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Preliminary experiments on grazing-exit electron probe microanalysis (GE-EPMA)”. Tsuji K, Spolnik Z, Wagatsuma K, Nullens R, Van Grieken RE, , 119 (1999)
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Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AA, Van Grieken RE page 407 (2002).
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Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AM, Van Grieken RE page 339 (1992).
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Sample preparation for X-ray fluorescence”. Schmeling M, Van Grieken RE page 933 (2002).
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Sample preparation for XRF”. Injuk J, Van Grieken RE page 657 (1992).
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Single particle analysis techniques”. de Bock LA, Van Grieken RE page 243 (1999).
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Study of the Antarctic aerosol using X-ray fluorescence and single particle analysis”. Rojas CM, Van Grieken RE, Cantillano ME, Scientific series of the Chilean Antarctic Institute (Ser. Cinet. INACH) 42, 37 (1992)
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Trace analysis of environmental samples by X-ray emission spectroscopy”. Van Grieken RE, LaBrecque JJ page 101 (1985).
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Trace metal fractionation effects between sea water and aerosols from bubble bursting”. Van Grieken RE, Johansson TB, Winchester JW, Journal de recherches atmosphériques 8, 611 (1974)
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Trace metals in the St-Louis aerosol”. Winchester JW, Meinert DL, Nelson JW, Johansson TB, Van Grieken RE, Orsini C, Kaufmann HC, Akselsson R page 385 (1975).
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Ultrastructural localization of aluminum in patients with dialysis-associated osteomalacia”. Verbueken AH, van de Vijver FL, Van Grieken RE, Paulus GJ, Visser WJ, d'Haese P, de Broe ME, Clinical chemistry : international journal of laboratory medicine and molecular diagnostics 30, 763 (1984)
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Use of grazing emission XRF spectrometry for silicon wafer surface contamination measurements”. de Gendt S, Kenis K, Mertens PW, Heyns MM, Claes M, Van Grieken RE, Bailleul A, Knotter M, de Bokx PK, (1996)
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Use of stable isotope measurements to evaluate the origin of suphur in gypsum layers on limestone buildings”. Torfs KM, Van Grieken RE, Buzek F, Environmental science and technology 31, 2650 (1997)
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Weathering of treated and untreated limestones in atmospheric exposures”. Vleugels GJ, Van Grieken RE, Journal of preservation technology 23, 48 (1991)
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X-ray fluorescence”. Injuk J, Van Grieken RE page 151 (2001).
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X-ray spectrometry”. Van Grieken RE page 13269 (2000).
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X-ray spectrometry”. Török SB, Labar J, Injuk J, Van Grieken RE, Analytical chemistry R68, 467 (1996)
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X-ray spectrometry”. Török SB, Van Grieken RE, Analytical chemistry 64r, 180 (1992)
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Reviews in analytical chemistry 56, 241r (1984)
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