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Structure and defect characterization of multiferroic <tex>ReMnO$3 films and multilayers by TEM”. Jehanathan N, Lebedev O, Gélard I, Dubourdieu C, Van Tendeloo G, Nanotechnology 21, 075705 (2010). http://doi.org/10.1088/0957-4484/21/7/075705
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The electronic properties of graphene and graphene ribbons under simple shear strain”. Sena SHR, Pereira JM, Farias GA, Peeters FM, Costa Filho RN, Journal of physics : condensed matter 24, 375301 (2012). http://doi.org/10.1088/0953-8984/24/37/375301
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Fluid simulation of the phase-shift effect in hydrogen capacitively coupled plasmas: 2 : radial uniformity of the plasma characteristics”. Zhang Y-R, Xu X, Bogaerts A, Wang Y-N, Journal of physics: D: applied physics 45, 015203 (2012). http://doi.org/10.1088/0022-3727/45/1/015203
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TEM investigation of the formation mechanism of deformation twins in Fe-Mn-Si-Al TWIP steels”. Idrissi H, Renard K, Schryvers D, Jacques PJ, Philosophical magazine 93, 4378 (2013). http://doi.org/10.1080/14786435.2013.832837
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Quantum mechanical solver for confined heterostructure tunnel field-effect transistors”. Verreck D, Van de Put M, Sorée B, Verhulst AS, Magnus W, Vandenberghe WG, Collaert N, Thean A, Groeseneken G, Journal of applied physics 115, 053706 (2014). http://doi.org/10.1063/1.4864128
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Spectroscopy of snake states using a graphene Hall bar”. Milovanović, SP, Masir MR, Peeters FM, Applied physics letters 103, 233502 (2013). http://doi.org/10.1063/1.4838557
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Local bond length variations in boron-doped nanocrystalline diamond measured by spatially resolved electron energy-loss spectroscopy”. Lu Y-G, Turner S, Verbeeck J, Janssens SD, Haenen K, Van Tendeloo G, Applied physics letters 103, 032105 (2013). http://doi.org/10.1063/1.4813842
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Magnetic and magnetodielectric properties of erbium iron garnet ceramic”. Maignan A, Singh K, Simon C, Lebedev OI, Martin C, Tan H, Verbeeck J, Van Tendeloo G, Journal of applied physics 113, 033905 (2013). http://doi.org/10.1063/1.4776716
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Rotating cylindrical magnetron sputtering: simulation of the reactive process”. Depla D, Li XY, Mahieu S, van Aeken K, Leroy WP, Haemers J, de Gryse R, Bogaerts A, Journal of applied physics 107, 113307 (2010). http://doi.org/10.1063/1.3415550
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Molecular dynamics simulations of Cl+ etching on a Si(100) surface”. Gou F, Neyts E, Eckert M, Tinck S, Bogaerts A, Journal of applied physics 107, 113305 (2010). http://doi.org/10.1063/1.3361038
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Guided nucleation of superconductivity on a graded magnetic substrate”. Milošević, MV, Gillijns W, Silhanek AV, Libál A, Peeters FM, Moshchalkov VV, Applied physics letters 96, 032503 (2010). http://doi.org/10.1063/1.3293300
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Mechanism for Ohmic contact formation on Si3N4 passivated AlGaN/GaN high-electron-mobility transistors”. Van Daele B, Van Tendeloo G, Derluyn J, Shrivastava P, Lorenz A, Leys MR, Germain M;, Applied physics letters 89, Artn 201908 (2006). http://doi.org/10.1063/1.2388889
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Perturbation of collisional plasma flow around a charged dust particle: kinetic analysis”. Schweigert IV, Schweigert VA, Peeters FM, Physics of plasmas 12, 113501 (2005). http://doi.org/10.1063/1.2076527
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Ab initio computation of the mean inner Coulomb potential of amorphous carbon structures”. Schowalter M, Titantah JT, Lamoen D, Kruse P, Applied physics letters 86, 112102 (2005). http://doi.org/10.1063/1.1885171
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Particle-in-cell/Monte Carlo simulations of a low-pressure capacitively coupled radio-frequency discharge: effect of adding H2 to an Ar discharge”. Neyts E, Yan M, Bogaerts A, Gijbels R, Journal of applied physics 93, 5025 (2003). http://doi.org/10.1063/1.1563820
