NANOlab Center of Excellence literature database -- Query Results

“Structural aspect of YBa₂Cu₃O_7-x films on Sis with complex barrier layers”. Vasiliev AL, Van Tendeloo G, Amelinckx S, Boikov Y, Olsson E, Ivanov Z, Physica: C : superconductivity 244, 373 (1995). http://doi.org/10.1016/0921-4534(95)00080-1 Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 0.942 Times cited: 28 DOI: 10.1016/0921-4534(95)00080-1 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=3203
“Structural aspects of the combination of Si and YBa2Cu3O7-x”. Vasiliev AL, Van Tendeloo G, Boikov Y, Olsson E, Ivanov Z, Claeson T, Kiselev NA, Institute of physics conference series 146, 333 (1995) Abstract: The microstructure of defects and interfaces as well as interfacial reactions of the YBa2Cu3O7-x (YBCO) thin films on Si or Si on sapphire with single Y-stabilized ZrO2 (YSZ), double CeO2/YSZ or triple MgO/CeO2/YSZ buffer layer has been characterized by transmission electron microscopy The complex buffer made it possible to prevent detrimental interdiffusion and to control the orientation of YBCO layers. Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Additional Links: UA library record; WoS full record; show.php?record=3211
“Microstructure of YBa₂Cu₃O_7-x films on buffered Si for microelectronic applications”. Vasiliev AL, Van Tendeloo G, Boikov Y, Olsson E, Ivanov S, Superconductor science and technology 10, 356 (1997) Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 2.878 Times cited: 2 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=2076

“Structural aspect of YBa₂Cu₃O_7-x films on Sis with complex barrier layers”. Vasiliev AL, Van Tendeloo G, Amelinckx S, Boikov Y, Olsson E, Ivanov Z, Physica: C : superconductivity 244, 373 (1995). http://doi.org/10.1016/0921-4534(95)00080-1

“Structural aspects of the combination of Si and YBa2Cu3O7-x”. Vasiliev AL, Van Tendeloo G, Boikov Y, Olsson E, Ivanov Z, Claeson T, Kiselev NA, Institute of physics conference series 146, 333 (1995)

“Microstructure of YBa₂Cu₃O_7-x films on buffered Si for microelectronic applications”. Vasiliev AL, Van Tendeloo G, Boikov Y, Olsson E, Ivanov S, Superconductor science and technology 10, 356 (1997)