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Element Specific Monolayer Depth Profiling”. Macke S, Radi A, Hamann-Borrero JE, Verna A, Bluschke M, Brück S, Goering E, Sutarto R, He F, Cristiani G, Wu M, Benckiser E, Habermeier H-U, Logvenov G, Gauquelin N, Botton GA, Kajdos AP, Stemmer S, Sawatzky GA, Haverkort MW, Keimer B, Hinkov V, Advanced Materials 26, 6554 (2014). http://doi.org/10.1002/adma.201402028
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Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges”. Gonnissen J, Batuk D, Nataf GF, Jones L, Abakumov AM, Van Aert S, Schryvers D, Salje EKH, Advanced functional materials 26, 7599 (2016). http://doi.org/10.1002/adfm.201603489
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Domain Selectivity in BiFeO3Thin Films by Modified Substrate Termination”. Solmaz A, Huijben M, Koster G, Egoavil R, Gauquelin N, Van Tendeloo G, Verbeeck J, Noheda B, Rijnders G, Advanced functional materials 26, 2882 (2016). http://doi.org/10.1002/adfm.201505065
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Effects of Nanostructure and Coating on the Mechanics of Carbon Nanotube Arrays”. Poelma RH, Fan X, Hu Z-Y, Van Tendeloo G, van Zeijl HW, Zhang GQ, Advanced functional materials 26, 1233 (2016). http://doi.org/10.1002/adfm.201503673
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Self-directed localization of ZIF-8 thin film formation by conversion of ZnO nanolayers”. Khaletskaya K, Turner S, Tu M, Wannapaiboon S, Schneemann A, Meyer R, Ludwig A, Van Tendeloo G, Fischer RA, Advanced functional materials 24, 4804 (2014). http://doi.org/10.1002/adfm.201400559
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Magnetically decorated multiwalled carbon nanotubes as dual MRI and SPECT contrast agents”. Wang JTW, Cabana L, Bourgognon M, Kafa H, Protti A, Venner K, Shah AM, Sosabowski JK, Mather SJ, Roig A, Ke X, Van Tendeloo G, de Rosales RTM, Tobias G, Al-Jamal KT, Advanced functional materials 24, 1880 (2014). http://doi.org/10.1002/adfm.201302892
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Preventing the reconstruction of the polar discontinuity at oxide heterointerfaces”. Boschker H, Verbeeck J, Egoavil R, Bals S, Van Tendeloo G, Huijben M, Houwman EP, Koster G, Blank DHA, Rijnders G, Advanced functional materials 22, 2235 (2012). http://doi.org/10.1002/adfm.201102763
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Magnetic field dependence of the properties of excitons confined in a quantum disk”. Janssens KL, Peeters FM, Schweigert VA, Physica status solidi: B: basic research 224, 763 (2001). http://doi.org/10.1002/(SICI)1521-3951(200104)224:3<763::AID-PSSB763>3.0.CO;2-9
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Van Aert S (2011) Atomen in 3D : Antwerpenaren brengen atomaire structuur nanodeeltjes in beeld. 9
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Classical atomic bilayers”. Peeters FM, Partoens B, Schweigert VA, Schweigert IV Plenum Press, New York, page 523 (1998).
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Blumenau AT, Frauenheim T, Ö,berg S, Willems B, Van Tendeloo G (2004) Dislocation structures in diamond: density-functional based modelling and high resolution electron microscopy. Trans Tech Publications, s.l
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Investigation of Ag, Ag2S and Ag(Br,I) small particles by HREM and AEM”. Oleshko V, Schryvers D, Gijbels R, Jacob W s.l., page 293 (1998).
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Large bipolarons and high-Tc materials”. Devreese JT, Verbist G, Peeters FM Cambridge University Press, Cambridge, page 385 (1995).
