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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links  |
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Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Electron microscopy: principles and fundamentals |
1997 |
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UA library record |
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Schryvers, D.; van Landuyt, J.T. |
Electron microscopy study of twin sequences and branching in Ni66Al34 3r martensite |
1993 |
Proceedings Of The International Conference On Martensitic Transformations (icomat-92) |
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1 |
UA library record; WoS full record; WoS citing articles |
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Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C. |
EM study of sensitisation of silver halide grains |
1994 |
Icem |
13 |
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UA library record; WoS full record; |
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Romano-Rodriguez, A.; Perez-Rodriguez, A.; Serre, C.; van Landuyt, J.; et al. |
Epitaxial growth of \beta-SiC on ion-beam synthesized \beta-SiC : structural characterization |
2000 |
Materials science forum
T2 – International Conference on Silicon Carbide and Related Materials, OCT 10-15, 1999, RES TRIANGLE PK, NORTH CAROLINA |
338-3 |
2 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ irradiation in an HREM |
1999 |
Physica status solidi: A: applied research |
171 |
40 |
UA library record; WoS full record; WoS citing articles |
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Frangis, N.; Stoemenos, J.; van Landuyt, J.; Nejim, A.; Hemment, P.L.F. |
The formation of 3C-SiC in crystalline Si by carbon implantation at 9500C and annealing: a structural study |
1997 |
Journal of crystal growth |
181 |
9 |
UA library record; WoS full record; WoS citing articles |
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Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Kononenko, T.V.; Obraztsova, E.D.; Strelnitsky, V.E. |
Formation of diamond nanocrystals in laser-irradiated amorphous carbon films |
1994 |
International Conference on the New Diamond Science and Technology |
4 |
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UA library record |
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Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J. |
Graphene textures: tubules and whiskers related to fullerene crystallography |
1993 |
Acta crystallographica: section A: foundations of crystallography |
49 |
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UA library record |
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Frangis, N.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G. |
Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction |
1997 |
Journal of crystal growth |
172 |
29 |
UA library record; WoS full record; WoS citing articles |
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Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Handbook of microscopy: applications in materials science, solid-state physics and chemistry |
1997 |
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UA library record |
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van Landuyt, J. |
High resolution electron microscopy for materials |
1992 |
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7 |
UA library record; WoS full record; WoS citing articles |
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van Landuyt, J.; Vanhellemont, J. |
High-resolution electron microscopy for semiconducting materials science |
1994 |
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UA library record |
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Teodorescu, V.S.; Nistor, L.C.; van Landuyt, J. |
High resolution TEM observation of in situ colloid formation in CaF2 crystals |
1997 |
Materials science forum |
239-241 |
3 |
UA library record; WoS full record; WoS citing articles |
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De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. |
How to interpret short-range order HREM images |
1996 |
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UA library record |
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van Landuyt, J.; Van Tendeloo, G. |
HREM for characterisation of nanoscale microstructures |
1998 |
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UA library record |
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Volkov, V.V.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S.; Busheva, E.E.; Shabunina, G.G.; Aminov, T.G.; Novotortsev, V.M. |
HREM image analysis up to structure determination of SbCrSe3: a new 1D ferromagnet |
1997 |
Journal of solid state chemistry |
132 |
1 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Tanner, L.E. |
HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys |
1994 |
Icem |
13 |
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UA library record |
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Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Le Tanner |
HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys (Invited) |
1994 |
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UA library record; WoS full record; |
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Nistor, L.; Bender, H.; van Landuyt, J.; Nemeth, S.; Boeve, H.; De Boeck, J.; Borghs, G. |
HREM investigation of a Fe/GaN/Fe tunnel junction |
2001 |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England |
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UA library record; WoS full record; |
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Nistor, L.C.; van Landuyt, J.; Dincã, G. |
HREM of defects in cubic boron nitride single crystals |
1998 |
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UA library record; WoS full record; |
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Bernaerts, D.; Zhang, X.B.; Zhang, X.F.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. |
HREM study of Rb6C60 and helical carbon nanotubules |
1994 |
Icem |
13 |
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UA library record |
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Fedina, L.; Lebedev, O.I.; Van Tendeloo, G.; van Landuyt, J. |
In-situ HREM irradiation study of point defect clustering in strained GexSi1-x/(001)Si heterostructure |
1997 |
Conference series of the Institute of Physics |
157 |
1 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; de Keyzer, R.; van Landuyt, J. |
In situ HREM study of electron irradiation effects in AgCl microcrystals |
1992 |
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UA library record |
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Fanidis, C.; van Dyck, D.; van Landuyt, J. |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases |
1993 |
Ultramicroscopy |
48 |
6 |
UA library record; WoS full record; WoS citing articles |
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van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
The influence of crystal thickness on the image tone |
2003 |
Journal of imaging science |
47 |
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UA library record; WoS full record; WoS citing articles |
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van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Bollen, D.; de Keyzer, R.; van Roost, C. |
Influence of twinning on the morphology of AgBr and AgCl microcrystals |
2001 |
The journal of imaging science and technology |
45 |
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UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation |
1997 |
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UA library record |
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Frangis, N.; Nejim, A.; Hemment, P.L.F.; Stoemenos, J.; van Landuyt, J. |
Ion beam synthesis of β-SiC at 9500C and structural characterization |
1996 |
Nuclear instruments and methods in physics research |
B112 |
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UA library record |
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Rembeza, S.I.; Loginov, V.A.; Svistova, T.V.; Podkopaeva, O.I.; Rembeza, E.S.; van Landuyt, J. |
Laser thermotreatment of the SnO2layers |
1998 |
Eurosensors XII, vols 1 and 2 |
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UA library record; WoS full record; |
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van Landuyt, J.; Kuypers, S.; van Heurck, C.; Van Tendeloo, G.; Amelinckx, S. |
Methods of structural analysis of modulated structures and quasicrystals |
1993 |
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UA library record |
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