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Identification of new superconducting compounds by electron microscopy”. Van Tendeloo G, Krekels T Cambridge University Press, Cambridge, page 161 (2000).
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Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B s.l., page 199 (2000).
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Intersubband transitions in InAs/GaSb superlattices in a parallel magnetic field”. de Meester RHJ, Peeters FM, Lakrimi M, Nicholas RJ, Poulter AJL, Mason NJ, Walker PJ, Physica. E: Low-dimensional systems and nanostructures 7, 93 (2000)
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Martensitic transformations studied on nano- and microscopic length scales”. Schryvers D, Boullay P, Potapov P, Satto C, Festkörperprobleme 40, 375 (2000)
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Modeling network for argon glow discharges: the output cannot be better than the input”. Bogaerts A, Gijbels R American Institute of Physics, Melville, N.Y., page 49 (2000).
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Modeling of radio-frequency and direct current glow discharges in argon”. Bogaerts A, Gijbels R, Journal of technical physics 41, 183 (2000)
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Multielementmassenspektrometrie (MMS)”. Jochum KP, Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 188 (2000).
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SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification”. Gijbels R, Verlinden G, Geuens I London Institute of Physics, Bristol, page 331 (2000).
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Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM”. Lebedev OI, Van Tendeloo G, Amelinckx S s.l., page 201 (2000).
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Structural changes in fluorinated T{'} and T* phases”. Hadermann J, Abakumov AM, Lebedev OI, Antipov EV, Van Tendeloo G, , 193 (2000)
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Structural properties of Au clusters on MgO”. Pauwels B, Van Tendeloo G, Bouwen W, Kuhn LT, Lievens P, , 383 (2000)
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Study of oxynitrides with dual beam TOF-SIMS”. de Witte H, Conard T, Vandervorst W, Gijbels R, , 611 (2000)
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TEM of nanostructured materials”. Van Tendeloo G, Pauwels B, Geuens P, Lebedev O, , 3 (2000)
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TEM of phase transitions in tridymite and cristobalite based materials”. Van Tendeloo G, Microscoy and microanalysis 6 (2000)
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The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS)”. Lenaerts J, Verlinden G, Gijbels R, Geuens I, Callant P, , 180 (2000)
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The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals”. Van Renterghem W, Karthauser S, Schryvers D, van Landuyt J, De Keyzer R, Van Roost C, , 167 (2000)
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TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates”. Lenaerts J, Verlinden G, van Vaeck L, Gijbels R, Geuens I, , 115 (2000)
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Unveiling the composition of sulphur sensitization specks by their interactions with TAI”. Charlier E, van Doorselaer M, Gijbels R, de Keyzer R, Geuens I, Journal Of Imaging Science And Technology 44, 235 (2000)
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XPS study of ion induced oxidation of silicon with and without oxygen flooding”. de Witte H, Conard T, Sporken R, Gouttebaron R, Magnee R, Vandervorst W, Caudano R, Gijbels R, , 73 (2000)
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Analysis of the composition of glass objects from Qumran, Israel and the comparison with other Roman glass from western Europe”. Aerts A, Janssens K, Velde B, Adams F, Wouters H page 113 (2000).
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Applications in art and archaeology”. Janssens K, Adams F page 290 (2000).
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Comparison with other microanalytical techniques”. Janssens K page 211 (2000).
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Composition of facon-de-venise and Venetian glass from Antwerp and the Southern Netherlands”. de Raedt I, Janssens K, Veeckman J, Adams F page 346 (2000).
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Evaluation and calibration of micro-XRF data”. Janssens K, Vincze L, Vekemans B page 155 (2000).
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Future of m-XRF”. Adams F, Janssens K page 370 (2000).
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Glass trade in Antwerp during the 15th through 17th century”. de Raedt I, Janssens K, Veeckman J, Adriaens A, Adams F page 38 (2000).
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Janssens KHA, Adams FCV, Rindby A (2000) Microscopic X-ray fluorescence analysis. 419 p
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Overview”. Janssens K, Adams F page 1 (2000).
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Synchrotron light through ancient glass”. de Raedt I, Vekemans B, Janssens K, Adams F, Europhysics news 31, 15 (2000)
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Analysis of heterogeneous CaCO3-CaSO4 single particles using ultra-thin window EPMA”. Ro C-U, Oh K-Y, Van Grieken RE, (2000)
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