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Author | Vasiliev, A.L.; Van Tendeloo, G.; Amelinckx, S.; Boikov, Y.; Olsson, E.; Ivanov, Z. | ||||
Title | Structural aspect of YBa2Cu3O7-x films on Sis with complex barrier layers | Type | A1 Journal article | ||
Year | 1995 | Publication | Physica: C : superconductivity | Abbreviated Journal | Physica C |
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244 | Issue | Pages | 373-388 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | A1995QQ29300025 | Publication Date | 2003-04-05 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0921-4534; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 0.942 | Times cited | 28 | Open Access | |
Notes | Approved | ||||
Call Number | UA @ lucian @ c:irua:13312 | Serial | 3203 | ||
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