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Electron microprobe analysis of suspended matter in the Angola Basin”. Bernard P, Eisma D, Van Grieken R, Journal of sea research 41, 19 (1999). http://doi.org/10.1016/S1385-1101(98)00043-4
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Single particle analysis of suspended matter in the Makasar Strait and Flores Sea with particular reference to tin-bearing particles”. Dekov VM, van Put A, Eisma D, Van Grieken R, Journal of sea research 41, 35 (1999). http://doi.org/10.1016/S1385-1101(98)00035-5
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Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals”. Verlinden G, Gijbels R, Geuens I, Journal of the American Society for Mass Spectrometry 10, 1016 (1999). http://doi.org/10.1016/S1044-0305(99)00064-1
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High resolution electron microscopy and electron spin resonance studies on cubic boron nitride crystals made by high-pressure/high-temperature synthesis”. Nistor L, Nistor SV, Dincã, G, van Landuyt J, Schoemaker D, Copaciu V, Georgeoni P, Arnici N, Diamonds an related materials 8, 738 (1999). http://doi.org/10.1016/S0925-9635(98)00282-9
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Microstructure and properties of oxygen controlled melt textured NdBaCuO superconductive ceramics”. Monot I, Tancret F, Laffez P, Van Tendeloo G, Desgardin G, Technology 65, 26 (1999). http://doi.org/10.1016/S0921-5107(99)00193-2
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Martensitic transformations and microstructures in splat-cooled Ni-Al”. Schryvers D, Holland-Moritz D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 273/275, 697 (1999). http://doi.org/10.1016/S0921-5093(99)00399-8
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Role of the defect microstructure on the electrical transport properties in undoped and Si-doped GaN grown by LP-MOVPE”. Farvacque JL, Bougrioua Z, Moerman I, Van Tendeloo G, Lebedev O, Physica: B : condensed matter T2 –, 20th International Conference on Defects in Semiconductors (ICDS-20), JUL 26-30, 1999, BERKELEY, CA 273-4, 140 (1999). http://doi.org/10.1016/S0921-4526(99)00431-7
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Simultaneous investigation of vertical transport and intersubband absorption in a superlattice: continuum Wannier-Strak ladders and next-nearest neighbor tunneling”. Helm M, Hilber W, Strasser G, de Meester R, Peeters FM, Wacker A, Physica: B : condensed matter 272, 194 (1999). http://doi.org/10.1016/S0921-4526(99)00269-0
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Enhancement of X-ray fluorescence intensity from an ultra-thin sandwiched layer at grazing-emission angles”. Tsuji K, Takenaka H, Wagatsuma K, de Bokx PK, Van Grieken RE, Spectrochimica acta: part B : atomic spectroscopy 54, 1881 (1999). http://doi.org/10.1016/S0584-8547(99)00143-3
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Localised and non-destructive analysis of metallic artefacts from ancient Egypt by means of a compact μ-XRF instrument”. Vittiglio G, Janssens K, Adams F, Oost A, Spectrochimica acta: part B : atomic spectroscopy 54, 1697 (1999). http://doi.org/10.1016/S0584-8547(99)00100-7
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Determination of silicon in organic matrices with grazing-emission X-ray fluorescence spectrometry”. Claes M, van Dyck K, Deelstra H, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 54, 1517 (1999). http://doi.org/10.1016/S0584-8547(99)00098-1
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Monte Carlo simulation of X-ray fluorescence spectra: part 4: photon scattering at high X-ray energies”. Vincze L, Janssens K, Vekemans B, Adams F, Spectrochimica acta: part B : atomic spectroscopy , 1711 (1999). http://doi.org/10.1016/S0584-8547(99)00094-4
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Comparison between a radio-frequency and direct current glow discharge in argon by a hybrid Monte Carlo-fluid model for electrons, argon ions and fast argon atoms”. Bogaerts A, Gijbels R, Goedheer W, Spectrochimica acta: part B : atomic spectroscopy 54, 1335 (1999). http://doi.org/10.1016/S0584-8547(99)00080-4
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Enhancement of electron-induced X-ray intensity for single particles under grazing-exit conditions”. Tsuji K, Spolnik Z, Wagatsuma K, Zhang J, Van Grieken RE, Spectrochimica acta: part B : atomic spectroscopy 54, 1243 (1999). http://doi.org/10.1016/S0584-8547(99)00073-7