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Modeling of a capacitively coupled radio-frequency methane plasma: comparison between a one-dimensional and a two-dimensional fluid model”. Herrebout D, Bogaerts A, Yan M, Gijbels R, Goedheer W, Vanhulsel A, Journal of applied physics 92, 2290 (2002). http://doi.org/10.1063/1.1500789
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Rapid microwave synthesis of high aspect-ration ZnO nanotetrapods for swift bisphenol A detection”. Qurashi A, Rather JA, De Wael K, Merzougui B, Tabet N, Faiz M, The analyst 138, 4764 (2013). http://doi.org/10.1039/C3AN00336A
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Modeling adatom surface processes during crystal growth: a new implementation of the Metropolis Monte Carlo algorithm”. Eckert M, Neyts E, Bogaerts A, CrystEngComm 11, 1597 (2009). http://doi.org/10.1039/b822973m
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Structural characterization of colloidal Ag2Se nanocrystals”. Buschmann V, Van Tendeloo G, Langmuir 14, 1528 (1998). http://doi.org/10.1021/la9713210
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Superspace description, crystal structures, and electric conductiof the Ba4In6-xMgxO13-x/2 solid solutions”. Abakumov AM, Rossell MD, Gutnikova OY, Drozhzhin OA, Leonova LS, Dobrovolsky YA, Istomin SY, Van Tendeloo G, Antipov EV, Chemistry of materials 20, 4457 (2008). http://doi.org/10.1021/cm8004216
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Sr3Fe5/4Mo3/4O6.9, an n = 2 Ruddlesden-Popper phase: synthesis and properties”. Whaley LW, Lobanov MV, Sheptyakov D, Croft M, Ramanujachary KV, Lofland S, Stephens PW, Her JH, Van Tendeloo G, Rossell M, Greenblatt M;, Chemistry of materials 18, 3448 (2006). http://doi.org/10.1021/cm060482z
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Theoretical characterization of an atmospheric pressure glow discharge used for analytical spectrometry”. Martens T, Mihailova D, van Dijk J, Bogaerts A, Analytical chemistry 81, 9096 (2009). http://doi.org/10.1021/ac9017742
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The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements”. Gjorgievska E, Van Tendeloo G, Nicholson JW, Coleman NJ, Slipper IJ, Booth S, Microscopy and microanalysis 21, 392 (2015). http://doi.org/10.1017/S1431927615000057
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Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency”. van den Broek W, Van Aert S, van Dyck D, Microscopy and microanalysis 18, 336 (2012). http://doi.org/10.1017/S1431927611012633
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Modeling of glow discharge sources with flat and pin cathodes and implications for mass spectrometric analysis”. Bogaerts A, Gijbels R, Journal of the American Society of Mass Spectrometry 8, 1021 (1997). http://doi.org/10.1016/S1044-0305(97)00120-7
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Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks”. de Witte H, Conard T, Vandervorst W, Gijbels R, Applied surface science 203, 523 (2003). http://doi.org/10.1016/S0169-4332(02)00728-6
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The Fresnel effect of a defocused biprism on the fringes in inelastic holography”. Verbeeck J, Bertoni G, Schattschneider P, Ultramicroscopy T2 –, 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN 108, 263 (2008). http://doi.org/10.1016/j.ultramic.2007.06.007
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Nonlinear imaging using annular dark field TEM”. Bals S, Kilaas R, Kisielowski C, Ultramicroscopy 104, 281 (2005). http://doi.org/10.1016/j.ultramic.2005.05.004
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Growth of La2Mo2O9 films on porous Al2O3 substrates by radio frequency magnetron sputtering”. Laffez P, Chen XY, Banerjee G, Pezeril T, Rossell MD, Van Tendeloo G, Lacorre P, Liu JM, Liu Z-G, Thin solid films : an international journal on the science and technology of thin and thick films 500, 27 (2006). http://doi.org/10.1016/j.tsf.2005.10.062
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Study of (ir)reversible fouling in MBRs under various operating conditions using new on-line fouling sensor”. Huyskens C, Lenaerts S, Brauns E, Diels L, de Wever H, Separation and purification technology 81, 208 (2011). http://doi.org/10.1016/J.SEPPUR.2011.07.031
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