|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
|
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UA library record |
|
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Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Combined characterization of nanostructures by AEM and STM |
1996 |
Mikrochimica acta: supplementum |
13 |
|
UA library record; WoS full record; |
|
|
Oleshko, V.P.; Gijbels, R.; Jacob, W. |
Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques |
1996 |
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|
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UA library record |
|
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Jenett, H.; Grallath, E.; Riedel, R.; Strecker, K.; Gijbels, R.; Kennis, P. |
Comparative bulk, surface and depth profile analyses on AIN and SiC-coated B4C powders |
1991 |
Fres J. Anal. Chem. |
341 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Comparison of argon and neon as discharge gases in a direct current glow discharge: a mathematical simulation |
1997 |
Spectrochimica acta: part B : atomic spectroscopy |
52 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy |
1994 |
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UA library record; WoS full record; |
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|
Pentcheva, E.N.; Petrov, P.S.; Veldeman, E.; Van 't dack, L.; Gijbels, R. |
Comportement hydrogéochimique des éléments traces au cours de l'interaction eau – roche en milieu alcalin |
1990 |
Doklady Bolgarskoi Akademii Nauk |
43 |
|
UA library record |
|
|
Bogaerts, A.; Gijbels, R. |
Comprehensive three-dimensional modeling network for a dc glow discharge plasma |
1998 |
Plasma physics reports |
24 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
Bogaerts, A.; Gijbels, R. |
Computer simulation of an analytical direct current glow discharge in argon: influence of the cell dimensions on the plasma quantities |
1997 |
Journal of analytical atomic spectrometry |
12 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
Pentcheva, E.; Van 't dack, L.; Veldeman, E.; Gijbels, R. |
Corrélations chimiques-géothermométriques des paramètres microchimiques des hydrothermes profonds |
1996 |
Comptes rendus de l'Académie bulgare des sciences |
49 |
|
UA library record |
|
|
Pentcheva, E.N.; Van 't dack, L.; Veldeman, E.; Gijbels, R. |
Correlations géothermométriques des éléments-traces des hydrothermes de terrains granitiques (Bulgarie Méridionale) |
1992 |
Doklady na Balgarskata Akademija na Naukite |
44 |
|
UA library record; WoS full record; |
|
|
Martin, J.M.L.; François, J.P.; Gijbels, R. |
A critical comparison of MINDO/3, MNDO, AM1 and PM3 for a model problem: carbon clusters C2-C10. An ad hoc reparametrization of MNDO well suited for the accurate prediction of their spectroscopic constants |
1991 |
Journal of computational chemistry |
12 |
76 |
UA library record; WoS full record; WoS citing articles |
|
|
Oleshko, V.; Gijbels, R.; Jacob, W. |
Cryo-analytical electron microscopy: new insight into understanding of crystalline and electronic structure of silver halides |
1998 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Oleshko, V.; Gijbels, R.; Jacob, W.; van Daele, A. |
Cryo-electron spectroscopic imaging, electron energy-loss spectroscopy and energy-dispersive X-ray analysis of Ag(Br,I) nano- and microcrystals |
1998 |
Mikrochimica acta: supplementum |
15 |
|
UA library record; WoS full record; |
|
|
Shimizu, K.; Habazaki, H.; Bender, H.; Gijbels, R. |
The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES |
2004 |
Engineering materials |
52 |
|
UA library record |
|
|
van Straaten, M.; Butaye, L.; Gijbels, R. |
Depth profiling of coated steel wires by GDMS |
1992 |
|
|
|
UA library record |
|
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
|
|
|
UA library record |
|
|
Geuens, I.; Gijbels, R.; Jacob, W. |
Depth profiling of silver halide microcrystals |
1991 |
|
|
|
UA library record |
|
|
van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
Determination of oxygen, silicon, phosphorus and copper in iron and steel by 14 MeV neutron activation analysis |
1971 |
|
|
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UA library record |
|
|
Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Determination of the silver sulphide cluster size distribution via computer simulations |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
Gijbels, R. |
Development of a Fourier transform laser microprobe mass spectrometer with external ion source |
1993 |
ICR/Ion trap newsletter |
30 |
|
UA library record |
|
|
Gijbels, R.; Adriaens, A. |
Einleitung zu den massenspektrometrischen Methoden |
2000 |
|
|
|
UA library record |
|
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Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
|
|
UA library record |
|
|
Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
|
|
|
UA library record |
|
|
Van 't dack, L.; Blommaert, W.; Vandelannoote, R.; Gijbels, R.; van Grieken, R. |
Equilibrium constants for trace elements in natural waters |
1983 |
Reviews in analytical chemistry |
7 |
|
UA library record |
|
|
Pentcheva, E.N.; Petrov, P.S.; Van 't dack, L.; Gijbels, R. |
Études génétiques du système “eau thermale – gaz – roche” sous l'influence de phénomènes volcaniques récents |
1995 |
Doklady Bolgarskoi Akademii Nauk |
48 |
|
UA library record |
|
|
Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. |
Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy |
1997 |
Journal of microscopy |
188 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
van Roy, W.; van Vaeck, L.; Gijbels, R. |
Evaluation of the laser microprobe with time-of-flight mass spectrometer for organic surface and micro-analysis |
1992 |
|
|
|
UA library record |
|
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Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and mechanism of formation of photographic sensitivity |
1998 |
|
|
|
UA library record |
|
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Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and photographic sensitivity |
2000 |
Zhurnal nauchnoj prikladnoj fotografii i kinematografii |
45 |
|
UA library record |
|