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Quantification in grazing-emission X-ray fluorescence spectrometry”. Spolnik ZM, Claes M, Van Grieken RE, de Bokx PK, Urbach HP, Spectrochimica acta: part B : atomic spectroscopy 54, 1525 (1999). http://doi.org/10.1016/S0584-8547(99)00051-8
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Single particle characterisation of inorganic and organic North Sea suspension”. Jambers W, Dekov V, Van Grieken R, Marine chemistry 67, 17 (1999). http://doi.org/10.1016/S0304-4203(99)00046-8
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Oscillating sliding wear of mono- and multilayer ceramic coatings in air”. Huq MZ, Celis JP, Meneve J, Stals L, Schryvers D, Surface and coatings technology 113, 242 (1999). http://doi.org/10.1016/S0257-8972(99)00009-2
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Nanohardness and structure of nitrogen implanted SixAly coatings post-implanted with oxygen”. Jacobs M, Bodart F, Terwagne G, Schryvers D, Poulet A, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 147, 231 (1999). http://doi.org/10.1016/S0168-583X(98)00535-7
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Snake orbits in hybrid semiconductor/ferromagnetic devices”. Peeters FM, Reijniers J, Badalian SM, Vasilopoulos P, Microelectronic engineering 47, 405 (1999). http://doi.org/10.1016/S0167-9317(99)00245-2
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Mesoscopic superconducting disks: fluxoids in a box”. Peeters FM, Schweigert VA, Deo PS, Microelectronic engineering 47, 393 (1999). http://doi.org/10.1016/S0167-9317(99)00242-7
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Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers”. De Gryse O, Clauws P, Rossou L, van Landuyt J, Vanhellemont J, Microelectronic engineering 45, 277 (1999). http://doi.org/10.1016/S0167-9317(99)00180-X
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Inorganic deterioration affecting the Altamira Cave, N Spain: quantitative approach to wall-corrosion (solutional etching) processes induced by visitors”. Sánchez-Moral S, Soler V, Cañaveras JC, Sanz-Rubio E, Van Grieken R, Gysels K, The science of the total environment 243/244, 67 (1999). http://doi.org/10.1016/S0048-9697(99)00348-4
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Indoor air quality at the Correr Museum, Venice, Italy”. Camuffo D, Brimblecombe P, Van Grieken R, Busse H-J, Sturaro G, Valentino A, Bernardi A, Blades N, Shooter D, de Bock L, Gysels K, Wieser M, Kim O, The science of the total environment 236, 135 (1999). http://doi.org/10.1016/S0048-9697(99)00262-4
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XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers”. Conard T, de Witte H, Loo R, Verheyen P, Vandervorst W, Caymax M, Gijbels R, Thin solid films : an international journal on the science and technology of thin and thick films 343/344, 583 (1999). http://doi.org/10.1016/S0040-6090(99)00122-4
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Influence of laser and isothermal treatments on microstructural properties of SnO2 films”. Rembeza ES, Richard O, van Landuyt J, Materials research bulletin 34, 1527 (1999). http://doi.org/10.1016/S0025-5408(99)00188-9
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Multiply twinned C60 and C70 nanoparticles”. Pauwels B, Bernaerts D, Amelinckx S, Van Tendeloo G, Joutsensaari J, Kauppinen EI, Journal of crystal growth 200, 126 (1999). http://doi.org/10.1016/S0022-0248(98)01285-8
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Growth of pure and doped Rb2ZnCl4and K2ZnCl4 single crystals by Czochralski technique”. Stefan M, Nistor SV, Mateescu DC, Abakumov AM, Journal of crystal growth 200, 148 (1999). http://doi.org/10.1016/S0022-0248(98)01247-0
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Field evaluation of a wind tunnel-impactor system for sampling ambient aerosols”. Gysels K, Van Grieken R, Journal of aerosol science 30, 639 (1999). http://doi.org/10.1016/S0021-8502(98)00747-2
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Determination of trace elements in organic matrices by grazing-emission X-ray fluorescence spectrometry”. Spolnik ZM, Claes M, Van Grieken R, Analytica chimica acta 401, 293 (1999). http://doi.org/10.1016/S0003-2670(99)00471-7
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Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis”. Ro C-U, Hoornaert S, Van Grieken R, Analytica chimica acta 389, 151 (1999). http://doi.org/10.1016/S0003-2670(99)00160-9
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