library record; WoS full record
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy 2016 Ultramicroscopy 178 93 UA library record; WoS full record; WoS citing articles
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. Locating light and heavy atomic column positions with picometer precision using ISTEM 2016 Ultramicroscopy 172 8 UA library record; WoS full record; WoS citing articles
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question 2016 Ultramicroscopy 174 2 UA library record; WoS full record; WoS citing articles
Alania, M.; Altantzis, T.; De Backer, A.; Lobato, I.; Bals, S.; Van Aert, S. Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure 2016 Ultramicroscopy 177 13 UA library record; WoS full record; WoS citing articles
Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. Evaluation of different rectangular scan strategies for STEM imaging 2020 Ultramicroscopy 13 UA library record; WoS full record; WoS citing articles