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Author | Jacques, P.; Verbist, K.; Lapin, J.; Ryelandt, L.; Van Tendeloo, G.; Delannay, F. | ||||
Title | Critical assessment of the process of growth of a YBa2Cu3O7-\delta layer on Y2BaCuO5 | Type | A1 Journal article | ||
Year | 1996 | Publication | Superconductor science and technology | Abbreviated Journal | Supercond Sci Tech |
Volume | 9 | Issue | Pages | 176-183 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Bristol | Editor | ||
Language | Wos | A1996TZ48100008 | Publication Date | 2002-08-25 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0953-2048;1361-6668; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.325 | Times cited | 1 | Open Access | |
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:15462 | Serial | 539 | ||
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