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Characterization of AgxAuy nano particles by TEM and STEM”. de Vyt A, Gijbels R, Davock H, van Roost C, Geuens I, Journal of analytical atomic spectrometry 14, 499 (1999). http://doi.org/10.1039/a807695b
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Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, Journal of analytical atomic spectrometry 14, 429 (1999). http://doi.org/10.1039/a807276k
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Argon and copper optical emission spectra in a Grimm glow discharge source: mathematical simulations and comparison with experiment”. Bogaerts A, Gijbels R, Journal of analytical atomic spectrometry 13, 721 (1998). http://doi.org/10.1039/a802894j
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Modeling of argon direct current glow discharges and comparison with experiment: how good is the agreement?”.Bogaerts A, Gijbels R, Journal of analytical atomic spectrometry 13, 945 (1998). http://doi.org/10.1039/a800329g
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The use of lead-glass capillaries for microfocusing of highly energetic (0-60 KeV) synchrotron radiation”. Janssens K, Vincze L, Vekemans B, Adams F, Haller M, Knöchel A, Journal of analytical atomic spectrometry 13, 339 (1998). http://doi.org/10.1039/A707700I
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Microscopical X-ray fluorescence analysis and related methods with laboratory and synchrotron radiation sources”. Adams F, Janssens K, Snigirev A, Journal of analytical atomic spectrometry 13, 319 (1998). http://doi.org/10.1039/A707100K
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Micro and surface analysis in archaeology”. Adams F, Adriaens A, Aerts A, de Raedt I, Janssens K, Schalm O, Journal of analytical atomic spectrometry 12, 257 (1997). http://doi.org/10.1039/A606091I
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Computer simulation of an analytical direct current glow discharge in argon: influence of the cell dimensions on the plasma quantities”. Bogaerts A, Gijbels R, Journal of analytical atomic spectrometry 12, 751 (1997)
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