|
Author |
Title |
Year |
Publication |
Volume ![sorted by Volume (numeric) field, descending order (down)](img/sort_desc.gif) |
Times cited |
Additional Links |
Links |
|
Delville, R.; Malard, B.; Pilch, J.; Sittner, P.; Schryvers, D. |
Transmission electron microscopy study of microstructural evolution in nanograined Ni-Ti microwires heat treated by electric pulse |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Delville, R.; Malard, B.; Pilch, J.; Sittner, P.; Schryvers, D. |
Transmission electron microscopy investigation of dislocation slip during superelastic cycling of NiTi wires |
2011 |
International journal of plasticity |
27 |
157 |
UA library record; WoS full record; WoS citing articles |
|