“Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison”. Alfeld M, Vekemans B, Janssens K, Falkenberg G, Broekaert JAC, Gao N, Gibson D (2007).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
