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Author
Title
Year
Publication
Volume
Times cited
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Martinez, G.T.
;
Jones, L.
;
de Backer, A.
;
Béché, A.
;
Verbeeck, J.
;
Van Aert, S.
;
Nellist, P.D.
Quantitative STEM normalisation : the importance of the electron flux
2015
Ultramicroscopy
159
27
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