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“Electron-microscopy and the structural studies of superconducting materials and fullerites”. Van Tendeloo G, Amelinckx S, NATO Advanced Study Institutes series: series E : applied sciences
T2 –, NATO Advanced Study Institute on Materials and crystallographic Aspects, of HT(c)-Superconductivity, May 17-30, 1993, Erice, Italy , 521 (1994)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
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“Electron microscopy and X-ray structural investigations of incommensurate spin-ladder Sr4.1Ca4.7Bi0.3Cu17O29 single crystals”. Dluzewski P, Pietraszko A, Kozlowski M, Szczepanska A, Gorecka J, Baran M, Leonyuk L, Babonas GJ, Lebedev OI, Szymczak R, Acta physica Polonica: A: general physics, solid state physics, applied physics 98, 729 (2000)
Abstract: Transmission electron microscopy and X-ray diffraction proved chain/ladder incommensurate single crystal structure of investigated samples. The incommensurate ratio was determined from the X-ray and electron diffraction being equal to 0.704. Diffuse scattering intensities localised on the planes perpendicular to the c*-axis and passing through the spots originating from the periodicity of chain sublattice were detected. High-angle grain boundary or twinning formed by rotation of 33.3 degrees around [100] direction was observed. High-resolution electron microscopy images revealed the stacking faults in ac planes.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.469
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“Electron-microscopy investigation of superconducting la2cu(o, f)4+y oxyfluoride”. Weill, Chevalier, Chambon, Tressaud, Darriet, Etourneau, Van Tendeloo G, European journal of solid state and inorganic chemistry 30, 1095 (1993)
Abstract: The fluorination of La2CuO4 can lead to different oxyfluoride compounds depending on the TF2 temperature of the fluorine gas treatment. When 150-degrees-C T(F2) less-than-or-equal-to 200-degrees-c less-than-or-equal-to 200-degrees-C a superconducting material is obtained. Previous neutron diffraction experiments as well as the EXAFS measurements at the La L(III) edge indicate that extra anions lie in an interstitial site between the two (LaO) layers. Electron diffraction patterns clearly show the existence of an incommensurate modulation due to the presence of shear planes. A second phase is also pointed out which can be obtained as a major component when the fluorination temperature is raised to 230-degrees-C. This phase which is not a superconductor crystallizes with the monoclinic symmetry.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 2
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“Electron microscopy investigation of superconducting La2Cu(O,F)4+y oxyfluoride”. Weill F, Chevalier B, Chambon M, Tressaud A, Darriet B, Etourneau J, Van Tendeloo G, European journal of solid state and inorganic chemistry 30, 1095 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 2
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“Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis”. Oleshko VP, Gijbels R, Amelinckx S Wiley, Chichester, page 1 (2013).
Keywords: H1 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
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“Electron microscopy of fullerenes and fullerene related structures”. Van Tendeloo G, van Landuyt J, Amelinckx S, , 498 (1994)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
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“Electron microscopy of fullerenes and related materials”. Van Tendeloo G, Amelinckx S Wiley-VCH, Weinheim, page 353 (2000).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
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“Electron microscopy of interfaces in new materials”. Van Tendeloo G, Goessens C, Schryvers D, van Haverbergh J, de Veirman A, van Landuyt J s.l., page 200 (1991).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
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“Electron microscopy of stress-induced martensite and pretransition microstructures in Ni62.5Al37.5”. Schryvers D, Tanner LE, Shape memory materials and phenomena: fundamental aspects and applications 246, 33 (1992)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 5
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“Electron microscopy of C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S Springer, Berlin, page 182 (1993).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
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“Electron microscopy on nanoparticles: structure of C60 and C70 nanopraticles”. Pauwels B, Van Tendeloo G, Joutsensaari J, Kauppinen EI, (1999)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
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Amelinckx S, van Dyck D, van Landuyt J, Van Tendeloo G (1997) Electron microscopy: principles and fundamentals. Vch, Weinheim
Keywords: ME1 Book as editor or co-editor; Electron microscopy for materials research (EMAT); Vision lab
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“Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9”. Seo JW, Schryvers D, Potapov P, , 17 (1998)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
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“Electron microscopy study of twin sequences and branching in Ni66Al34 3r martensite”. Schryvers D, van Landuyt JT, Proceedings Of The International Conference On Martensitic Transformations (icomat-92) , 263 (1993)
