Number of records found: 202
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Determination of total selenium content in cereals and bakery products by flow injection hydride generation graphite furnace atomic absorption spectrometry applying in-situ trapping on iridium-treated graphite platforms”. Ajtony Z, Szoboszlai N, Bella Z, Bolla S, Szakál P, Bencs L, Microchimica acta 150, 1 (2005). http://doi.org/10.1007/S00604-005-0330-Y
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Application of EDXRF and thin window EPMA for the investigation of the influence of hot air heating on the generation and deposition of particulate matter”. Spolnik Z, Bencs L, Worobiec A, Kontozova V, Van Grieken R, Microchimica acta 149, 79 (2005). http://doi.org/10.1007/S00604-004-0299-Y
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Interpretation of TOF-SIMS depth profiles from ultrashallow high-k dielectric stacks assisted by hybrid collisional computer simulation”. Ignatova VA, Möller W, Conard T, Vandervorst W, Gijbels R, Applied physics A : materials science &, processing 81, 71 (2005). http://doi.org/10.1007/s00339-005-3239-8
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Mg1-xRhB, a new boridometallide with 2D polyanion”. Alekseeva AM, Abakumov AM, Leithe-Jasper A, Schnelle W, Prots Y, Hadermann J, Van Tendeloo G, Antipov EV, Grin Y, Zeitschrift für anorganische und allgemeine Chemie 631, 1047 (2005). http://doi.org/10.1002/zaac.200400479
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Ruthenium staining as an alternative preparation method for automated EPMA of individual biogenic and organic particles”. Worobiec A, Kaplinski A, Van Grieken R, X-ray spectrometry 34, 245 (2005). http://doi.org/10.1002/XRS.807
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Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses”. Padilla R, van Espen P, Abrahantes A, Janssens K, X-ray spectrometry 34, 19 (2005). http://doi.org/10.1002/XRS.781
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Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films”. Adriaensen L, Vangaever F, Lenaerts J, Gijbels R, Rapid communications in mass spectrometry 19, 1017 (2005). http://doi.org/10.1002/rcm.1881
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Ab initio calculation of the interaction energy in the P2 binding pocket of HIV-1 protease”. Nivesanond K, Peeters A, Lamoen D, van Alsenoy C, International Journal Of Quantum Chemistry 105, 292 (2005). http://doi.org/10.1002/qua.20724
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Strain mapping around dislocations in diamond and cBN”. Willems B, Nistor L, Ghica C, Van Tendeloo G, Physica status solidi: A: applied research 202, 2224 (2005). http://doi.org/10.1002/pssa.200561923
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Comparative study of organic dyes with time-of-flight static secondary ion mass spectrometry and related techniques”. Adriaensen L, Vangaever F, Lenaerts J, Gijbels R, Journal of mass spectrometry 40, 615 (2005). http://doi.org/10.1002/jms.832
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Design and synthesis of hierarchical materials from ordered zeolitic building units”. Kirschhock CEA, Kremer SPB, Vermant J, Van Tendeloo G, Jacobs PA, Martens JA, Chemistry: a European journal 11, 4306 (2005). http://doi.org/10.1002/chem.200401329
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Ab initio computation of the mean inner Coulomb potential of technological important semiconductors”. Schowalter M, Rosenauer A, Lamoen D, Kruse P, Gerthsen D, 1007, 233 (2005)
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Advanced TEM investigations on Ni-Ti shape memory material: strain and concentration gradients surrounding Ni4Ti3 precipitates”. Schryvers D, Tirry W, Yang Z, , 329 (2005)
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Biaxially aligned yttria stabilized zirconia and titanium nitride layers deposited by unbalanced magnetron sputtering”. Mahieu S, Ghekiere P, de Winter G, de Gryse R, Depla D, Lebedev OI, Diffusion and defect data : solid state data : part B : solid state phenomena T2 –, 2nd International Conference on Texture and Anisotropy of Polycrystals, JUL 07-09, 2004, Metz, FRANCE 105, 447 (2005)
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Corrigendum: Structural phase transition at the percolation threshold in epitaxial (La0.7Ca0.3MnO3)1-x:(MgO)x nanocomposite films”. Moshnyaga V, Damaschke B, Shapoval O, Belenchuk A, Faupel J, Lebedev OI, Verbeeck J, Van Tendeloo G, Mücksch M, Tsurkan V, Tidecks R, Samwer K, Nature materials 4, 104 (2005)
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Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration”. Caen J, Schalm O, van der Snickt G, van der Linden V, Frederickx P, Schryvers D, Janssens K, Cornelis E, van Dyck D, Schreiner M, , 121 (2005)
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First-principles calculations of 002 structure factors for electron scattering in strained InxGa1-xAs”. Rosenauer A, Schowalter M, Glas F, Lamoen D, 107, 151 (2005)
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Intersublevel absorption in stacked n-type doped self-assembled quantum dots”. Veljkovic D, Tadić, M, Peeters FM, Materials science forum 494, 37 (2005)
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Mercator maps of orientations of a C60 molecule in single-walled nanotubes with distinct radii”. Michel KH, Verberck B, Nikolaev A, AIP conference proceedings 786, 69 (2005)
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Nanoparticle growth and transport mechanisms in capacitively coupled silane discharges: a numerical investigation”. de Bleecker K, Bogaerts A, Goedheer WJ, , 201 (2005)
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Nanoparticles in glass and glazes”. Frederickx P, De Vis K, Wouters H, Helary D, Schryvers D, (2005)
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Nanoparticles in lustre reconstructions”. Frederickx P, Verbeeck J, Schryvers D, Helary D, Darque-Ceretti E, , 169 (2005)
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Numerical modelling for a dielectric barrier discharge at atmospheric pressure in nitrogen”. Madani M, Bogaerts A, Vangeneugden D, , 53 (2005)
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Obstacles on the road towards atomic resolution tomography”. van Dyck D, Van Aert S, Croitoru MD, Microscoy and microanalysis 11, 238 (2005)
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Reentrant melting of a classical two-dimensional binary cluster”. Nelissen K, Heytens L, Schweigert VA, Peeters FM, AIP conference proceedings 799, 347 (2005)
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Square-wave conductance through a chain of rings due to spin-orbit interaction”. Molnar B, Vasilopoulos P, Peeters FM, AIP conference proceedings 772, 1335 (2005)
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Ni4Ti3 precipitates and their influence on the surrounding NiTi matrix”. Schryvers D, Tirry W, Yang Z, , 205 (2005)
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Tomography using annular dark field imaging in TEM”. Bals S, Kisielowski C, Croitoru M, Van Tendeloo G, Microscopy and microanalysis 11, 2118 (2005)
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Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN”. van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys MR, Germain M, Springer proceedings in physics 107, 389 (2005)
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Analysis of façon-de-Venise glass originating from Central and Western Europe”. Šmit Ž, Janssens K, Schalm O, Kos M page 165 (2005).
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