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  Author Title Year Publication Volume Times cited Additional Links Links (up)
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. SIMS analysis of oxynitrides: evidence for nitrogen diffusion induced by oxygen flooding 2000 Surface and interface analysis 29 4 UA library record; WoS full record; WoS citing articles doi
Janssens, K.; Vittiglio, G.; Deraedt, I.; Aerts, A.; Vekemans, B.; Vincze, L.; Wei, F.; de Ryck, I.; Schalm, O.; Adams, F.; Rindby, A.; Knöchel, A.; Simionovici, A.S.; Snigirev, A. Use of microscopic XRF for non-destructive analysis in art an archaeometry 2000 X-ray spectrometry 29 UA library record; WoS full record; WoS citing articles doi
Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate 2000 UA library record
Joutsensaari, J.; Ahonen, P.P.; Kauppinen, E.I.; Brown, D.P.; Lehtinen, K.E.J.; Jokiniemi, J.K.; Pauwels, B.; Van Tendeloo, G. Aerosol synthesis of fullerene nanocrystals in controlled flow reactor conditions 2000 Journal of nanoparticle research 2 5 UA library record; WoS full record; WoS citing articles
Van Tendeloo, G.; Schryvers, D. Atomic structure of alloys close to phase transitions 2000 Nucleation and growth processes in materials 580 UA library record; WoS full record;
Hervieu, M.; Martin, C.; Van Tendeloo, G.; Mercey, B.; Maignan, A.; Jirak, Z.; Raveau, B. Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties 2000 UA library record
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling 2000 UA library record
Vantomme, A.; Wu, M.F.; Hogg, S.; van Landuyt, J.; et al. Comparative study of structural properties and photoluminescence in InGaN layers with a high In content 2000 Internet journal of nitride semiconductor research T2 – Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS 5 UA library record; WoS full record; pdf
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study 2000 UA library record; WoS full record;
Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. Determination of the silver sulphide cluster size distribution via computer simulations 2000 UA library record; WoS full record;
Gijbels, R.; Adriaens, A. Einleitung zu den massenspektrometrischen Methoden 2000 UA library record
Oleshko, V.; Gijbels, R.; Amelinckx, S. Electron microscopy and scanning microanalysis 2000 UA library record
Dluzewski, P.; Pietraszko, A.; Kozlowski, M.; Szczepanska, A.; Gorecka, J.; Baran, M.; Leonyuk, L.; Babonas, G.J.; Lebedev, O.I.; Szymczak, R. Electron microscopy and X-ray structural investigations of incommensurate spin-ladder Sr4.1Ca4.7Bi0.3Cu17O29 single crystals 2000 Acta physica Polonica: A: general physics, solid state physics, applied physics 98 UA library record; WoS full record; pdf
Van Tendeloo, G.; Amelinckx, S. Electron microscopy of fullerenes and related materials 2000 UA library record
Romano-Rodriguez, A.; Perez-Rodriguez, A.; Serre, C.; van Landuyt, J.; et al. Epitaxial growth of \beta-SiC on ion-beam synthesized \beta-SiC : structural characterization 2000 Materials science forum T2 – International Conference on Silicon Carbide and Related Materials, OCT 10-15, 1999, RES TRIANGLE PK, NORTH CAROLINA 338-3 2 UA library record; WoS full record; WoS citing articles
Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. Evolution of impurity clusters and photographic sensitivity 2000 Zhurnal nauchnoj prikladnoj fotografii i kinematografii 45 UA library record
Riva, C.; Peeters, F.M.; Varga, K. Excitons and charged excitons in quantum wells 2000 Physica status solidi: A: applied research 178 12 UA library record; WoS full record; WoS citing articles
Herrebout, D.; Bogaerts, A.; Yan, M.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. An extended RF methane plasma 1D fluid model of interest in deposition of diamond-like carbon layers 2000 UA library record
Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. Functioning of thiocyanate ions during sulphur and sulphur-plus-gold Sensitization 2000 UA library record; WoS full record;
Bogaerts, A. Glow discharge mass spectrometry, methods 2000 UA library record
Giorgio, S.; Henry, C.R.; Pauwels, B.; Van Tendeloo, G. Gold particles supported on TiO2 2000 UA library record
Kuhn, L.T.; Vanhoutte, F.; Cannaerts, M.; Neukermans, S.; Verschoren, G.; Bouwen, W.; van Haesendonck, C.; Lievens, P.; Silverans, R.E.; Pauwels, B.; Van Tendeloo, G. Granular films assembled of CoN, CrM and mixtures of CoN and CrM clusters: structure and electron transport properties 2000 UA library record
Van Tendeloo, G.; Krekels, T. Identification of new superconducting compounds by electron microscopy 2000 UA library record
Schuddinck, W.; Van Tendeloo, G.; Martin, C.; Hervieu, M.; Raveau, B. Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3 2000 UA library record
de Meester, R.H.J.; Peeters, F.M.; Lakrimi, M.; Nicholas, R.J.; Poulter, A.J.L.; Mason, N.J.; Walker, P.J. Intersubband transitions in InAs/GaSb superlattices in a parallel magnetic field 2000 Physica. E: Low-dimensional systems and nanostructures 7 1 UA library record; WoS full record; WoS citing articles
Schryvers, D.; Boullay, P.; Potapov, P.; Satto, C. Martensitic transformations studied on nano- and microscopic length scales 2000 Festkörperprobleme 40 UA library record
Bogaerts, A.; Gijbels, R. Modeling network for argon glow discharges: the output cannot be better than the input 2000 1 UA library record; WoS full record; WoS citing articles
Bogaerts, A.; Gijbels, R. Modeling of radio-frequency and direct current glow discharges in argon 2000 Journal of technical physics 41 UA library record
Jochum, K.P.; Gijbels, R.; Adriaens, A. Multielementmassenspektrometrie (MMS) 2000 UA library record
Gijbels, R.; Verlinden, G.; Geuens, I. SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification 2000 UA library record; WoS full record;
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