Keywords: P1 Proceeding; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Times cited: 1
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“Electron mobility in Si δ-doped GaAs with spatial correlations in the distribution of charged impurities”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Farias GA, Devreese JT, Wolter JH, Wilamowski Z, Physical review : B : condensed matter and materials physics 55, 13093 (1997)
Keywords: A1 Journal article; Condensed Matter Theory (CMT); Theory of quantum systems and complex systems
Impact Factor: 3.836
Times cited: 17
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“Electron mobility in Si delta-doped GaAs”. Hai GQ, Studart N, Peeters FM, Devreese JT, Koenraad PM, van de Stadt AFW, Wolter JH, Proceedings of the International Conference on the Physics of Semiconductors 22, 823 (1994)
Keywords: P3 Proceeding; Condensed Matter Theory (CMT); Theory of quantum systems and complex systems
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“Electron mobility in two coupled &delta, layers”. Hai GQ, Studart N, Peeters FM, Physical review : B : condensed matter and materials physics 52, 11273 (1995)
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 3.736
Times cited: 24
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Biermans E (2012) Electron tomography : from qualitative to quantitative. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
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Masir MR (2012) Electronic properties of graphene in inhomogeneous magnetic fields. Antwerpen
Keywords: Doctoral thesis; Condensed Matter Theory (CMT)
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Kishore VVR (2013) Electronic structure of core-shell nanowires. Antwerpen
Keywords: Doctoral thesis; Condensed Matter Theory (CMT)
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“Electronic structure, screening and charging effects at a metal/organic tunneling junction: a first principles study”. Lamoen D, Ballone P, Parrinello M, Physical review B 54, 5097 (1996)
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 3.736
Times cited: 33
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“Electrons in non-homogeneous magnetic fields”. Peeters FM, Matulis A, Brazilian journal of physics 24, 283 (1994)
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 0.81
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“EM investigation of precursors and precipitation in a Ni39.6Mn47.5Ti12.9 alloy”. Seo JW, Schryvers D, Vermeulen W, Richard O, Potapov P, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 79, 1279 (1999)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 3
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“EM study of sensitisation of silver halide grains”. Buschmann V, Schryvers D, van Landuyt J, van Roost C, Icem 13 (1994)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
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“EM study of twinning in the Ni5Al3 bainitic phase”. Schryvers D, Ma Y, Toth L, Tanner LE, Twinning in advanced materials , 395 (1993)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
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“Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration”. Caen J, Schalm O, van der Snickt G, van der Linden V, Frederickx P, Schryvers D, Janssens K, Cornelis E, van Dyck D, Schreiner M, , 121 (2005)
Keywords: P3 Proceeding; Art; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Vision lab
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“Enhanced spin and isospin blockade in two vertically coupled quantum dots”. Partoens B, Peeters FM, , 1035 (2001)
Keywords: P1 Proceeding; Condensed Matter Theory (CMT)
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“Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals”. Lisiecki I, Turner S, Bals S, Pileni MP, Van Tendeloo G Springer, Berlin, page 273 (2008).
Keywords: H1 Book chapter; Electron microscopy for materials research (EMAT)
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“Enhancement of critical magnetic field in superconducting nanostructures”. Fomin VM, Devreese JT, Misko VR, 1, 134 (2002)
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
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“Epitaxial growth of \beta-SiC on ion-beam synthesized \beta-SiC : structural characterization”. Romano-Rodriguez A, Perez-Rodriguez A, Serre C, van Landuyt J, et al, Materials science forum
T2 –, International Conference on Silicon Carbide and Related Materials, OCT 10-15, 1999, RES TRIANGLE PK, NORTH CAROLINA 338-3, 309 (2000)
Abstract: In this work we present for the first time, to our knowledge, the CVD epitaxial growth of beta -SiC using an ion beam synthesized (IBS) beta -SiC layer as seed, which has been formed by multiple implantation into Si wafers at 500 degreesC. The ion beam synthesized continuous layer is constituted by beta -SiC nanocrystals that are well oriented relative to the silicon substrate. Comparison of the epitaxial growth on these samples with that on silicon test samples, both on and off-axis, is performed. The results show that the epitaxial growth can be achieved on the IBS samples without the need of the carbonization step and that the structural quality of the CVD layer is comparable to that obtained on a carbonized silicon sample. Improvement of the quality of the deposited layer is proposed.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 2
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