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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links  |
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Lenaerts, J.; van Vaeck, L.; Gijbels, R. |
Secondary ion formation of low molecular weight organic dyes in time-of-flight static secondary ion mass spectrometry |
2003 |
Rapid communications in mass spectrometry |
17 |
10 |
UA library record; WoS full record; WoS citing articles |
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Luyten, W.; Volkov, V.V.; van Landuyt, J.; Amelinckx, S.; Férauge, C.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B. |
Electron microscopy and mass-spectrometry study of In0.72Ga0.28As0.62P0.38 lasers grown by liquid phase epitaxy |
1993 |
Physica status solidi: A: applied research |
140 |
3 |
UA library record; WoS full record; WoS citing articles |
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Volkov, V.V.; Luyten, W.; van Landuyt, J.; Férauge, C.; Oksenoid, K.G.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B. |
Electron microscopy and mass-spectrometry study of In GaAsP/InP heterostructures (p-i-n diodes) grown by liquid phase epitaxy |
1993 |
Physica status solidi: A: applied research |
140 |
7 |
UA library record; WoS full record; WoS citing articles |
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Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
Comparative study of organic dyes with time-of-flight static secondary ion mass spectrometry and related techniques |
2005 |
Journal of mass spectrometry |
40 |
4 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
SIMS analysis of oxynitrides: evidence for nitrogen diffusion induced by oxygen flooding |
2000 |
Surface and interface analysis |
29 |
4 |
UA library record; WoS full record; WoS citing articles |
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Struyf, H.; van Vaeck, L.; Kennis, P.; Gijbels, R.; van Grieken, R. |
Chemical characterization of neo-ceramic powders by time-of-flight and Fourier transform laser microprobe mass spectrometry |
1996 |
Rapid communications in mass spectrometry |
10 |
11 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A.; Xu, Y.-E.; Wang, S.-E.; Park, I.-Y.; Kang, T.-S. |
Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques |
1998 |
Microscopy research and technique |
42 |
4 |
UA library record; WoS full record; WoS citing articles |
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Adriaens, A.; Goossens, D.; Pijpers, A.; Van Tendeloo, G.; Gijbels, R. |
Dissolution study of potassium feldspars using hydrothermally treated sanidine as an example |
1999 |
Surface and interface analysis |
27 |
4 |
UA library record; WoS full record; WoS citing articles |
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Martin, J.M.L.; François, J.P.; Gijbels, R. |
Ab initio spectroscopy and thermochemistry of the BN molecule |
1991 |
Zeitschrift für Physik : D : atoms, molecules and clusters |
21 |
17 |
UA library record; WoS full record; WoS citing articles |
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Martin, J.M.L.; François, J.P.; Gijbels, R. |
Ab initio study of the structure, infrared spectra and heat of formation of C4 |
1991 |
The journal of chemical physics |
94 |
62 |
UA library record; WoS full record; WoS citing articles |
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Taylor, P.R.; Martin, J.M.L.; François, J.P.; Gijbels, R. |
An ab initio study of the C3+ cation using multireference methods |
1991 |
The journal of chemical physics |
95 |
|
UA library record |
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Vandelannoote, R.; Blommaert, W.; van Grieken, R.; Gijbels, R. |
L'analyse des eaux géothermales par spectrométrie de masse à étincelles |
1979 |
Spectra 2000: la revue de l'instrumentation |
53 |
|
UA library record |
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van Cleempoel, A.; Gijbels, R.; van den Heuvel, H.; Claeys, M. |
Analysis of C60 and C70 oxides by HPLC and low- and high-energy collision-induced dissocation tandem mass spectrometry |
1997 |
Proceedings Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials, 191th Meeting of the Electrochemical Society, Montreal, Canada, 4-9 May 1997 |
4 |
1 |
UA library record; WoS full record; WoS citing articles |
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Geuens, I.; Gijbels, R.; Jacob, W.A.; Verbeeck, A.; de Keyzer, R. |
Analysis of silver halide microcrystals using different modes of a scanning transmission electron microscope and digital image processing |
1992 |
The journal of imaging science and technology |
36 |
10 |
UA library record; WoS full record; WoS citing articles |
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Veldeman, E.; Van 't dack, L.; Gijbels, R.; Campbell, M.; Vanhaecke, F.; Vanhoe, H.; Vandecasteele, C. |
Analysis of thermal waters by ICP-MS |
1991 |
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UA library record |
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Martin, J.M.L.; François, J.P.; Gijbels, R. |
The anharmonic force field of thioformaldehyde, H2CS |
1994 |
Journal of molecular spectroscopy |
168 |
18 |
UA library record; WoS full record; WoS citing articles |
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Gijbels, R.; van Grieken, R. |
Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees) |
1977 |
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UA library record |
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Gijbels, R.; van Grieken, R.; Blommaert, W.; Van 't dack, L.; van Espen, P.; Nullens, H.; Saelens, R. |
Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges) |
1983 |
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UA library record |
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Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. |
Application of neural networks in image analysis: the classification of geometrical shapes |
1993 |
CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology |
10 |
|
UA library record |
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Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. |
Application of trace element analysis to geothermal waters |
1977 |
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UA library record |
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Gijbels, R.; Oksenoid, K.G. |
Atomic mass spectrometry |
1995 |
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UA library record |
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Bogaerts, A.; Gijbels, R. |
Calculation of crater profiles on a flat cathode in a direct current glow discharge, and comparison with experiment |
1997 |
Spectrochimica acta: part B : atomic spectroscopy |
52 |
42 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution |
1999 |
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UA library record; WoS full record; |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1995 |
Microbeam analysis |
4 |
9 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1994 |
Microbeam analysis |
3 |
|
UA library record |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
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UA library record |
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Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. |
Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas |
1997 |
Journal of crystal growth |
173 |
4 |
UA library record; WoS full record; WoS citing articles |
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van Cleempoel, A.; Gijbels, R.; Claeys, M.; van den Heuvel, H. |
Characterization of ozonated C60 and C70 by high performance liquid chromatography and low- and high-energy collision-induced dissociation tandem mass spectrometry |
1996 |
Rapid communications in mass spectrometry |
10 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Gijbels, R. |
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals |
1991 |
Acta technica Belgica: metallurgie |
30 |
|
UA library record |
|
|
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
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UA library record |
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