Number of records found: 139
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Citations
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Dry aerosol deposition over the North Sea estimated from aircraft measurements”. Rojas CM, Otten PM, Van Grieken RE, Laane R page 419 (1991).
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Environmental problems”. Jambers W, Van Grieken RE page 803 (1997).
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Evaluation of different techniques used to determine aluminium in patients with chronic renal failure”. Visser WJ, Van de Vyver FL, Verbueken AH, d'Haese P, Bekaert AB, Van Grieken RE, Duursma SA, de Broe ME, (1985)
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Van Grieken RE, Markowicz AA (2002) Handbook of X-ray spectrometry. 1016 p
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Interpretation of aerosol trace metal particle size distributions”. Johansson TB, Van Grieken RE, Winchester JW page 356 (1975).
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LAMMA in nephrotoxicity studies”. Verbueken AH, Paulus GJ, Van de Vyver FL, Verpooten GA, Visser WJ, de Broe ME, Van Grieken RE, (1984)
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Laser microprobe mass analysis (LAMMA) in nephrological investigations”. Verbueken AH, Van de Vyver FL, Paulus GJ, Visser WJ, Verpooten GA, de Broe ME, Van Grieken RE page 375 (1984).
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Laser microprobe mass analysis (LAMMA) of parathyroid glands from dialysis patients”. Verbueken AH, Van de Vyver FL, Nouwen EJ, Roels F, de Broe ME, Van Grieken RE page 443 (1987).
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A microanalytical study of green and necrotic needle tissue”. Goossenaerts CH, Verbueken AH, Jacob WA, Van Praag HJ, Van Grieken RE page 224 (1987).
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Preliminary experiments on grazing-exit electron probe microanalysis (GE-EPMA)”. Tsuji K, Spolnik Z, Wagatsuma K, Nullens R, Van Grieken RE, , 119 (1999)
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Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AA, Van Grieken RE page 407 (2002).
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Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AM, Van Grieken RE page 339 (1992).
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Sample preparation for X-ray fluorescence”. Schmeling M, Van Grieken RE page 933 (2002).
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Sample preparation for XRF”. Injuk J, Van Grieken RE page 657 (1992).
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Single particle analysis techniques”. de Bock LA, Van Grieken RE page 243 (1999).
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Trace analysis of environmental samples by X-ray emission spectroscopy”. Van Grieken RE, LaBrecque JJ page 101 (1985).
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Trace metals in the St-Louis aerosol”. Winchester JW, Meinert DL, Nelson JW, Johansson TB, Van Grieken RE, Orsini C, Kaufmann HC, Akselsson R page 385 (1975).
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Use of grazing emission XRF spectrometry for silicon wafer surface contamination measurements”. de Gendt S, Kenis K, Mertens PW, Heyns MM, Claes M, Van Grieken RE, Bailleul A, Knotter M, de Bokx PK, (1996)
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X-ray fluorescence”. Injuk J, Van Grieken RE page 151 (2001).
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