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Measurement of the mean inner potential of ZnO nanorods by transmission electron holography”. Müller E, Kruse P, Gerthsen D, Schowalter M, Rosenauer A, Lamoen D, Kling R, Microscopy of Semiconducting Materials 107SPRINGER PROCEEDINGS IN PHYSICS, 303 (2005)
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MgB2 : superconductivity and pressure effects”. Ivanov VA, Betouras JJ, Peeters FM, , 35 (2003)
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Goorden L, Van Tendeloo G, Lenaerts S, Deblonde M, et al. (2009) Nanotechnologie: gewikt en gewogen. NanoSoc
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Goorden L, Van Tendeloo G, Lenaerts S, Deblonde M, van Oudheusden M, et al. (2009) Nanotechnologie op de agenda. NanoSoc
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Semiconductor”. Peeters FM McGraw-Hill, New York, page 350 (1997).
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Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction”. Bals S, Van Aert S, Van Tendeloo G, van Dyck D, Avila-Brande D, Microscopy and microanalysis 11, 556 (2005)
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Terahertz absorption window in bilayer graphene”. Dong HM, Qin H, Zhang J, Peeters FM, Xu W Ieee, New York, N.Y., page 247 (2009).
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Glow discharge optical spectroscopy and mass spectrometry”. Bogaerts A John Wiley & Sons, Chichester, page 1 (2016).
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Analysis and comparison of the co2 and co dielectric barrier discharge solid products”. Belov I, Paulussen S, Bogaerts A, Hakone Xv: International Symposium On High Pressure Low Temperature Plasma Chemistry: With Joint Cost Td1208 Workshop: Non-equilibrium Plasmas With Liquids For Water And Surface Treatment (2016)
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Plasma based co2 conversion: a combined modeling and experimental study”. Bogaerts A, Snoeckx R, Berthelot A, Heijkers S, Wang W, Sun S, Van Laer K, Ramakers M, Michielsen I, Uytdenhouwen Y, Meynen V, Cool P, Hakone Xv: International Symposium On High Pressure Low Temperature Plasma Chemistry: With Joint Cost Td1208 Workshop: Non-equilibrium Plasmas With Liquids For Water And Surface Treatment (2016)
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Electron microscopy study of twinning in the Ni5Al3 bainitic phase”. Schryvers D, Ma Y, Toth L, Tanner L, TMS (1994)
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Electron microscopy study of twin sequences and branching in NissAl34 3R martensite”. Schryvers D, Van Landuyt J, ICOMAT (1992)
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Firsto order phase transformation in the Ni-Al system”. Tanner LE, Shapiro SM, Krumhansl JA, Schryvers D, Noda Y, Yamada Y, Barsch GR, Gooding R, Moss SC, Metallurgy and Ceramics (1992)
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CVD growth of monolayer MoS2: Role of growth zone configuration and precursors ratio”. Ozden A, Ay F, Sevik C, Perkgoz NK, Japanese journal of applied physics 56, 06gg05 (2017). http://doi.org/10.7567/JJAP.56.06GG05
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Wafer-level electrical evaluation of vertical carbon nanotube bundles as a function of growth temperature”. Vereecke B, van der Veen MH, Sugiura M, Kashiwagi Y, Ke X, Cott DJ, Hantschel T, Huyghebaert C, Tökei Z, Japanese journal of applied physics 52, 04cn02 (2013). http://doi.org/10.7567/JJAP.52.04CN02
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Increased accuracy in the automated interpretation of large epma data sets by the use of an expert system”. Janssens K, Vanborm W, van Espen P, Journal of research of the National Bureau of Standards (1934) 93, 260 (1988). http://doi.org/10.6028/JRES.093.037
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CO₂, electrochemical reduction with Zn-Al layered double hydroxide-loaded gas-diffusion electrode”. Nakazato R, Matsumoto K, Yamaguchi N, Cavallo M, Crocella V, Bonino F, Quintelier M, Hadermann J, Rosero-navarro NC, Miura A, Tadanaga K, Electrochemistry 91, 097003 (2023). http://doi.org/10.5796/ELECTROCHEMISTRY.23-00080
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