Number of records found: 187
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Crystallization of PZT in porous alumina membrane channels”. Zhigalina OM, Mishina ED, Sherstyuk NE, Vorotilov KA, Vasiljev VA, Sigov AS, Lebedev OI, Grigoriev YV, de Santo MP, Barberi R, Rasing T, Ferroelectrics 336, 247 (2006). http://doi.org/10.1080/00150190600697756
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Pd-In2O3 interaction due to reduction in hydrogen: consequences for methanol steam reforming”. Lorenz H, Turner S, Lebedev OI, Van Tendeloo G, Klötzer B, Rameshan C, Pfaller K, Penner S, Applied catalysis : A : general 374, 180 (2010). http://doi.org/10.1016/j.apcata.2009.12.007
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Catalytic characterization of pure SnO2 and GeO2 in methanol steam reforming”. Zhao Q, Lorenz H, Turner S, Lebedev OI, Van Tendeloo G, Rameshan C, Klötzer B, Konzett J, Penner S, Applied catalysis : A : general 375, 188 (2010). http://doi.org/10.1016/j.apcata.2009.12.027
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Origin of different deactivation of Pd/SnO2 and Pd/GeO2 catalysts in methanol dehydrogenation and reforming: a comparative study”. Lorenz H, Zhao Q, Turner S, Lebedev OI, Van Tendeloo G, Kloetzer B, Rameshan C, Pfaller K, Applied catalysis : A : general 381, 242 (2010). http://doi.org/10.1016/j.apcata.2010.04.015
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A-site ordering and stripe phases in manganite films”. Sudheendra L, Moshnyaga V, Lebedev OI, Gehrke K, Belenciuc A, Shapoval O, Van Tendeloo G, Samwer K, Physica: B : condensed matter T2 –, International Conference on Strongly Correlated Electron Systems (SCES, 2007), MAY 13-18, 2007, Houston, TX 403, 1645 (2008). http://doi.org/10.1016/j.physb.2007.10.332
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Influence of the Ar/O2 ratio on the growth and biaxial alignment of yttria stabilized zirconia layers during reactive unbalanced magnetron sputtering”. Mahieu S, Ghekiere P, de Winter G, Depla D, de Gryse R, Lebedev OI, Van Tendeloo G, Thin solid films : an international journal on the science and technology of thin and thick films 484, 18 (2005). http://doi.org/10.1016/j.tsf.2005.01.021
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Crystalline and amorphous frameworks with giant pores: what information ca we expect from advanced TEM?”.Lebedev OI, Van Tendeloo G, Electron microscopy and multiscale modeling: proceedings of the AIP conference proceedings 999, 245 (2008)
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